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Patent 1248177 Summary

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Claims and Abstract availability

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(12) Patent: (11) CA 1248177
(21) Application Number: 1248177
(54) English Title: TESTER FOR SOLID STATE ELECTRONIC COMPONENTS
(54) French Title: INSTRUMENT D'ESSAI POUR COMPOSANTS SEMICONDUCTEURS D'ELECTRONIQUE
Status: Term Expired - Post Grant
Bibliographic Data
(51) International Patent Classification (IPC):
  • G01R 31/00 (2006.01)
  • G01R 31/26 (2020.01)
(72) Inventors :
  • MULZ, ROBERT H. (United States of America)
(73) Owners :
  • MULZ, ROBERT H.
(71) Applicants :
  • MULZ, ROBERT H.
(74) Agent: OYEN WIGGS GREEN & MUTALA LLP
(74) Associate agent:
(45) Issued: 1989-01-03
(22) Filed Date: 1984-05-08
Availability of licence: N/A
Dedicated to the Public: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): No

(30) Application Priority Data: None

Abstracts

English Abstract


TESTER FOR SOLID STATIC ELECTRONIC COMPONENTS
ABSTRACT OF THE DISCLOSURE
A tester for determining basic electronic and circuit
information of solid state components. The tester provides
indications in 2- and 3-wire devices of short or open
conditions, whether a transistor is NPN or PNP type and
whether or not an SCR or triac will latch. Both visual and
audible indications are provided and cooperatively provide
the indications of component quality.


Claims

Note: Claims are shown in the official language in which they were submitted.


-10-
CLAIMS
What is claimed is:
1. A tester for electronic components, said tester
comprising:
a DC voltage source having a positive side and a
negative side;
switching means connected to the positive and negative
sides of said voltage source, said switching means having
first and second positions;
a first lead selectively connected to the positive and
negative sides of said voltage source;
a second lead selectively coupled to the negative and
positive sides of said voltage source;
a first resistor connected between said second lead
and said switching means;
a two-state visual indicator means connected in
parallel with said first resistor, said visual indicator
means having first and second terminals;
audible indicator means connected in parallel with
said first resistor, said audible indicator means having
first and second terminals;
said first and second leads being adapted to be
selectively connected to two leads of an electronic
component, the position of said switching means and the
functioning condition of said visible and audible indicator
means indicating type and integrity of said component.

-11-
2. The tester recited in claim 1 and further comprising a
third lead coupled to said second lead, said first, second
and third leads being adapted to be selectively connected
to at least two leads of the electronic component.
3. The tester recited in claim 2 wherein:
when said switching means is in said first position,
said first lead is connected to said negative side of said
voltage source and said second lead is connected through
said first resistor to said positive side of said voltage
source, thereby positively biasing one terminal of said
visual indicator means; and
when said switching means is in said second position,
said first lead is connected to said positive side of said
voltage source and said second lead is connected through
said first resistor to said negative side of said voltage
source, thereby negatively biasing said one terminal of
said visual indicator means.
4. The tester recited in claim 2 wherein:
said audible indicator means is connected across said
first resistor through said switching means; whereby
when said switching means in in said first position,
said first terminal of said audible indicator means is
connected to said positive side of said voltage source and
said second terminal of said audible indicator means is
connected to said second lead;
when said switching means is in said second position,
said first terminal of said audible indicator means is
connected to said second lead and said second terminal is

-12-
connected to said negative side of said voltage source.
5. The tester recited in claim 3 wherein:
said audible indicator means is connected across said
first resistor through said switching means; whereby
when said switching means in in said first position,
said first terminal of said audible indicator means is
connected to said positive side of said voltage source and
said second terminal of said audible indicator means is
connected to said second lead;
when said switching means is in said second position,
said first terminal of said audible indicator means is
connected to said second lead and said second terminal is
connected to said negative side of said voltage source.
6. The tester recited in claim 2 wherein said tester is
adapted to test for quality three-lead components selected
from the group consisting of transistors, triacs and
silicon controlled rectifiers.
7. The tester recited in claim 6 wherein when a
transistor is to be tested, with said switching means in
said first position, said first lead connected to the
emitter of the transistor and said second lead connected to
the collector of the transistor, actuation of said audible
indicator means and one state of said visual indicator
means indicates shorting between emitter and collector,
non-actuation of said audible indicator means and actuation
of said one state of said visual indicator means indicates
leakage through the base junction of the transistor.

-13-
8. The tester recited in claim 7 wherein, with said third
lead connected to the base of the transistor, actuation of
both said audible indicator means and said one state of
said visual indicator means indicates that the transistor
is good and that it is an NPN type device.
9. The tester recited in claim 8 wherein non-actuation of
said audible indicator means and said visual indicator
means with said switch selectively in both said first and
said second positions indicates that the transistor is bad
10. The tester recited in claim 8 wherein non-actuation of
said audible indicator means and said visual indicator
means with said switching means in said first position, and
actuation of said audible indicator means and the second
state of said visual indicator means when said switching
means is in said second position indicates that the
transistor is good and that it is a PNP type device.
11. The tester recited in claim 2 wherein said tester is
adapted to test for quality two-lead components selected
from the group consisting of diodes, light emitting diodes,
bipolar diodes, fuses and electrical continuity.
12. The tester recited in claim 11 wherein when a diode is
to be tested, non-actuation of both said indicator means
with said switching means in said first position, said
first lead connected to the anode of the diode and said
second lead connected to the cathode of the diode, and
actuation of said audible indicator means and the second

-14-
state of said visual indicator means indicates that the
diode is not shorted or open.
13. The tester recited in claim 11 wherein when a diode is
to be tested, non-actuation of both said indicator means
with said switching means in said second position, said
first lead connected to the cathode of the diode and said
second lead connected to the anode of the diode, and
actuation of said audible indicator means and the first
state of said visual indicator means indicates that the
diode is not shorted or open.
14. A method for-testing electronic components with a
tester comprising a DC voltage source having a positive
side and a negative side, switching means connected to the
positive and negative sides of said voltage source, said
switching means having first and second positions, a first
lead selectively connected to the positive and negative
sides of said voltage source, a second lead selectively
coupled to the negative and positive sides of said voltage
source, a third lead coupled to said second lead, a first
resistor connected between said second lead and said
switching means, a two-state visual indicator means
connected in parallel with said first resistor, said visual
indicator means having first and second terminals, audible
indicator means connected in parallel with said first
resistor, said audible indicator means having first and
second terminals, said method comprising the steps of:
setting said switching means to said first position;

connecting said first lead to one terminal of a
three-terminal component;
connecting said second lead to a second terminal
of said component;
observing audible and visual indication means
responses to provide information on electrical shorts
within said component;
connecting said third lead to a third terminal of
said component;
observing audible and visual indication means
responses to provide information as to quality of said
component;
setting said switching means to said second
position to determine type of component.
15. A method for testing electronic components with a
tester capable of providing indications of simple circuit
continuity and, in two- and three-terminal solid state
components, of short and open conditions, transistor type,
and latchability of SCR's and triacs, the tester comprising
a DC voltage source having a positive side and a negative
side, switching means connected to the positive negative
sides of said voltage source, said switching means having
first and second positions, a first lead selectively
connected to the positive and negative sides of said
voltage source, a second lead selectively coupled to the
negative and positive sides of said voltage source, a first
resistor connected between said second lead and said
switching means, a third lead coupled between said first
resistor and said switching means, a second resistor
connection in said third lead, a three-state visual
indicator and diode means connected in parallel with said
first resistor, said visual indicator and diode means

- 16 -
having first and second terminals, said method comprising
the steps of:
setting said switching means to said first
position;
connecting said first lead to one terminal of an
electronic component to be tested;
connecting said second lead to a second terminal
of said component;
observing visual indication means responses to
provide information on electrical shorts within said
component;
when testing a three terminal component,
connecting said third lead to the third terminal of said
component thereby biasing said component ON through said
second resistor;
observing responses of said visual indication
means to provide information as to quality of said
component; and
setting said switching means to said second
position to determine type of component.
16. A quality tester for electronic components, said
tester selectively providing indications of simple circuit
continuity and, in two- and three-terminal solid state
components, of short and open conditions, transistor type,
and latchability of SCR's and triacs, said tester
comprising:
a DC voltage source having a positive side and
and a negative side;
bistable switching means connected to the
positive and negative sides of said voltage source, said
switching means having first and second stable positions;
a first lead selectively connected to the
positive and negative sides of said voltage source;

a second lead selectively coupled to the negative
and positive sides of said voltage source;
a first resistor connected between said second
lead and said switching means;
a third lead connected between said first
resistor and said switching means; and
a three-state visual indicator and diode means
connected in parallel with said first resistor, said visual
indicator and diode means having first and second terminals
and providing selective quality indications for the
component being tested,
said first and second leads being adapted to be
connected to the leads of a two-lead device such as an LED,
fuse, diode and two circuit leads for circuit continuity
testing, the emitter and collector of a transistor, the
two main terminals of a triac and the anode and cathode of
a silicon controlled rectifier (SCR), to determine shorts
and open circuits, said third lead being adapted to be
connected to the base of the transistor, and the gate of
the triac and the SCR, whereby said second resistor biases
the transistor on and latches the triac and the SCR;
said switching means and said visual indicator
and diode means being adapted to distinguish NPN and PNP
transistors from each other and to determine state of
latching ability of SCR's and triacs in either their
positive or negative state by reversing the polarity of
the applied voltage to said first and second leads and to
said visual indicator and diode means, said switching means
further changing the voltage polarity on said first and
second leads to determine shorts, opens and conductive
direction through various of the electronic components to
be tested.

- 18 -
17. The tester recited in claim 16, and further
comprising audible indicator means connected in parallel
with said first resistor and said visual indicator and
diode means, said audible indicator means having first and
second terminals and providing audible indications of
current conduction in the component being tested, said
buzzer functioning simultaneously with one of said
indicators of said visual indicator and diode means.
18. The tester recited in claim 16 wherein:
when said switching means is in said first
position, said first lead is connected to said negative
side of said voltage source and said second lead is
connected through said first resistor to said positive side
of said voltage source, thereby positively biasing one
terminal of said visual indicator and diode means; and
when said switching means is in said second
position, said first lead is connected to said positive
side of said voltage source and said second lead is
connected through said first resistor to said negative side
of said voltage source, thereby negatively biasing said one
terminal of said visual indicator and diode means.
19. The tester recited in claim 17 wherein;
said audible indicator means is connected across
said first resistor through said switching means; whereby
when said switching means is in said first
position, said first terminal of said audible indicator
means is connected to said positive side of said voltage
source and said second terminal of said audible indicator
means is connected to said second lead;
when said switching means is in said second
position, said first terminal of said audible indicator
means is connected to said second lead and said second

- 19 -
terminal is connected to said negative side of said voltage
source.
20. The tester recited in claim 17 wherein when a
transistor is to be tested, with said switching means in
said first position, said first lead connected to the
emitter of the transistor and said second lead connected to
the collector of the transistor, actuation of said audible
indicator means and one state of said visual indicator and
diode means indicates shorting between emitter and
collector, non-actuation of said audible indicator means
and actuation of said one state of said visual indicator
and diode means indicates leakage through the base junction
of the transistor.
21. The tester recited in claim 20 wherein, with said
third lead connected to the base of the transistor,
actuation of both said audible indicator means and said one
state of said visual indicator and diode means indicates
that the transistor is good and that it is an NPN type
device.
22. The tester recited in claim 21 wherein
non-actuation of said audible indicator means and said
visual indicator and diode means with said switch
selectively in both said first and said second positions
indicates that the transistor is bad.
23. The tester recited in claim 21 wherein
non-actuation of said audible indicator means and said
visual indicator and diode means with said switching means
in said first position, and actuation of said audible
indicator means and the second state of said visual
indicator and diode means when said switching means is in
said second position indicates that the transistor is good
and that it is a PNP type device.

- 20 -
24. The tester recited in claim 17 wherein when a
diode is to be tested, non-actuation of both said indicator
means with said switching means in said first position,
said first lead connected to the anode of the diode and
said second lead connected to the cathode of the diode, and
actuation of said audible indicator means and the second
state of said visual indicator and diode means indicates
that the diode is not shorted or open.
25. The tester recited in claim 17 wherein when a
diode is to be tested, non-actuation of both said indicator
means with said switching means in said second position,
said first lead connected to the cathode of the diode and
said second lead connected to the anode of the diode, and
actuation of said audible indicator means and the first
state of said visual indicator and diode means indicates
that the diode is not shorted or open.

Description

Note: Descriptions are shown in the official language in which they were submitted.


~Z4~3~Lt~7
--1--
TESTER FOR SOLIO STATE ELECTRON:I[C COMPONENTS
FI E:r.D OF T~l E I 13VE NTI ON
This invention relates generally to electronic testers
and more particularly to a simple apparatus for determining
the integrity of solid state components.
BhCF;GROUND OF TEIE: INVENTION
A number of relatively complex and costly solid state
electronic component testers are presently available. Some
of them determine whether or not a transistor is good and
also whether it is a NPN or a PNP type device. However, a
tester with the ability to test a number of diffe^rent- -
components for shorts, opens or type has not been
available. Further, prior art devices did not normally
provide testing for fuses, silicon controlled rectifiers
(SCR's) and other discrete solid state devices,
particularly to determine whether an SCR would latch
properly.
SUMMAR~ OF TEIB INVENTIOta
It is a primary object of this invention to provide a
multipurpose, inexpensive, simple tester for 2~ and 3-
terminal solid state electronic components.
Broadly speaking, the invention concerns a battery-
operated electronic circuit having a bipolar light-emitting
diode (LED) and an audible signal to determine shorts,
opens, and type for various discrete electronic components.
Depending upon switch position, the color of LED indication
and the presence or absence of the audible signal, it can
be determined whether the transistor is an NPN or PNP type~

The electrical integrity of various components, such as
transistorsr triacsr diodes, SCR's, LED's and fuses, and
even slmple circuit continuity, are e~fectively tested by
this instrument in a simple manner.
BRIE:F DESCRIPTION OP T~E DRAWING
The objects, advantages and features of this invention
will be more readily appreciated from the following
detailed description when read in conjunction with the
accompanying drawing comprising a single schematic diagram
of the circuit of the invention.
DESCRIPTION OF T~IE PREFERRE:D EMBODIMENT
With reference now to the drawing, there is shown a
battery 11 connected at either side to elements of a s~itch
12 having four movable contacts 13, 14, 15 and 16. Switch
element 13 connected to the positive side of the battery
has two functional positions contacting terminals 21 or 22.
Switch 14 connected to the negative side of the battery has
two positions contacting terminals 23 and 24~ When switch
elements 13 and 19 are in contact with terminals 21 and 23
respectively, switch 12 is in the NPN position. When the
switch is moved so that contacts 13 and 14 connect with
terminals 22 and 24 respectively, the switch is in PNP
condition. Terminal 23 is connected to black lead 25 o~
the tester and terminal 21 is connected to red lead 26
thro~gh resistor 27 and to blue lead 31 through resistor
32~ Bipolar LED 33, in series with resistor 34, is
connected across resistor 27.
When switch 12 is moved to the alternative position,
the negative side o battery 11 is connected thro~gh switch
14 and contact 24 to red and bl~e leads 26 and 31
.t

~.Z~ '77
respectively while switch element 13 is connected to black
lead 25 through terminal 22. As stated previously, this is
the PNP mode of the tester.
Switch elements 15 and 16 are shown connected to
terminals 35 and 36, having alternative terminal positions
37 and 38 respectively Terminals 36 and 37 provide
alternative connections to lead 41 of audible indicator or
buzzer 42, while terminals 35 and 38 are connected to lead
93 of the buzzer. Switch element 15 is connected to
terminal 21 and thereby to one side of battery 11,
depending upon the position of switch 12, while switch
element 16 connects the other side of the buzzer to red
lead 26. ~1hen switch 12 is in the NPN mode, lead 4~ of- -
buzzer 42 is connected to the positive side of the battery
while lead 41 is connected to the negative side when the
switch is in the PNP position. Thus lead 43 is always
positive with respect to lead 41, but the buzzer is
switched in its connection to LED 33 to correspond with the
change in polarity at junction 51 with the respective
switch positions. In the NPN mode, junction 51 is positive
while it becomes negative when switch 12 is in the PNP
mode.
By way of example, battery 11 may comprise a 9 volt
battery, resistors 32 and 34 are typically 100 ohms while
resistor 27 is a 1,000 ohm resistor, Bipolar LED 37 is
shown as having red and green diodes although it wo~ld be
possible to use a different kind of device having a similar
visual function. It should be noted that the circuit does
not have an audio transformer apart from a coil necessary
to operate buzzer 42. Of course, other audio indicators

~Z4~ 7
could be used in place of a buzzer.
For general operation description, when switch 12 is
in the NPN position as shown in the drawing, current flow
is from the minus side of battery 11 through switch element
1~ to contact 23 and through the black lead to the
component under test. Current returns to the circuit by
means of the red and blue leads through terminal 21 and
switch element 13 to the positive side of battery 11. In
this condition the red side 45 of the LED is biased ON.
When switch 12 is in the PNP position, which is the
alternative position shown in the drawing, current flow is
from the minus side of battery 11 through contact element
14 and terminal 24 through the red and blue leads to-~ the-
component under test. Current returns to the circuit by
means of the black lead 25 through terminal 22, switch
element 13 and back to the positive side of battery 11. In
this condition the green LED ~6 is biased ON and glows. In
both cases described above, when continuity is achieved
through the component under test, the buzzer ~2 will sound,
The operation of the device will be described by way
of several examples dealing with several di~ferent discrete
el~ctronic components.
~~n-lstor ~e_t
To test various aspects of a transistorf the steps
listed below should be followed:
1. Switch 12 should be placed in the NPN position as
shown in the drawing.
2. Connect the red lead to the collector of the
transistor.

77
3. Connect the black lead to the emitter. If the
buzæer sounds and the LED glows red, the transistor is
shorted emitter to collector. If the buzzer does not
sound and the LED glows red, there is an indication that
there is leakage through the base junction. If the buzzer
does not sound and the LED does not glow, continue to step
4.
4. Connect the blue lead to the base of the
transistor. If the transistor is good, the buzzer will
sound and the LED will glow red indicating that the
transistor is of the NPN type. If no buzzer is heard and
the LED does not glow, switch 12 should be changed to the
PNP position. ~t that point the buzzer should sound~ and
the LED should glow green indicating that the transistor is
of the PNP type. If at this point there is still no buzzer
sound and the LED does not glow, the transistor should be
considered as being bad and should be replaced.
It is important that the red and black leads of the
tester be connected to the collector and the emitter of the
transistor ur)der test before connecting the blue lead to
the base.
T~i3_ ~s~
To test a triac, the following steps should be
observed:
1. Set switch 12 to the NPN position.
2. Connect the black lead to main terminal 1 of the
triac.
- 3 Connect the red lead to main terminal 2~ At this
point the buzzer should not sound and the LED should not
glow.

1~4~ 7
4. Connect the blue lead to the gate of the triac~
Now the buzzer should sound and the LED should glow red.
5. Re~ove the blue lead from the gate of the triac.
If the buzzer and the LED do not continue functioning at
this point, the triac should be considered as ba~d. If the
buzzer and the LED remain on, the switch should be switched
to the PNP position and this should cause the buzzer and
the LED to stop functioning.
6. Connect the blue lead to the gate of the triac.
~t this point the buzzer should sound and the LED should
glow greenO
7. Remove the blue lead fro~ the gate. The buzzer
and LED should remain on until either the red or the b~ack
lead is removed from the triac terminal. If all these
conditions are not met, the triac should be considered bad.
SCB_Tes~
For testing of an SCR, conduct the ~ollowing steps:
1. Set the switch at 12 to the NPN position.
2. Connect the red lead to the anode of the SCR under
test.
3. Connect the black lead to the cathode of the SCR.
If the SCR is good, the buzzer will not sound and the LED
will not glow at this point.
4. Connect the blue lead to the gate of the SCR. Now
the buzzer should sound and the LED should glow red
indlcating that the gate has latched the SCR ON.
5~ Remove the blue lead. The buzzer should continue
to sound and the LED should re~ain on.
6. Remove the red or black lead so that the LED and
the buzzer stop functioning. If all of the above

il;~ l77
conditions are not met, the SCR should be considered bad
and should be replaced.
Some SCR's may indicate bad when the red lead is
connected to the anode and the black lead is connected to
the cathode (a shorted condition). Should this occur,
remove the black lead from the cathode and touch the black
lead to the gate lead of the device under test. This
should unlatch the gate of the SCRo Repeat steps 1 through
6 to determine if device is bad.
10 12io __Te_t
A diode may be tested as follows:
1. Set the switch 12 to the NPN position.
2. Connect the red lead of t~e tester to the cathode''' ~~
of the diode under test.
3. Connect the black lead of the anode of the diode.
If the buzzer does not sound and the LED does not glow,
change the position of switch 12 to the PNP position. A
buzzer should sound and the LED should glow green. This
indlcates that the dio~e under test is neither shorted'' nor
open. If the black lead i5 connected to the cathode and
the red lead is connected to the anode, then with switch 12
in the NPN position, the LED Will glow red. It should be
noted that this circuit does not check forward to reverse
bias of the diode.
LE _Test
An LED may be tested by following this procedure:
1. Switch 12 should be put in the PNP position.
2. Connect the red lead to the anode of the LED~
3. Connect the black lead to the cathode of the LEDo
~t this point the LED undeF test should glow. Operation of
. .
, ~,,, ... , . .. ~ - .. - - -

~I.;Z4~31 77
both the audible and visible indicators of the tester
indicate that the LED is good.
To test a bipolar LED, the tester should be employed
as follows:
1. Set switch 12 to the NPN position.
2. Connect the red lead of the tester to the anode of
the LED.
3. Connect the black lead of the tester to the
cathode of the LED~ The LED under test should glow red,
the buzzer of the tester should sound and the tester LED
should also glow red.
4. Set the switch 12 to the PNP position. At this
time the LED under test should glow green, the tester
buzzer should sound and the tester LED should also glow
green. If these conditions are not met, the LED under test
should be considered to be bad.
çQn- i n ~ y-Te s ~ , -
For the following test, if the switch 12 is in the ~PN
position, the LED Will glow red to indicate continuity.
1. Touch the red and black leads together and note
the sound of the b~zzer and the red glow of the tester LED.
2. Connect the red lead of the tester to one side of
the circuit being tested for continuity.
3. Connect the black lead to the other side of the
circuit. If there is continuity tbe buzzer will sound and
the LED will glow either red or green depending on the
position of switch 12~
4. A change in the buzzer tone as well as a dimming
of the tester LED from the levels noted in step 1 above
indicates that a resistance of as much as 3,000 ohms is
,. , . . ., . ~ .

1;~4~ 7 '
present. If the resistance is over 3,000 ohms, the buzzer
will not sound and the LED will not glow.
A fuse can also be tested for continuity, observing
the fact that if the switch is in the NPN position, the
tester LED will glow red.
1. Connect the red lead of the tester to one end of
the fuse.
2. Connect the black lead to the opposite end of the
fuse. If the fuse is good, the buzzer will sound and the
LED will glow.
When this tester is employed for the tests described
above, it is apparent that audible tones may be relied upon
for several baslc useful indications. Alternatively, ~the
visual indicators may be relied upon, particularly where
one color has different functional indications than does
the other color of the visual indicator. In some instances
both audible and visual indicators combine to provide the
desired information.
The simplicity, versatility and economic advantage of
this invention should now be readily apparent to the person
skilled in the art. It is likely that modifications and
improvements can be made which are within the scope of the
appended claims.
.. ~ .. ,. .. . ~ . .. . .... .. .

Representative Drawing

Sorry, the representative drawing for patent document number 1248177 was not found.

Administrative Status

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Event History

Description Date
Inactive: IPC deactivated 2014-05-17
Inactive: IPC assigned 2014-01-01
Inactive: IPC expired 2014-01-01
Inactive: First IPC assigned 2013-12-04
Inactive: IPC assigned 2013-12-04
Inactive: Expired (old Act Patent) latest possible expiry date 2006-01-03
Grant by Issuance 1989-01-03

Abandonment History

There is no abandonment history.

Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
MULZ, ROBERT H.
Past Owners on Record
ROBERT H. MULZ
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Claims 1993-10-04 11 376
Cover Page 1993-10-04 1 12
Abstract 1993-10-04 1 13
Drawings 1993-10-04 1 16
Descriptions 1993-10-04 9 292