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Patent 2027657 Summary

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(12) Patent: (11) CA 2027657
(54) English Title: METHOD FOR PREPARING LAMINATES OF ZNSE AND ZNS
(54) French Title: METHODE DE PREPARATION DE STRATIFIES DE ZNSE ET DE ZNS
Status: Expired and beyond the Period of Reversal
Bibliographic Data
(51) International Patent Classification (IPC):
  • C23C 16/02 (2006.01)
  • C23C 16/30 (2006.01)
  • G02B 13/16 (2006.01)
(72) Inventors :
  • PUROHIT, PAUL V. (United States of America)
  • KIRSCH, JEFFERY L. (United States of America)
  • MACDONALD, JAMES C. (United States of America)
(73) Owners :
  • CVD, INC.
(71) Applicants :
  • CVD, INC. (United States of America)
(74) Agent: GOWLING WLG (CANADA) LLP
(74) Associate agent:
(45) Issued: 1998-01-06
(22) Filed Date: 1990-10-15
(41) Open to Public Inspection: 1992-04-16
Examination requested: 1996-11-22
Availability of licence: N/A
Dedicated to the Public: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): No

(30) Application Priority Data: None

Abstracts

English Abstract


An improved method of forming a ZnS layer on a Znse
substrate by chemical vapor deposition of ZnS onto the
ZnSe is disclosed in which the ZnS is contacted, prior to
the chemical vapor deposition of the ZnS, with H2S in the
absence of zinc metal vapor to cause reaction of the H2S
and the surface of the ZnSe substrate.


French Abstract

On divulgue une méthode améliorée pour former une couche de ZnS sur un substrat de ZnSe par dépôt chimique en phase vapeur de ZnS sur le ZnSe dans laquelle le ZnS est mis en contact, avant le dépôt chimique en phase vapeur du ZnS, avec du H2S en l'absence de vapeur de zinc métallique pour provoquer la réaction entre le H2S et la surface du substrat de ZnSe.

Claims

Note: Claims are shown in the official language in which they were submitted.


WHAT IS CLAIMED IS:
1. In a method of forming a ZnS layer on a ZnSe
substrate by the chemical vapor deposition of ZnS onto the
ZnSe, the improvement comprising contacting of ZnS onto the
substrate, prior to the chemical vapor deposition of the
ZnS, with H2S, in the absence of zing metal vapor, at a
temperature and for a time sufficient to cause a reaction
of the H2S with the surface of the ZnSe substrate.
2. The method of Claim 1 wherein the reaction of
the ZnSe substrate is followed by chemical vapor
deposition of the ZnS.
3. A method of forming a ZnS layer on a ZnSe
substrate by chemical vapor deposition of ZnS onto the
ZnSe, said method comprising:
A. heating a ZnSe substrate in a chemical vapor
deposition chamber in the absence of zinc metal
vapor Jo a temperature sufficient to cause a
reaction between the ZnSe and H2S;
B. contacting the ZnSe substrate with H2S, in the
absence of zinc metal vapor, until the H2S
reacts with the surface of the ZnSe; and
C. introducing zinc metal vapor into the chamber in
the presence of H2S and depositing a layer of
ZnS onto the ZnSe by chemical vapor deposition.
- 10 -

4. A method of improving the adherence of a
chemical vapor deposited layer of ZnS to a ZnSe substrate
which comprises, prior to depositing the ZnS onto the
ZnSe, contacting the ZnSe with H2S in the absence of zinc
metal vapor at a temperature and for a time sufficient to
cause the H2S to react with the ZnSe.
5. The product produced by the method of Claim 1.
6. The product produced by the method of Claim 2.
7. The product produced by the method of Claim 3.
8. The product produced by the method of Claim 4.
9. An infrared optical element comprising a ZnSe
substrate having a ZnS layer deposited onto the surface of
said substrate by chemical vapor deposition, wherein the
surface of the ZnSe substrate has been reacted with H2S
in the absenc of zinc metal vapor prior to the deposition
of the ZnS whereby the surface of said substrate is
roughened.
10. In an infrared optical element comprising a ZnSe
substrate having a ZnS layer deposited onto the surface of
said substrate by chemical vapor deposition, wherein the
improvement comprises the surface of the ZnSe substrate
having been reacted with H2S prior to the deposition of
the ZnS layer whereby the surface of said substrate is
roughened.
- 11 -

Description

Note: Descriptions are shown in the official language in which they were submitted.


RCV BY:Xerox Telecopier 70ZO ilC-12-~0 ; 14;~1 ; 312 ~07 2Q25~ 1 613 5~39~69;# 3
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P~TEN~
~ ~ 2 ~ i 7
M~T}IOD FOR PRE3PARING LAMINATES ~F ZnSe and ZnS
BAC~ROUNI) OP I~E lrlv~ ~ lON
~ield of ~e Im~sntion
Thi~ invention relat~ gene~a~ly to me~hods o~
preparin~ ~nSe~Zn~ lamina~e~ or "~andwiche~ h~mic~1
v~por depo~itlon te~h~islue~ and the lamin;3~es ~o m~de.
)e~criPtlon t~f ~he Plior ~rt
Infrared transn~iss~re t~lndow~i ar~ cul~rencl3r u3~d a~c
th~ en'cr~nce ap~rture~ of n~any airborne reconnai~san~e or
navi~tion ~yst~m~. Material~ used for such win~ow~ have
to sati~fy se~e~l crite~a, includin~ ) th~ window
sholllcl not ~ignific~ntiy dee~e $e th~ ineomin~ ha~ or
render th~ Qi~nsl noi~y, ancl ~b~ th~ window ~n~te~
~houl~ be strong eno~gh ~o with~tand dust and rain e~o~ion
encount~ed ~u~inB, high speed flight. Zinc ~eleni~e
(ZnSe~, a hi~5hly tran3mi~1ve m~terial tn the i~frare~
~egion~ ~a~i~fie criterion ~a) ~te~y w~ll and i~ 1~hu~

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PATENT
7 ~ ~ 7
consid~ret an ideal candidate for ~uch window
applications. Ilow~ver, ZI~Se is a "so t" m~terlal
~ha~dne~ ~b~ut l~O knoop, flexural stren~h ~bou~c 8~0
psi) which dne~ not effectively resist rain and du~t
ero~ion during ~igh ~peed flight . Z~nc sulfide ¢~nS~ 7
al~a ~n infsared tr~nsmi~sive material, doe~ n~t have the
superior opti~al propertie~ of ~ina ~elenide but is much
~tron~er ~haI~dne~ ab~u~c ~40 knoop, flexural ~t2enlsth
about 15 ,001) psi~, ancl iq capable of withs'c~nA~ng the
cond~t~on~ vf hi~Sh ~peed flight at least up to about M~ch
~Jo. 1.
It i9 known th~t ~ laye~ oi ~nS ~out l~m ~chick
deposited on ZnSe is sufficient to p~o~uce ~ window with
rain erosion ~es~stan~e equivalent ~co that o~ pure ZnS
w~thout a ~ignificant lo~ t~ opti~al prcspe~tie3 of
the 2n5e, tlow~ver, there are problem3 a~_oci~t:ed in
I a~ e ~uch a ZnSe~nS "sandwich'~. One of the ruain
problem~ is ~he production of a strong bond ~tweer~ th~
ZnSe and ZnS ~ayers. Pre~riou~ attempt~ at -ki~Es suc~ ~
~andwich frequently re ulted in produe~ which the ZnS
layer peeled <~ff during poli~hing and ~ab~ication
proceduresl. T~us, the~e ha~ been a nee~ for a process by
which ZnSe/ZnS ~andwlches carl be made whi~h haYe a
~tron~Sly ~dherent bond betwe~n the ZnSe subs~rate arld ~he
ZnS layer.
One attempt at such a proce3~ hac ~een t~ ehe~ ally
etch ~he Zn~e ~ubst2ate prior to apply~n~ ~e ZrlS laye~
While the tran~mi~ n propertie8 of the~ resulting
~ndwich were no~ 81E~nifican~ly a~fec:ted, the streng~:h ~f
~che bund hetween the ~nSe and Zn5 la~e~s wa~ no'c ~ o~ed.

~CV BY:Xerox T~lecopier qO20 ~ 12-sa: 14:32 ; 31~ ~0~ 2025~ 1 ~13 ~63ga69:# 6
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~'AT~NT
7~7
U. S . Patent No . 4, 303, 63S, i~,sued December 1, 1981 to
Aldin~er, ~t ~1. di~closes op~ic~l grade zinc ~ulfide
bodie~ made by the ohemic;~l Yapor depos~tion (~ID)
tectmique. They a~e ~ub.iected to an afte~ t~e~tment und~
high gas pres~ure and at eleva~ed temperatu~e. ~Ihile the
CVD tec}mi~ue in general i~ discloset, the ~inc ~ulfide
bodies 7,r~ not fo~med on a ZnSe s~l~stra~e, ~,o the problem
o~ boncl streng~h is not addresset.
U.S. ~atent No. 4,447,4~9, is~ued May 8~ 1~84 to
Peter~, di~,clo~,es a low temperatu~e process ~or
depo~iting, e.~S., ZnS on a ~,ub~trate by reacting ~ v~por
phaqe reactant ~e.g. dimethyl zirlc~ anc~ neutral,
charge-fee ~ul~~ ato~.
U.5. P~ce~ No. 4,770,479, i~e~i SepteMber 131 19
to Tu~ison, and U.S~ P~tent No. 4,772,~80, ~s~uet
September 20~ lg~8 to Tutison gene~ally dl~close the
p:t~oduction of optical windows of 2nSe or ~nS by the CV~
n-e'chod .
Japane~e~ Patent J5 ~130-804 di~close 2nSe prepaxed by
react~ng hy~rogen and ~el~ni~m vapor to pro~uce hy~ro~en
~elenide which 1S ln turn reacted wi~h zinc vapor by a CV~
raethod to p~o~e ~ ZnSe articlç.
Japane~e P~tent J5 ~130-805 di~closes the production
of ZnSe by ,~ t ~inc and selenium vapor~ which ~auses
depositio~ o~ ZnS~.
Japane~e Patent J~ 9146-915-~ di~c~4se~ a proces~ ln
which met~llic zin~ is tirected toward a ~ub~t~ate while
~ulfur and/or se~ ium compound ga~ ls 5uppliecl, ~0 tha~
ZnS and/or ZnSe is adhe~ed to the ~ubst~ate.
Japane3e E'a~'ce}~t J~ 711~-004 discloses a proce89 in
whic~ ~ydro~en ~e~en~de is diluted with an inacti~2 gas
~nd i~ ~upplie~ to a re~ct ion tube in a high t~n~perature
~u~na~e. 4~ inacti~e carrier ga~ iQ dir;~ted on~o molter

RCV BY:Xerox Tel~copi~r 7~20 ;ln-l~-so, 1~:33; 312 00~ 202~ 13 5~98S~;~ 7
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PATEN~
~inc ~o 'chat zin~ vap~r i~ obt~ine~ ~o gt~o~ Zn~e on a
~ubs Lrate .
Japanooe Paten~ J6 0~69-~62-A ~ m~th~d ~or; ~ P
in~rax~ed tran~mittin~ materi~ o~ ZnS-ZnSe ~a~rin,~
excellent adherence ~o a ~ub~trate when sub~e&ted to heat
çycle~. A mlxed çryxtal layer i~ ~ormod at ~che in~cerface
~etween ~he 2nS ~nd ZnSe whic:h i~ e~~ec:t~ve in ~ ,- sovlnE:
the adher~nce of the Zn~ to the ZnSe. The p~oce3s
involve~ pla~inE ~ 2~n~e board i~ltO a CV~ ~ys~the~ usn~ce
~d intro~cin~5 %ino vapo~ toge~her with H~ nd H2Se
ga~ he flow rat~ o~ the H2Se i8 v~ried ~rom 100% H~SR
to OZ H2Se (100X H2S)~ a~er which only H S i~ pr~ ent.
StnMA~ OF THE~ ;h ~ ION
In ~ceortance wit~ the pre~ent invention, there is
provi~e~d an ~ d method o~ forming a ZnS lay~r on a
~nSe ~t~b~t~ate ky the chemical vapor deposition o~ ZnS
onto ~che ZnSe in which the impr~vemer~t ~omE~riso~
contac:tinE~ a 2nSe sub~trate, prior to the chemic~ apo~
deposition of the ZnS, with Hz S in the absence of zinc
metal v~por at a ~emperature and for a tim~ ~ufficien~ to
callse ~ r~eaction of the t~S with the surfa~e o~ the ZnSe
sub~t~at~
Also p~ot~rid~d ln accordance w~th t~is inYention i~ a
mechod o~ form~ng a 2nS ].ayer on a ZnSe ~3ub~xa~e by the
chemical vapor d~po~it~on of ZnS onto the ZnSe ~ said
metho~ comp~ n~,:
A. he~tin~ a ZnSe substrate in a chemical vap~r
depo~ition chamber, in the a~senc~ of zinc me~al

R~V BY:Xerox Telecopi~r ~2~ .10-12-90; 14:33; 312 ~7 2025~ 3 5E3g869;#
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P~T~NT
~7~7
vapor, to a temperature ~ll~ficient to caus~ a
~ea~tio~ between the Zn~e and ~I~S;
. con~actin~ th~ ZnS~ with H,~S, in the a~ence o~
~inc met 1 vapor, ~ntil the ~S Ie~cts with thc
~ur~ace of the ZnSe; an~
C. introduclng zinc metal vapol into the chamber in
the presenc~ of H~S an~ depositing ~ layer of
ZnS onto the ZnSe by c~nen~ic2~ vapor depo~ n.
There 1~ al o pr~ide~ in ac~ordance with thiR
invention, a method o~ improvln~, the a~heren~ of a
c~emical vapoz ~eposited l~yer o~ ZnS ~o a Z~S~ ~ub~ te
which comprises, prior to ~epositi~g the ZnS onto th~ ZnSe
cor~tactine the ZnSe w~ H2S, in ~he ~l~sence of zin~:: metal
vapor~ at a tempera'cure an~ for a time ~uI'f$cient to c~use
~che H2S to react wit~ the ZnSe.
Further prot~rided in ~ccordance with thi~ invention
aI~e the prod~ct~ pro~ue~d by the ~bove p~oces~e3
In accordance wi~ch ~he pre3ent invent vn there i~
furthel~ proYided ~n infrared optical element co~pri~in~,
ZnSe ~ubstrate ha~il~g a ZnS layer deposited onto the
~ur~ce of sail ~ub~trate by chemi~al ~apo~ depo~ition,
where~n thc sur~ace o~ th~ ZnSe ~stra~ce ha~ been reac~ed
with H2S prior ~o the deposition of the ~nS where~y the
~urf~ce of s~ ubstrate is roughened.
Also pro~ided ~ccordin~ ~o the pre~ent in~rention i~
an impro~red infra~ed opticz} el~m~nt compr- sin~ a ZnSe
sub~tra~ce havin~ a ZnS layer dept)3i~ed on~co the su~face o~
said ~ubstria~ by c1Lemical vapor depo~i~cion~ the
impro~ nt compri~ing the sur~~ce o~ the ZnS2 subs~crate
h~vin8 bel!n reacted w~'ch ~2S prio~ ~o the deposit~on o~
- 5 -

~CV gY:Xerox Tel~copier 7~0 ;l~ gO ; 14:34 ; 3~ ~07 2~25~ 1 613 56398~3:$ g
1762-33-00
PAT~T 2 ~ ~ 7 6 ~ 7
the ~ laye~ where~y ~he s~fac~ o~ said ~b~tr~te i3
rouE~hqn~d .
~F.T~ n l)~SC~IPTI~:)N OF 'l~ Ih~It5n L lON
A~icle8 com:pri~inES a ZnSe ~ub~trate with a ZnS layer
o~ coating, ~n it (sc~metime~ called a "laminate" or
"sa~dwich") can be mac~e by chemlcal vapor tepo~itior~
techniques. In ~eneral, this techniq~e invol~ves forming
the ZnSe sub~trate ~y known chemical vapo~ ~lepo~ition
method3, ~haping and poli~hin~ the 2nSe ~ub~trate ~ if
desi2~ed, an~ thesl d~po~iting the layer o~ 2nS onto the
sur~ce of the ~nSe ~u~strate by chemical vapor
depo~îtion. The reYultinES "5andwich" i~ ~hen 8hape~ to a
des~ed configuration and poli~hed.
pre~ent in~ention provide~ a method of, ~in~
'che~c ZnSelZnS "~andwiche~" which impr~ves the adhe~ion
between the ZnSe ~nd ZnS re~lt~nK in a ~tron~ er boncl
between t~e layers and fewe~ in~tances of delamination
du~ing fa~ricat:ion b~ t~e final product. The inc~ased
adhesion ~etwe~n the ZnSe and ZnS layer i~ evitenced by
the fact t~at, wh~n tect~d ~or f~exur~l st~engt~, 'chc
"~andwiche~'l fractu~e a~os~ the bond rather than along :Lt
(a8 would, be the ca~e i~ adh~ion bel~ween the layer~ were
we~k)~ ~)ne of the primary ~rantage~ of the pre3ent
inven~ion is t~at t~i~ incre~se~l adhesion ~ achieved more
cons~t~n~ly th~n with known meth~ds, thus lncr~asin~ the
yield oiE u~able "~andwiche3".
Anothe~ advanJc~e of the prese~t in~Je~tion is th~t
~nifor~n growth ~f ~he ZnS laye~ on the ZnSo 3ub~tr~te is
mor~ ~on~isten'cly achieved ~haLn wi~h ~rlo~n met}~ts.

RCV BY:Xerox Telecopier 7~20 ;1~-12-9~ 34 : 312 807 2025~ 1 613 5639369:~13
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~ he metho~ of the pre~nt invention ~ssentiall~
inv~lve~ contactin~ a ZnSe substrate ~w~i~h in mozt c~es
i~ pre-~ormed) with H~S at ~ te~pe~t~re an~ ~or a time
8U~flCient tD caw~e the H2S to react with the sur~ace of
the ZnSe s~b~rate. W~ile n~t li~iting thi~ in~en~ y
any p~rticular theory, it ~ ~elieve~ tha~ the reac~o~ of
the H~S and ZnSe .. 3'v~8 oxyeen and other cont ~nant~
from the ~urfac~ of the ZnSe ~ubst~ate ~nd con~rt~ 30m~
of the Zn~e to ~nS.
TSe t ,e ~tur~ employe~ in the method of thi~
in~ention is not critîca}, it being only neces~a~y.that
the temp~rature be high e~ough to p~rmit the H25 and Zn~e
to re~ct, i.e. ~out 20~~C, and low enough that the ZnSe
i~ not ad~ers~ly affectet.
~ t 18 e~ential to the p~e~en~ inven~ion that She H2S
be allowed to ~eact wi~h the ZnSe in the absence of zin&
~etal vapor. This can be acco~p~i~hed in two ways. The
fi~st i~ to phy~ically confine ~he zinc met~l vapo~ So
tha~ it can not contact the ~nSe or H~S. Thi5 allows the
Zn5e and HlS to seact at a temperatu~e hi~her tha~ ~he
~porizat~on te~perat~e of the zl~c metal. ~ho se~on~,
and pre~e~red, me~hod i te react the ZnSe and K2S at ~
te~pe~ature below t~e v~porization temperature o~ the zinc
~et~l) l.e. a~ a~o~t 419~C to about 685~G. Thi~ permit~
the 'l~andwl~" to be c~nveniently m~de by placln~ both the
~nSe ~nd zinc metal ~ut n~t it~ vapo~) in the ~ame
chemic~l vapor depo~ition cham~er and reacting the ZnBe
~nd H25 in the pre~ence of the zin~ metal ~b~t not ~y
~ub~tanti~l ~mo~nt o~ it.~ vapo~), On~e the ~S has
reacted su~iciently with the ZnSe, t~e chemica~ vap~r
depo~itlon of the ZnS may be be~n ~imply by inc~easin~
the temperatu~e o~ th~ chambe~ t~ vaporize the zine metal
-- 7

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PATl~T ~ ~ ~ 7 l~ ~ 7
Th~ H,S m~t ~e pennitt~d to con~act ~he Zn~e for a
time ~u~ficient to per1nit it to react wi'ch the ZnSe. A~
will be apparent to one ~killed in the a~t ~ ttli3 ~eaction
tim~ c~n ~ary cunsid~rably depending upon the condition~
(e.~3., temperatu~e, pre~sure, H~S flow rate~ e~pl4yed in
the chemic~1 v~por dep~sition c}~m~e~. In g~rleral
minim~ reacti~n time o~ about Z ha~r~ wîll be re~u~ Tec~
One ~killed n the ~rt carl xea~ily deter~nine the necessary
re~ction tiDle un~er~ a particular ~et o~ condition~ ~ince
the reaction o~ the ZnSe sub tr~te and H2S i~ 41CC ~ ~nie~
by an ets~ g o~ roughening of the ~urface of the ZnSe
~ub~rate which can be cle~ected vi~ually. Th~ the
ZnSe ~ S beerl con~acted wlth the HsS lon~ en~u~h to det~.cc
etching or rough~ni~S o~ th~ ~ur~ace o~ the ZnSe thi~
provide~ an ind~c~tion that reaction has occur~cd. While
the 1~ may, of cour~e, co~tact the ~nSe for l~n~er than
the minimun time for the two to react w~thout a~ver~e
co~equence8, such lon~er co~tact times do not pro~ide any
particular bene~it.
In the c~. -rcial pr~du~tion of the Zn~e~ZnS
"s~n~wiche~" in accordance with ~he present ~nve~tion
teterminat~on of 'n~ r~ac~ion time is na~ ~ ~actor.
In a typical c~ ci31 p~cedur~ the H25 is allowed ka
eonta~t ~e ZnSe ~ub~t~ate while the temperature of the
~hemical ~por tepo~ition cham~e~ is ~ai~ed ~ro~ a~out
419~C (the mel~in~ poin~ of zinc metal) ~o ~he deposition
temperature of t~e ~inc metal (about 6~5~C). While ~hi~
time will be di~~e~e~t depPnding upon the par~icul~r
equlp~ent a~ p~cedures emp10yed, in a typi~l eomm~cl~l
p~oce~ it i~ ~o~e han ~ufficient to allow the ~S and
ZnSe to react~
The p~e8~nt ihve~tlon i9 illu~trat~d by ~h~ ~ollowin~
~x~mple.

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7 ~ ~ 7
E~AMPLE
a ZnSo ~b3trat~s (which h~d been p~e-foa~71ed by a
corlY~nt~ al chemical Yapor ~epo~ition m~t~od, shap~d to a
de~ired c:onfigu*atiorl ~nd polished) wa~ plac~d in a
cor~vention~l vapor depo~l~cion ~h~r ~er alvn~S with zlne
~etal. Tl~c chr ber W~8 purnpe~ down to vacuum and heatecl
co ~b~t 300UC. A ~low ~E argon into th~ ~h~mber was
begun ~hile th~ temper~ture in the ch~ er w~ ~al~edl to
a~out 6~0~C. No ~inc Yapor wa~ present in ~h~ c~b~ A
~low o~ H~ lor~g wltl!~ ~rgon) into the ch~mb~r wa3 beE~un
and continued ~or abQut 12 hour~. No zinc vapo~ ~as
pre~en~ in the cha~ber ~uring thi~ ti~e. rrl~e ch~mbe~
tempe~atu~ a~ ~ais~t to ~bou~ 690~C and a ~low o~ zinç
me~l vap~ (along wl~ch argon) into ~che ch~ ~r w~ begwn
while the flow of H;~S contlnued. ~nS wa13 thçn depo~ited
on the ZrlSe ~ub~rste ~rl a conventian~ r.
Tl~e ~e~ulting 2nSe/ZnS "~andwich" had a strong bond
betw~en the ~nSo s,nd ZnS layer~ and wa~ fabricated and
poli~ed wlthout delalslination o~ th~ lay~r3.
_ _ _.. _ _ .. _ .. ... . ... , ... . _ .. .. . .. _ ... _ _ .. .......... .....

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Event History

Description Date
Time Limit for Reversal Expired 2007-10-15
Letter Sent 2006-10-16
Grant by Issuance 1998-01-06
Pre-grant 1997-08-15
Inactive: Final fee received 1997-08-15
Letter Sent 1997-07-17
Notice of Allowance is Issued 1997-07-17
Notice of Allowance is Issued 1997-07-17
Inactive: Application prosecuted on TS as of Log entry date 1997-07-14
Inactive: Status info is complete as of Log entry date 1997-07-14
Inactive: IPC removed 1997-07-11
Inactive: IPC assigned 1997-07-11
Inactive: First IPC assigned 1997-07-11
Inactive: IPC removed 1997-07-11
Inactive: IPC assigned 1997-07-11
Inactive: IPC removed 1997-07-11
Inactive: IPC assigned 1997-07-11
Inactive: Approved for allowance (AFA) 1997-06-11
Request for Examination Requirements Determined Compliant 1996-11-22
All Requirements for Examination Determined Compliant 1996-11-22
Application Published (Open to Public Inspection) 1992-04-16

Abandonment History

There is no abandonment history.

Maintenance Fee

The last payment was received on 1997-08-06

Note : If the full payment has not been received on or before the date indicated, a further fee may be required which may be one of the following

  • the reinstatement fee;
  • the late payment fee; or
  • additional fee to reverse deemed expiry.

Please refer to the CIPO Patent Fees web page to see all current fee amounts.

Fee History

Fee Type Anniversary Year Due Date Paid Date
MF (application, 7th anniv.) - standard 07 1997-10-15 1997-08-06
Final fee - standard 1997-08-15
MF (patent, 8th anniv.) - standard 1998-10-15 1998-09-14
MF (patent, 9th anniv.) - standard 1999-10-15 1999-09-15
MF (patent, 10th anniv.) - standard 2000-10-16 2000-09-13
MF (patent, 11th anniv.) - standard 2001-10-15 2001-09-14
MF (patent, 12th anniv.) - standard 2002-10-15 2002-09-19
MF (patent, 13th anniv.) - standard 2003-10-15 2003-09-22
MF (patent, 14th anniv.) - standard 2004-10-15 2004-09-21
MF (patent, 15th anniv.) - standard 2005-10-17 2005-09-21
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
CVD, INC.
Past Owners on Record
JAMES C. MACDONALD
JEFFERY L. KIRSCH
PAUL V. PUROHIT
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Description 1997-04-24 9 362
Cover Page 1998-01-20 1 27
Cover Page 1994-03-05 1 14
Claims 1994-03-05 2 61
Abstract 1994-03-05 1 12
Description 1994-03-05 9 332
Commissioner's Notice - Application Found Allowable 1997-07-17 1 164
Maintenance Fee Notice 2006-12-11 1 173
Correspondence 1997-08-15 1 33
Fees 1997-08-06 1 32
Fees 1996-07-29 1 29
Fees 1995-07-27 1 35
Fees 1994-08-03 1 36
Fees 1993-08-04 1 31
Fees 1992-10-01 1 29
Courtesy - Office Letter 1991-01-04 1 31
Prosecution correspondence 1996-11-22 1 36
Prosecution correspondence 1997-03-13 4 124