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(12) Patent Application: | (11) CA 2294303 |
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(54) English Title: | USE OF AND METHOD FOR TESTING OF DOCUMENTS WITH DIFFRACTION-OPTICALLY EFFECTIVE SAFETY LAYERS |
(54) French Title: | UTILISATION ET PROCEDE POUR LE CONTROLE DE DOCUMENTS A COUCHES DE SECURITE DIFFRINGENTES |
Status: | Deemed Abandoned and Beyond the Period of Reinstatement - Pending Response to Notice of Disregarded Communication |
(51) International Patent Classification (IPC): |
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(72) Inventors : |
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(73) Owners : |
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(71) Applicants : |
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(74) Agent: | SMART & BIGGAR LP |
(74) Associate agent: | |
(45) Issued: | |
(86) PCT Filing Date: | 1998-04-24 |
(87) Open to Public Inspection: | 1998-11-05 |
Availability of licence: | N/A |
Dedicated to the Public: | N/A |
(25) Language of filing: | English |
Patent Cooperation Treaty (PCT): | Yes |
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(86) PCT Filing Number: | PCT/DE1998/001182 |
(87) International Publication Number: | DE1998001182 |
(85) National Entry: | 1999-12-14 |
(30) Application Priority Data: | ||||||
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The invention relates to an application and a method for checking documents.
Hitherto, documents with optical diffraction security layers, specially
holograms, were checked by costly optical monitoring technology. The entire
monitoring process was so time-consuming that the monitoring process could not
be applied to fast operating processing machines. Rapid monitoring (as an
authentication characteristic) constitutes a further security step in
evaluating effective optical diffraction security layers. The effective
optical diffraction layer has a discontinuous metallizing layer and/or
partially metal layers and/or areas of metal layers on various planes. Several
methods of measurement exist to detect electrical conductivity. In practice,
the contactless capacitive method of measurement has proven to be more
practical.
L'invention concerne une utilisation et un procédé pour le contrôle de documents. Jusqu'à présent, des documents à couches de sécurité diffringentes, en particulier des hologrammes, étaient vérifiés en recourant à une technique de contrôle optique coûteuse. Toutefois, l'ensemble du processus de contrôle était d'une durée si longue qu'un tel procédé ne pouvait trouver d'application dans des machines de traitement à grande vitesse. Une possibilité de contrôle rapide représente, en tant que réelle caractéristique, une autre étape de sécurité lors de l'évaluation des couches diffringentes. La couche diffringente présente, dans des plans différents, une couche métallisée discontinue et/ou des couches partiellement métalliques et/ou des zones de couches métalliques. On connaît divers procédés de mesure faisant intervenir une conductivité électrique. Dans la pratique, le procédé de mesure capacitif, sans contact, s'est révélé comme étant d'une meilleure faisabilité.
Note: Claims are shown in the official language in which they were submitted.
Note: Descriptions are shown in the official language in which they were submitted.
2024-08-01:As part of the Next Generation Patents (NGP) transition, the Canadian Patents Database (CPD) now contains a more detailed Event History, which replicates the Event Log of our new back-office solution.
Please note that "Inactive:" events refers to events no longer in use in our new back-office solution.
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Description | Date |
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Inactive: IPC expired | 2016-01-01 |
Inactive: IPC expired | 2016-01-01 |
Inactive: IPC from MCD | 2006-03-12 |
Time Limit for Reversal Expired | 2004-04-26 |
Application Not Reinstated by Deadline | 2004-04-26 |
Deemed Abandoned - Failure to Respond to Maintenance Fee Notice | 2003-04-24 |
Inactive: Abandon-RFE+Late fee unpaid-Correspondence sent | 2003-04-24 |
Inactive: Entity size changed | 2002-05-07 |
Letter Sent | 2000-03-01 |
Inactive: Cover page published | 2000-02-16 |
Inactive: Correspondence - Transfer | 2000-02-15 |
Inactive: First IPC assigned | 2000-02-15 |
Inactive: Single transfer | 2000-02-10 |
Inactive: Courtesy letter - Evidence | 2000-02-08 |
Inactive: Notice - National entry - No RFE | 2000-02-01 |
Application Received - PCT | 2000-01-28 |
Application Published (Open to Public Inspection) | 1998-11-05 |
Abandonment Date | Reason | Reinstatement Date |
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2003-04-24 |
The last payment was received on 2002-04-23
Note : If the full payment has not been received on or before the date indicated, a further fee may be required which may be one of the following
Patent fees are adjusted on the 1st of January every year. The amounts above are the current amounts if received by December 31 of the current year.
Please refer to the CIPO
Patent Fees
web page to see all current fee amounts.
Fee Type | Anniversary Year | Due Date | Paid Date |
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Basic national fee - small | 1999-12-14 | ||
Reinstatement (national entry) | 1999-12-14 | ||
Registration of a document | 2000-02-10 | ||
MF (application, 2nd anniv.) - small | 02 | 2000-04-25 | 2000-02-25 |
MF (application, 3rd anniv.) - small | 03 | 2001-04-24 | 2001-03-05 |
MF (application, 4th anniv.) - standard | 04 | 2002-04-24 | 2002-04-23 |
Note: Records showing the ownership history in alphabetical order.
Current Owners on Record |
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WHD ELEKTRONISCHE PRUFTECHNIK GMBH |
Past Owners on Record |
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FRANK PUTTKAMMER |