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Patent 2315020 Summary

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Claims and Abstract availability

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(12) Patent Application: (11) CA 2315020
(54) English Title: ELECTRICAL CIRCUIT ARRANGEMENT FOR TRANSFORMING OF MAGNETIC FIELD ENERGY INTO ELECTRIC FIELD ENERGY
(54) French Title: CONFIGURATION DE CIRCUIT ELECTRIQUE DESTINEE A LA TRANSFORMATION D'ENERGIE DE CHAMP MAGNETIQUE EN ENERGIE DE CHAMP ELECTRIQUE
Status: Deemed Abandoned and Beyond the Period of Reinstatement - Pending Response to Notice of Disregarded Communication
Bibliographic Data
(51) International Patent Classification (IPC):
  • H2M 3/10 (2006.01)
  • G5F 1/46 (2006.01)
  • H1L 29/12 (2006.01)
  • H2M 3/155 (2006.01)
(72) Inventors :
  • MITLEHNER, HEINZ (Germany)
  • MUNZ, DIETER (Germany)
  • SCHMIDT, RICHARD (Germany)
  • STEPHANI, DIETRICH (Germany)
(73) Owners :
  • SICED ELECTRONICS DEVELOPMENT GMBH & CO. KG
(71) Applicants :
  • SICED ELECTRONICS DEVELOPMENT GMBH & CO. KG (Germany)
(74) Agent: SMART & BIGGAR LP
(74) Associate agent:
(45) Issued:
(86) PCT Filing Date: 1998-12-08
(87) Open to Public Inspection: 1999-07-01
Availability of licence: N/A
Dedicated to the Public: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): Yes
(86) PCT Filing Number: PCT/DE1998/003603
(87) International Publication Number: DE1998003603
(85) National Entry: 2000-06-16

(30) Application Priority Data:
Application No. Country/Territory Date
197 56 873.4 (Germany) 1997-12-19

Abstracts

English Abstract


An electrical circuit arrangement (G) for transforming (W) magnetic field
energy (M) into electric field energy (E) has at least one first accumulator
element (L) for magnetic field energy (M), a second accumulator element (C)
for electric field energy (E), a semiconductor valve element (D) and an
electrical switching element (S). According to the invention, the
semiconductor material of which the semiconductor valve element (D) is made
has a band gap (VB) of at least 2 eV and a breakdown field strength (EK) of at
least 5*10~5 V/cm. The semiconductor material of which the semiconductor valve
element (D) is made contains, in particular, silicon carbide (SiC), gallium
nitride (GaN) or diamond (Cdia). The semiconductor valve element (D) is, in
particular, a semiconductor diode, preferably a Schottky diode. Owing to the
low dynamic switching losses of the semiconductor valve element (D) according
to the invention, the electrical circuit arrangement (G) can be used with the
smallest components even at high operating voltages and high switching
frequencies.


French Abstract

L'invention concerne une configuration de circuit électrique (G) destinée à la transformation (W) d'une énergie de champ magnétique (M) en énergie de champ électrique (E). Cette configuration possède au moins un premier élément accumulateur (L) destiné à l'énergie magnétique (M), un deuxième élément accumulateur (C) destiné à l'énergie électrique (E), un élément valve à semiconducteur (D) et un élément de connexion électrique (S). Selon l'invention, le matériau semiconducteur dans lequel l'élement valve à semiconducteur (D) est réalisée, présente une largeur de bande interdite (VB) d'au moins 2 eV et une intensité de champ de claquage (EK) d'au moins 5*10^5 V/cm. Le matériau semiconducteur de l'élément valve à semiconducteur (D) contient notamment du carbure de silicium (SiC), du nitrure de gallium (GaN) ou du diamant (Cdia). L'élément valve à semiconducteur (D) est notamment une diode à semiconducteur, de préférence, une diode Schottky. Etant donné les faibles affaiblissements de commutation dynamiques de l'élément valve à semiconducteur (D) selon l'invention, la configuration de circuit électrique (G) dotée de composants compacts peut être utilisée même pour des tensions de fonctionnement élevées et des fréquences de commutation élevées.

Claims

Note: Claims are shown in the official language in which they were submitted.


-14-
1. An electrical circuit arrangement (G) for
transformation (w) of magnetic field energy (M) into
electrical field energy (E), having at least one first
energy-storage element (L) for magnetic field energy
(M), a second energy-storage element (C) for electrical
field energy (E), an active semiconductor element (D)
and an electrical switching element (S) which can
assume at least one first and one second switching
state (S1, S2),
a) which are connected to one another in such a way
that
a1) in the first switching state (S1) of the
switching element (S), the magnetic field
energy (M) can be stored in the first
energy-storage element (L), and
a2) in the second switching state (S2) of the
switching element (S), the magnetic field
energy (M) can be transformed from the first
energy-storage element (L), bring passed via
the active semiconductor element (D), to the
second energy-storage element (C) for
electrical field energy (E), wherein
b) the active semiconductor element (D) has an energy
gap (VB) of at least 2 oV and a breakdown field
strength (EK) of at least 5*10~5 V/cm, and wherein
c) at least one further active semiconductor element
(D') is connected in parallel with the active
semiconductor element (D).
2. The electrical circuit arrangement as claimed
in claim 1, characterized in that the semiconductor
material of the active semiconductor element (D)
contains silicon carbide (SiC).

15
3. The electrical circuit arrangement as claimed
in claim 1, characterized in that the semiconductor
material of the active semiconductor element (D)
contains gallium nitride (GaN).
4. The electrical circuit arrangement as claimed
in claim 1, characterized in that the semiconductor
material of the active semiconductor element (D)
contains diamond (C diamond).
5. An electrical circuit arrangement (G) for
transformation (W) of magnetic field energy (M) into
electrical field energy (K) having at least one first
energy-storage element (L) for magnetic field energy
(M), a second energy-storage element (C) for electrical
field energy (E), an active semiconductor element (D)
and an electrical switching element (S) which can
assume at least one first and one second switching
state (S1, S2),
a) which are connected to one another in such a way
that
a1) in the first switching state (S1) of the
switching element (S), the magnetic field
energy (M) can be stored in the first
energy-storage element (L), and
a2) in the second switching state (S2) of the
switching element (3), the magnetic field
energy (M) can be transformed from the first
energy-storage element (L), being passed via
the active semiconductor element (D), to the
second energy-storage element (C) for
electrical field energy (E), wherein
b) the semiconductor material of the active
semiconductor element (D) contains silicon carbide
(SiC), and wherein.
c) at least one further active semiconductor element
(D') is connected in parallel with the active
semiconductor element (D).

--16--
6. The electrical circuit arrangement as claimed
in one of claims 1, 2 or 5, characterized in that the
active semiconductor element (D) has an energy gap (VB)
of about 3 eV and a breakdown field strength (EK) of
about 25~10~5 V/cm (Figure 2, Figure 3, SiC).
7. An electrical circuit arrangement (G) for
transformation (W) of magnetic field energy (M) into
electrical field energy (E) having at least one first
energy-storage element (L) for magnetic field energy
(M), a second energy storage element (C) for electrical
field energy (E), an active semiconductor element (D)
and an electrical switching element (S) which can
assume at least one first and one second switching
state (S1, S2),
a) which are connected to one another in such a way
that
a1) in the first switching state (S1) of the
switching element (S), the magnetic field
energy (M) can be stored in the first
energy-storage element (L), and
a2) in the second switching state (S2) of the
switching element (S), the magnetic field
energy (M) can be transformed from the first
energy storage element (L), being passed via
the active semiconductor element (D), to the
second energy-storage element (C) for
electrical field energy (E), wherein
b) the semiconductor material of the active
semiconductor element (D) contains gallium nitride
(GaN), and wherein
c) at least one further active semiconductor element
(D') is connected in parallel with the active
semiconductor element (D).
8. The electrical circuit arrangement as claimed
in one of claims 1, 3 or 7, characterized in that

-17-
the active semiconductor element (D) has an energy gap
(VB) of about 3.2 oV and a breakdown field strength
(EK) of about 30~10~5 V/cm (Figure 2, Figure 3, Gan).
9. An electrical circuit arrangement (G) for
transformation (W) of magnetic field energy (M) into
electrical field energy (E) having at least one first
energy storage element (L) for magnetic field energy
(M), a second energy-storage element (C) for electrical
field energy (E), an active semiconductor element (D)
and an electrical switching element (S) which can
assume at least one first and one second switching
state (31, 32).
a) which are connected to one another in such a way
that
a1) in the first switching state (S1) of the
switching element (S), the magnetic field
energy (M) can be stored in the first
energy-storage element (~), and
a2) in the second switching state (S2) of the
switching element (S), the magnetic field
energy (M) can be transformed from the first
energy-storage element (L), being passed via
the active semiconductor element (D), to the
second energy-storage element (C) for
electrical field energy (E) (Figure 1),
wherein
b) the semiconductor material of the active
semiconductor element (D) contains diamond
(C diamond), and wherein
c) at least one further active semiconductor element
(D') is connected in parallel with the active
semiconductor element (D).
10. The electrical circuit arrangement as claimed
in one of claims 1, 4 or 9, characterized in that

-18-
the active semiconductor element (D) has an energy gap
(VB) of about 5.5 eV and a breakdown field strength
(EK) of about 100*10~5 V/cm (Figure 2, Figure 3,
C diamond).
11. The electrical circuit arrangement as claimed
in one of the preceding claims, characterized in that
the first energy-storage element (L) for magnetic field
energy (M) in an inductive element (L), in particular a
coil.
12. The electrical circuit arrangement as claimed
in one of the preceding claims, characterized in that
the second energy-storage element (C) for electrical
field energy (E) is a capacitive element (C), in
particular a capacitor.
13. The electrical circuit arrangement as claimed
in one of the preceding claims, characterized in that
the electrical switching element (S) is a semiconductor
switching element (S), in particular a field-effect
transistor.
14. The electrical circuit arrangement as claimed
in one of the preceding claims, characterized in that
the active semiconductor element (D) and/or the further
active semiconductor element (D') are/is a Schottky
diode.
15. The use of an electrical circuit arrangement as
claimed in one of the preceding claims in a step-up
controller circuit (H, D11).
16. The use of an electrical circuit arrangement as
claimed in one of the preceding claims in a step-down
controller circuit (T, D21).

-19-
17. The use of an electrical circuit arrangement as
claimed in one of the preceding claims in the primary
circuit. (DW1, D31) of a forward converter circuit (DW).
18. The use of an electrical circuit. arrangement as
claimed in one of the preceding claims in the secondary
circuit (DW2, D32) of a forward converter circuit (DW).
19. The use of an electrical circuit arrangement as
claimed in one of the preceding claims in the external
cascade circuit (PA, D41) of a power-factor circuit

(PFC).
20. The use of an electrical circuit arrangement as
claimed in one of the preceding claims in the internal
cascade circuit. (PT, D42) or a power-factor controller
circuit (PFC).

Description

Note: Descriptions are shown in the official language in which they were submitted.


1
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Description
- 1 -
Elcotriaal circuit arrangement for tranaiormation of
magnetic field energy into alectrioal field energy
The invention rolateo to an electrical circuit
arrangement fc~r tran~fc~rrn~rt.lum ut magnetic field energy
into electrioctl field energy having at least one rirst
rnr_c~yy-~~u.cagr~ element for magnetic field energy, a
second energy-storage element !or AJ r~~fi.ri c:~ 1 f Lrld
~suwLgy. an active semiconductor element and an
electrical 'witching P1 amanfi, wTrlc:li c:dn d~saume at least
one first and one second switching state, which are
cannerted rrt nnP another in ~ucar d way that in the
brat switching state of the switching ~lom~ent, tt,R
ma7netlr field ~ner~y eau be Stored in the first
onQrgy-storage element, and in thA Rwc-.arui ~wiLuhilzg
:~ I.rr l_~ ut the switching element, the magnetic field
energy oan ba transform~d from thA fir:~l: rue~yy-atoraQe
element, being pa'sed via the aotivs semiconductor
e1~ment, to tn~e aP~onri ~~rrr,ryy-~l:orage element for
electrical field energy.
p wr:~krm5~ u.~ ouch known electrical circuit
nrranqemcnta for trans>aarmation of m~yrre~lc: field
Rn~r~c3y lrrLo electrical field energy is, in particular,
the octave semiconductor element : cm Llue one hand. the
active acuclc:urxJuctor element is subject to high voltac~a
fluctuations in the fnrwar~l ~lir:oction during each
rrcdLgy transformation process, and thRRR Vul~ar~o
3U fluctuations area crt d~~rzoximately the name magnitude as
the input voltage of the circuit arrarcyement. On the
other hand, thrt dc:Live semiconductor clement should ha
able to resist voltages of y Lu several timco the
input. vnll_dyes of the circuit arrang~ment in thA rrvrsia~t
direction. In the process, elm active semiconductor
r.lducant is aubiect to a high alt~ernaring 1uW 1 between
the forward St~tR end 1.11e rCVer'e State. z~he power
capacity of the active semicon~9mnfinr tslement thus
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cvn~ide~~dLly limiLe~ the gawer capacity of the entire
circuit arrangQmont.
A3 a rule, conventional active aomiconductor
a1 ~mr~nl.a are Ntudu~:ml from silicon 3i. These have the
disadvantage that
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PCT/DiE96/03G03 - 2
h1 gh reverse voltages can k~e ac;l~ldvd~i urrly Ly m~cana of
correspo»di.ngiy thick somiconductor function layers i.n
L1're au~tive semiconductor clement. liowove:r, thick
semiconrlcac.:r, ~r ~nnnt,i on 1 Hytara lidvd Llle di3advantage
that they have h:lgh dynamic switching lossms. The
dynamic ~wi fie~:hi ng 1 ny~~:~ c~c:c:ur y~iwlc~minantly when the
active semioonductor ~loma~nt changes Pram the rPVer.sP
aLdL~s to the forwnrd state and vice versa, in
particular due to the 1'~rm~rri~n ancS dissipation of
minority and majority cnrriorc. The dynamic switching
losses result 1 n rc~rrR~pnr:cj i coyly lri~lr thermal leases,
which can lead to destabilization of thQ active
Semi nnnr9ur:l.c~ c' rlc~tu~srtL . Ftxtthermore, the maximum power
loon Which can be dissipated from trie artivP
semiconductor element limits the 3witehing froquency of
the switching element of the ri r~mi 1- ~rranyerudirL, acrd
thus it3 power capacity, owing to the maximum
temperarurR that. t.hr. ~c:Liv~ ~~nticonductor element can
withstand. The first energy-storago element to the
~n msgrmt.lc: Lield energy and the aecand energy-storage
oloment for the electrical fiel~t AnArgy c:nrr k~~
ties~.~mvl, in particular, to be inver3ely proportional
to the clock frequency. Th~i r ply~iua~l size becomes
correspondingly omallcr for higher ,switching
frequPnr,i wR _
WO 97/01209 disa.loc~s a converter having
least onA Rwi t.c:h 1 rcg cl~sm~nt and one diode, with th~
diode being compos~d of 5i~.
Th~c invention ia~ based on the ob~wct of
specifying an e~ar,t-riral circuit d~rangemant for
tranaiormation of magnetic field on~rgy into elertrir~.~1
field ~enerqy, wh i c:lc nllrrwa higher switching
frequencies, and thus a smallQr physi~~1 aiz~, in a
cost-Ai°'fant:1 vr_ urdmrmt .
Tho object is achieved by t:frr_ ~sldotrical
ni rc:ulL arrangements specified in claims 1, 5, 7 and 9,
~tnd by the electrical c: i rc:m 1 1. diranqementa used
dc:~~rrdinQ to claimo 15 to 20.
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'1'he sreri a1 fiaatnr~! 1 n r_his ca3e its Llidl. ~lrrs
semiconductor material of the active s~miconductor
elemPnr f'1?!~i fl fl t'ilCt'~y ~djJ crL at 7.eaat 2 CV and a
breakdown field strength of gt lAaRr. ~~10~5 V/c:m. Iii
3 thin cane. the active samiconduator element can be
connectQd in parallel withn»r any furl.tm~ dciclili~rr~al
meaaureo t7incc at lo3~t one of th~ active semiconductor
elemenr.s haR ~ peall.lve Lmup~rature coefficient. The
active semiconductor element ~.s, in particular, i n r.hP
1O Lurm ut a diode. prefarably n 3chottky diode.
Uno advantage, in particular of f»rthwr ciralyr~
variants of the clcatrical circuit arrangement
according t o zhA i nvant i ~n i a l.lid L Llid
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comiconductor material of th~a ~rti ve semic:ur»luuLvr
e~.l.dm~uL ~:ontaina silicon ct3rbida, gallium nitride or
diamond.
Onc advantage of a furthQr elerrric:~7 c:ltc:uiL
arranr~~manr rrc:c:u.ce3ing to the invention is that thra
semiconductor material of the act iva rrr,rnlc:~melwtvr
~1 rmruL ~oiitaina Silicon carbide and, in particular,
has 3n energy gap of abnttt 3 ~V nru~ a breakdown field
strength of about 25*10~5 V/cm.
lU Gno advanr~gP crf a tuither electrical circuit
arrangement according to the invention is that the
samiConrinc:r.r~r~ crrdlerial of the active semiconductor
elemcrit contains gallium nitride anti, lrr ~rarticular,
has an euet~yy ~Ir~p of about 3.2 eV and 3 breakdown fiQld
strength of about 3010~5 v/c:rn.
One advantage of a further olectricai c.ir~W fi
arrangvmQnt 2oG~rriinc~ ~u the invention is that the
semiconductor material of the active :aRmi c:c~riciueavr
clement contains r9 i ~urmrtl and. in particular, hac an
erierqy gap of about 5.5 eV anti a Lteakdown field
strength c~f dLuut 104*10~5 V/cm.
The fact that the ~rnPrQy gt~p v1 the respective
RPTTrlc:mreluctor material of the active semi .rnneiuc:~ut
clement of the e7.Rrari c:dl circuit arrt~ngoments
according to the invention is high i.n r:cuu~dti~run with
silicon 2dvantay~uusly means that thra active
semiconductor clement has high r-htarrrndl stability. The
aCtiva :~r_mi~:vnductor elcrnont thus remains Cully
functional and in a stable npr~raLinr~ State evEn at high
npr.rw~ing temperatureo. Furthermore, rhP elec;l..civdl
circuit arrangr~menr, s ac:c:u~JinQ to the invention can
~1 Hc~ Le operated at high operating vo1 tHyda Jue to the
tact that 'thR rw~jrrrvtive semiconductor material of t.lm
active semiconductor elQm~ent his' a breakdown field
strenc~rh whietr is high in comparison with s~ 1 i c:cm. In
consequence, the elR~i-.r~lc:~l circuit arrangemQnt
aecorrii try lv the invention can also 2dvrrrWagevusly be
operated as a pnwar c:ltvu3.t with high reverse voltar~~g.
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.i n p~rr.i nul ar, the tclylr Lteakdown field
strength allows the semiconductor malarial xhi~knASR of
the ac'a,ivr. :~Cmic:uwluc:;tur element to be redueed. In
consequence, the dynamic anc~ rhrrnnrrl luaaea in the
a~:tive semiconductor element are advantageously
reduced. Un the one hand, chi ~ sc:t.iv~s aemicanductor
elemsnt is 3ub~cct to reduced loads, and on the other
hand the Rwi rnhi ny tLwdudric:y rrf the atditchinq element
in the electrical circuit arrangement pan hp increased.
a.ct A ti i ytret switching frequency allows, in particular, the
components, preferably the first Pnarc~y-:~t.utwy~ ~l~ntant
fur magnetic field energy and the second energy-storage
clement for alertxir~a1 fir.ld eudigy to be designed to
be conaidcrably omullcr. This is associated, firstly,
with an i r~c:rrrra~r irr l:he power capacity of the overall
electrical circuit arrangrsment. Secondly, thR phyr~ic:dl
rsixr. uL Llue electrical circuit arrangement is x~dueed.
A particularly adVantarlarn~R CdaLute of one
rrnk~udlmrsuit c~ the invention 1~ that thA active
~U semiconductor elemRnr i:~ ~ dlude or. in particular, a
Schottky diode. Sohottky diodes having a somiaonrimct.cm
material wir.h charael.et'i~Lias cvrreaponding to those
mentioned above have considerable ac9varrt_ac~ds. the
schottky clicrde du~ra not need to be dcratod, or requires
only minor derating, at lR~rit. wil.h regard to the
t.rcamrioal characteristics. Tho revers~ vo~.tag~ of the
Schottky diode is hirlh rnc~uylu for the electrical
circuit arxanqemcnto according to the invr~nt.ium to be
used Qven at high uNdiating voltaqea. On thQ other
hand. the oomiaonductor-metal y.m~r.i~n in 4lcd 9chottky
diode can hr c3d~igned to be thin doapite the capabili.r.y
to with3tand high reverse voltarlPr~, su that the dynamic
1 nrsar.5 are low even when the switchinrl al rrn~mL is
operated at high swit~hiny rtequencica. This allows the
?tS advali~ageoua charactcriotica of Schottky diudda to be
used as act iVP! ~srmiuutductor clemerito in the elQCtrira 1
~:ircuit arrangement according tn rhr: ilivention, even tit
high ~prraLiry voltegea and at high ~wiTChing
frequencioa.
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9a -
In tur~ti~=' eWuciim~suts of the invention, the
circuit arrangvm~nts according to the i nvant.i ~n rrt~r.
u~~scl in a step-up controller.
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-
otop-down controller, torw2rrcl rnnvPrl:Pr or jJUWCL'-Lnc:l.or
c:c~mLic~ller circuit.
~'urthEr arlvsnragrc~u:~ ~sritbadimenta of the
invention are speciti~d in the apprnpri at.r dC~rdtli.lEl'lt
claj.mR .
The invention will bQ Qxplalnati i rt tuc~ctr eletail
i n Llie fcrllowinc~ text with roference to exQmplary
embodimwnts which are 17.1n:atr~t.rci .lu Che figurCa, which
are described briofly below and in which, try way of
example:
FIGURE 1 ohowa an electrical circuit ~rr~nyetu~srtl
aur:rrZdinQ to the invention for
transformation of magnat.i c: tldld energy into
dlcctrical field energy,
7.5 FIGURE :~ shows an ill mt.r~t.lmr of energy gape with at
leerat 2 cV for semiconductor materi a1 s cat
the ~c:Livr~ semiconductor elcmont, with, by
way of example, a function r.c~ a umtallic
S~t~c~l.Lky ~untent.
FICURE 3 shows an illust.ratinrt ur breakdown field
strengths of apt toast 510~5 V/cm fnr
samirondunrnr materlala in the activo
semiconductor olement,
FIGUR» 4 shcwa a Rt.~p-ry u~ntrollEr circuit having an
2~ clcctrica.L circuit arrangRmrrr~ according to
rnrr Lmvr<srWiun,
FIGUR>J 5 ohowa a stop-down conrrnlldt circuit having
au electrical cix'cuit arrangQment arr:c~ri.iitlg
to the inv~entinn,
1~TGURE 6 Show' a forward-convQrter ni rauit ttavin~t an
Qlectric:~1 c:l~cuit arrangement according r.n
the invention, and
flVUFcE 7 R?~c~w~ ~t powCr faotor controller caiouit
having an sler~rric:~l circuit axrangamEnt
acc;c~tding to the invention.
By way of Qxampl~s. Figure 1 ahowc an electrical
circuit r~r~r~ngEment G according to the lm~ention for
tranoformation tN of rndyicetic f field onergy M into
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CA 02315020 2000-06-16
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GR H'/ 1~ 3943
electrical field enere~y E. The elQatrieai circuit
arrangement G is a~.y~1 i ~~i,
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CA 02315020 2000-06-16
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in particular, with the input vr~ltagR IIF and has ti 1.
lR~al. urrd rirst energy-etoraqe elemCnt L for magnotic
fiold enorgy M and a a~cnnd AnRrgy-aLutarge element C
for electriCt~l fiold energy J;. t'urthPrmora, tE~r.
e~.ectric.al ni rc:u i 1. d~~angement G has on active
semiconductor clement D and an raloetrirat ~wi tc:Trlry
AlRmpr~l. S. The electrical switching clement s may
naaumo at hart one first anti ~nA rsruutici switching
~Cate 31 or 32, reapectivCly. The first energy-storage
elwmont L, the second Rnrnyy-sLuraqe element C, the
,active semiconductor elcmont D and the clectrj.ral
switchi ng ~1 rrririW S art connected to one another in
such ti way that in th~ first switching sfi~l.r. S1 uL the
Rwitching ~leruerW 9, the magnetic field onorgy M can be
stored in the first energy-st~rnyr~ dlement L, and in
t.hr. sduund switching state 82 of the switching Qlsment
S, the magnetic fiRld rnrryy M can be transformed from
the first erierqy--OtOrago element t0 thQ .BeCOnt.1 Rnr.ryy-
storagQ Qlement r. fc~r.~ dld~:trical field enorgy 1;. The
energy flow which rosults from r.ha t.rwr~tvrmation of
magnetic fi r.1 c1 dciergy M into electrical field onergy E
is passed vii the active ~amironductvt~ dlement D. In
rhiw c:dse, the active aemiaonductor olsment D has. irr
particular, a forwa.r, d ci 9 rdc:LlGn and a rcvorae
direction, thuo allowing transform~ati~n ur cnagnetic
field energy tH i rmu rslectrical field onorgy >L in thQ
forward direction, while the Qlectr.ir~.a1 Lidld energy >r
stored i n t.lm second energy-otorage element r_. rannc~l.
react to the first energy-stnr~gr_ dlrrm~nt h owing to
thA rr.vdise direction.
In the Qxamp7.a i n Fl~ura 1. when the switching
alrrnHiiL 3 is in the first awltching star.a S1, a current
I1 fed from rhr liiput voltage UE flows through The
Lirst energy-otorage atoment L, ~r~ ~ iesult of whivh
magnQtir field ene~c~y M is built up in this elemwnt..
The input voltag~ Ul=: may hP Pi Llirrr an AC voltage or a
UC voltadP" tnllt~tn the switching element S rhangrb ~u the
3CCOnd switching ~t.a~d 32. the curr4nt I1 ins
1 nt taw u~rted.
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CA 02315020 2000-06-16
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whioh results in a currQnt 12, which j~ =pd at least
L~um thG first energy-atoraqe elcmcnt L and tlowc via
th4 active semicondu~ctc~r e1 amAnt. D, .Lm its forward
direction. The current I~ tlowc into the second enerc~y-
stor2r~P a1 amAnt. C: w?ieL~ i~ ~G3ult3 in
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CA 02315020 2000-06-16
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electrical field enPrc~y F h~ing built up, .i.it NdzLi4ular
in the form of the voltage UC.
ps h~~a ~1 rr:ac3y hddm aliown by way of example in
Figure l, the first enorgy-storage R1 Rme~.r~r L lm um
rmLucli~atllt of the invention is preferably an induativo
element, for example a coil. Iri 2 frrri-hwr rmlmdlnmtil, of
the invention, thQ ocaond onorgy-storage element ~: is
pr~ferably ~ rap~ni i-. i vr. ~lmu~nt, for example a
oapacitor. In a further embodiment of thR invPnrlnn,
~.n th~~ r-le~c:t_ti~:al switching element B is prcforably a
acmiconduator switching element, for Ax~mFrlr ~ .Cldld-
~tfect transistor. In a further embodiment of the
inv~ntion, at least onr~ fmrtair_r, iri particular
identical, active semiconductor element D' is connected
in paral 1 a1 wi i.fi t.lm dc:t_ive aemiconductox element D.
Farallcl aonnoction is advantageously possible wirhrnH:
any Lutt.hez additional measures, oinco the aativra
s~omiconduator .lenient T, or D' , whi ~f~ is Vd~c~ribad
fu~wlm~ in the followirzq text, hao a positive
;tU temperature ca~ffi~iant,. Tn paL~Liaular, this element i3
in the form of a diode, pretexably a Schottky dj aria.
'fhe i nvRrtt 1 nn will be deSt;t lLed in more detail in the
following text with reference to rhea c:c~nyur~enta
mentinnad ray way ~t example here.
As is show7"~ by w2~y nf. axHrnpl~r in Fiqurea 2 and
J, t_lirs aemicvnduator material of the act ivP
semiconductor element D 2ornr~ii rty Lu the invention hat3
an energy gap VB of at least :2 ev, in ela~rrnn v~lt.a,
and a bre2kct~wn fl~slcl at~:ength CK of at laast
JO 5''10~5 V/cm, in volts par r..AntimPtre. Tlid "10~5"
nataric~n lir this cane correopondo to the notation
"lE+5".
In figure 2, by way of ~xample, the Pnr.tyy gap
VB of thQ semir~ncW o:t_r.~t materiel of the active
33 ;~dmiconductor element D is shown in gymtrc~liu form.
according tn I.hr_ invention. to be at least 2 eV_ The
energy gap V8 is in this case 1-hr. e~mrgy difference
bP~WRPr1 Llm energy level of the valwncy band ~:v ant! The
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CA 02315020 2000-06-16
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_ 7~ _
onorgy level of the conduCtinn h~n~1 >rC. The euet~y
ldv~sl of the E'ermi level i~ ~l~o ohown, for assistance.
The illustration is Fir~urR ~ i :~, try
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CA 02315020 2000-06-16
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_ g
way of example, rclatod to 3 ~Bemiconductor junction rn
a m4taliia snhnttky c:wW dc:L in the direction of tho
ordinate . In Figure '.~' , by way o= caxample, r. hA hrrr~ kt3uwri
tl~ld strength EK of the oemiconductor matwrial of the
3etivc semiconductor elemRnt f) 1~ shown in symbolic
form, according to the invontion, to be at least
5*10~5 V/em. Ry way crt e~xdritple. the abscissa of the
illustration in Figure ;i shows valu~as of dnri nc~ i rr
1/cm~.'~ crt elm semiconductor material of the active
semiconductor wloment u. Th~ numerirwl deLdils fcr this
dnFri ny rdptesent only levels chosen by way of ~xample.
In various Pmt7c~ci i mews of the electrical
circuit arrangement C according to the invention, thr.
somieondurtnr material vI ll'm active semiconductor
element D contains, in particular, sill c-.nn c:Ht~t~icA~ 31C,
gallium ni Lc~ld~s Ga~N v~- diamond C diamond, that is to
nay carbon with a r91 amnnci caystalline network
~rl~.Lwc:~utt, with the semiconductor matorial having ~n
onorgy gap vJi of at least ~ rv died a breakdown field
r~trangth CK of at least 5*lU~b v/cm.
In ,furthAr cirslyic variants of the invontion,
the semiconductor material of thR antive semic~rlciu~tor
elemenr n c:c~cWaims, i.n particular, silicon carbide Sic,
gallium nitride GaN or diamond r di arnc~:rd.
If the 'emiconduotar matorial of the ant.lve
semiconductor elemPnr. ~ lc~ vne embodiment of the
el~svtriaal circuit arrangemQnt V aecarnii ng ~u the
invantinn nr in eerie design variant of thra invanti~n
contains oilicon carbide Si.C:, then, i n Narticuler, thin
has ~n diiwigy gap VD of about 3 oV and a hra~kdown
field rstrength ~;lc of abour. 75"10~~ V/cm, as i3 shown by
way of r_xdut~-rle in 1:'igures 2 and 3.
It the semi c:cm~iu4tor material of thw active
arsmivonductor elomont D in on! Amhndim~snt of the
electrical c~.ir.cuit a~tangement G according to the
invention or in one dQSign varLarrl of the invention
contains c~~r1 lluirc nitride GaN, then, in particul err, ~lris
has err enorgy gap vt~ of dh~out 3.2 eV and a breakdown
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CA 02315020 2000-06-16
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GR 97 P X943
..
field otrcngth EK o~ about 3U"~lU~5 V/cm, aR 1~ shown by
way ~f ax~tn~ld in Figturea 2 and 3.
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CA 02315020 2000-06-16
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If thQ a~miconductor m2stPrial of the t~c:~lv~s
r~rmic:umclu~tcrr element D in one ombodim~nt of the
electrical circuit arrangPmant: G dur:ordi.nQ to the
invention or in ono design variant of the 1 nvRnt: ! cm
b contains dismnnci C: cildmurml. then. in pnrtieular, thin
has an energy gap VB of about 5.5 av and a hrr.~kciuwss
fir.l.d 'Lteng'th EK of about 100*10~5 V/cm, as is
likewiaQ shown by way or eXamFslR im Flyutea 2 and 3.
Dy way of example, Figures o tn ~ shnw
J. t) advarstageous ri rrni t. dttr~rir~cmenta in which the
invention is used.
Fl,yurc~ 4 shows, by way of example, a stop-up
controller circuit H having an Rt~nt.t~lual oirouit
arrangecuess~ f3 accoa:dinq to the invention, to which, in
15 particular, an input v~trag~ tlE1 is supplied and which
lsr~a an output voltaqc U111. Th4 stop-up cantrnlt ar
circuit H has, fc~r~ exdm~la, a coil L11, a field-effect
tranai9tar S11, a semiconductor di~cia nl.l, in
particular a Sc:hc~L~kyliode. arid a capacitor C11. Tha
20 ooil L11 iri connected in series wi t.ts ~lsc input voltage
tTFl. Tlue~ field-effect tranoiotor S11 and she capacitn.r.
C11 arQ arrangRd cinwnstream tt~uu~ the coil L11, in
paiallel with the input voltag~ U~:l . The sAmi c-.ariduc:Lui
diode U11 is arranr~rci iss Llw forward direction betweQn
25 the field-effect txansoistor s11 and t.tl~ c:dpa~citor C11,
ind 1 n ar~~t~s~ with the coil L11. According to the
invention, thw semiconductor dinrie~ D11 la composed of a
:~e_mic':unductor material t~ccording to Lhe invent i.nn . Wtmu
the bald-~tfQCt tranai at.c~r S11 is switched on and oft,
30 magnetic field energy is transformed rr~m the cell L11
into thQ cara~ir.nr C11 rsa electrical field energy.
Ciqurc 5 ehow~c, by way of Pxampl~s. a step-down
rr~nrrnl ldt oircuit T having an oloctrical ri rc:w i ~
arrangement G according r.n thr invention, in which, in
't!5 partic;ulai. an input voltage t)E:~ is supplied anti wlsic.,h
has an output vnt rac3r. t)A2 . The step-down controller
c:itr:uit T has. for example, a coil L21, a Ii~sld-effect
transistor S?.t, H ~maiconductor
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CA 02315020 2000-06-16
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CR 97 P 3943
- 10 -
diode D21, in particular a Schottky diode, and ~
L:dj.7dG:l~uL C21. The field-effect tranai3tor S21 i~
connected in series with the inner v~1 t:egtr I7E2 . Tlr~s
semiconductor diodes D21 and the capacitor C21 arQ
arranr~Pd i n the rrvr.,r.~a~ di~d~:Liori downstream from the
field-effect translator Sll, in parallel with the input
VUlLdy~ UE2. Tho coil L21 is arranged between tha
semiconductor diode U21 and the oarari,r, ~r C:~1 , ~nc3 lu
series with the field-cffcat translator S21. According
to the inventlnn, 1-hR :,rmlc:umclu~Lor diode D21 is
composed of a 3emivonductor material according to the
invanfii~n. Wlm~ ~i~rs field-effcct transistor X11 is
owitahed on and ott, magnetic field energy i~
transfarmad rruui l.he flail L21 into the capacitor C21 as
l~ electrical field energy.
figure 6 shows, by way of example, a tarward-
eonvertAr c:i rc:~~t I. Dtn1 lidvirig an electrical circuit
arrangement C according to the invention, to which, in
particul ar, xn icrpuL vull.age UE3 is supplied and which
has an output voltage 17A3. In this c:axr., r~ ~tlmdiy
c:irc:uiL DWl and/or n~ secondary circuit DW:? of the
forward-converter of rr»i r. fivll have/has l.lie alectiical
circuit arrangement C according to the invention. The
primary circuit >7m1 and t.?~r. 5dc;uldary circuit DW2 are
c5 preferably docoupled from one another by mR~nx m L a
transformwr T3. Tkm primary circuit DW1 hac, for
example, a first capacitor C31, a lEirRt r:c~ll L31. a
Llt~L aemicvnductor diode D31, in particular a ~chottky
diode, and a first fielri-Pff~c:t. ~Lamistor 331. As a
rule. the fir3t soil L31 is a winding elemAnr ~t the
primary coil wi nc91 ry, in particular a ao-called
demagnetizntion winding, of the transformer T?l. Tlres
secnn~iary c:lLUUit DW2 has, for example, a second
semiconductor diode U32, in part.i c:uldt ex 9chottky
~5 diode, a Ll~ird Semiconductor diode D33, a second coil
L3~ and a second sansei tar C:32 . When the field -effect
t.L'dtl'Sl9tOr S31 is switched on and off, magnotia fi p1 c3
energy is transfnrmrd rtwn the first coil L31 into the
fi~:at capacitor C31 as electrical field PnPrc~y.
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CA 02315020 2000-06-16
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The capacitor C31, tho first rvi 1 T~31 which is
c:r~rurdc:t_wcl in the reverse direction and in aeries with
the first semiconductor dio~la O~1 , drml Llle first
field effect tranaiotor Sal which is connected in
series wi th t.hr_ ptiuraiy of the tran3former T3 arc
arranged in tho primary circuit uWl, in raraltr~l wil-,h
the lripuL voltage UE3. When the field-effect transistor
S31 is awitchod on and oft, mac~nPr. i r-.. f i rlc3 dm~~y is
transformed from the firot coil L31 into the first
lU capacitor C31 as elRrr.ri~~rl flrld eiZergy.
The third semiconductor diod~ u33 is connected
in rhA :sr:c:cmcidiy ~:ircu~.t DW2, in eerico with the
secondary of the transformer T3 and in tt~r. Lutwxr~l
directive. T!m second semiconductor diodo D32 and th~
second capacitor C32 are arrsnyr_d, in the reverse
dizectivn, downstream from tho third semiconductor
di.oda~ L~33, i n par~lldl with the secondary of the
transformer T3. The second coil L32 is arrangari t;~r~l.wddm
thQ seronci ~tarnlr.:umiuvtur diode D32 and tho second
eApacitor Cj:t and in serj.a~ w i. t.ti the third
sE?rmi c:nrrduc:Lur diode D33. When the bald-effQCt
transistor S~1 is awir. r..hpci ~n and vrt, rnagnetic field
tstWlS~y is tran3formed from the second coil L32 inr.n fi,hr:
second capacitor f.::~9 a:~ c~lCC:Ltival field energy.
Tho first sQmiconductor diodes 1731 d1~1C1IVl the
sQCOnd ~Pmi r:urrciuc:tvr diode D32, but preferably both,
are, according to the invent i, Win, c:mn~rvsed of a
sami~:rmdu~Lvr material according to the invQntion- Thr.
third semiconductor diode ~~:1 mdy likewise be eompoaod
ur a semiconductor matorial according to rhR inventivr~.
le'igure 7 shc~w:~, Ly way of examples, a power
Lxcaor circuit fFC of an elraetrlcal cirr» i t. d~iangement
accord~.nrl t.c~ ~tr~s invention, to which, in particular,
an input voltage U1;4 is suprl i rd acid which hao an
;i5 ourn»r. voltage UA4 . The power-fsetor circuit P~'r i s
also roferrcd to, in parric:ulat, as a so c~;llod "powQr
far..rnr s;urrtrvller" circuit. In this casA, ~n d~cCcrnal
c3aeade circuit Pfr ~nci/uL an internal caaoadv circuit
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CA 02315020 2000-06-16
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fI of the pow~r-factox circuit PFC has thA A1 art-.ri aal
ri r~mi t-.
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CA 02315020 2000-06-16
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GR 97 P 3943
- 12 -
arrangemQnt G accordinr~ to r, h~ i nvPnr.1 on. The exteftictl
cascade circuit rA has, for examplo, a first coil L41,
a first fielel-effar~t fi.ranyi al_Ut' S41 and a first
ocmiconductor di.od~ U41, in particular 2 Sr~hnrr.ky
!5 di c~cW . Tltw internal cascade circuit fI hao, for
example, a st~rcond coil L42, a seGnnr'1 aRmi c:nrvcW c:t_c.~t
diode D42, in particular to Schottky diode, and a third
semicondttCtor d~.ndR n4~. TT1H E:xl_dtttfll Ga3CadC circuit
fA and tho internal aascado circuit PI have a cnmmnn
rapac:i t.ctr C41. W1'iert the first and second field-effect
tranaiotors S91 and 59:G, respectively, are swi tc:h~ci c~ri
and off. magnetic field energy from the first soil L41
and magnetic field enerr~y from rhe~. Hrc:c~tttl u~il L92 era
tralzsformed into the capacitor C41 ao electrical field
13 ~on~rgy.
In the oxtornal cascade circuit F~~, the Lixsr.
c-r~t 1. L41 is ~:unnectad in aeries with the input voltage
UE4. Thw first field-affect transi star S41 dw1 the
C.djJdl:1'tUR C41 are arranged down3trctam from the first
au coil L41, in pare 1 1 a1 wi t:h t.lm iryut voltage UC4 . The
first semiconductor diode D41 is arrang~d, in the
foxwarA di rection. bel.we~stt the first field effect
tran3iator S91 and the capacitor C41, anti in seti~~
with rhr. flt~~t_ coil L41. When tho firot fiold-effect
25 transistor S41 i.s switched nn and ctLL, mat~natic field
dr~digy is transformed from the first coil L41 into the
capacitor c:41 as electriaa.l fi A1 c9 ermt~y.
In the intornal casead4 Circuit PI, the !~~~c:arid
coil L42 i.s c:nnnrc:l_eci t_~ thG common node bctwoon the
30 first coil L41, th~ first field-AffP~r transist~t~ S41
~tnd t_lm first semiconductor diodo D41. Tha second
fiold-ettQCt transistor s42, which is connected in
aerios with the third oamiconduator diodo D43 (which is
connected in the f~rwarc9 cilt~~tivnl , and the capacitor
3~ C47, arc arranged downatroam from the second aoll T,4~,
in parall a1 w i t.Tr Llt~ first field-effect transistor 541.
The second semiconductor diode G42 is arrangrd lm the
forward ditdraion between the second field-affoct
~Z:91I9S tie lSa3H19~:hlti 90bT~Z '~~Z6 6bt SIV3W3IS Si"i °YJ 1Z:I~lOn
Of3 ~:LO IVflf-SZ

CA 02315020 2000-06-16
BZG esed ~e~p ! ~~e~S-of B~YlE1 IEIE EYt-~o~d eel0:Z0 00-9l-un~ penloeea
~R 97 P 3943
- 12a -
trai'sictor S42 and tho capacitor C41, and in series
with the second coil L42.
~~:S1I9S C~ 1S~1J.3~:hIG 90bT~Z L~t6 6b+ SI~3WSIS 3i"i J9 lZ:IyOi"i 00 S0:Z0
hair-SZ

CA 02315020 2000-06-16
fE0 ~»d m~19 ! im~S-of 80~t61 t6t6 Ef+-gad ~l0=Z0 00-9l-unr p~nl~aoa
GR ~'! P .i ~ 4 ,i
13
Tilts rlt 'S (,. ~dmluuJl3uc:l.ut tiiu~,id D$1 dll'ld/vx the
sQCOnd sQmiconductor diodes u4~ arQ/is, according to thQ
invention, composed of a semiconductor matorial
Flt)C:Ur'C.~illt~ ~.U Ltll~ ilJVt'_111.1C)11. TIC LtJit'C.~
'.it'JlLI.tC:Vl1(~UC.:LUt
diode D43 may likewise be composed o~ a semiconductor
111dLCt1d1 dtrC:Utllllll~ LU (_tltl 1JJVL-'IlL1U11.
b~~31I3S ties 1S~13H13~:I~ti 90bt~Z Z~Z6 6bt SI~3W3IS 31"1 J°~ 1Z:N01"1
Od S0:L0 I~tlf-S'

Representative Drawing
A single figure which represents the drawing illustrating the invention.
Administrative Status

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Event History

Description Date
Inactive: IPC from MCD 2006-03-12
Application Not Reinstated by Deadline 2003-12-08
Time Limit for Reversal Expired 2003-12-08
Deemed Abandoned - Failure to Respond to Maintenance Fee Notice 2002-12-09
Inactive: Cover page published 2000-09-13
Inactive: First IPC assigned 2000-09-10
Letter Sent 2000-08-29
Inactive: Notice - National entry - No RFE 2000-08-29
Application Received - PCT 2000-08-25
Application Published (Open to Public Inspection) 1999-07-01

Abandonment History

Abandonment Date Reason Reinstatement Date
2002-12-09

Maintenance Fee

The last payment was received on 2001-11-22

Note : If the full payment has not been received on or before the date indicated, a further fee may be required which may be one of the following

  • the reinstatement fee;
  • the late payment fee; or
  • additional fee to reverse deemed expiry.

Patent fees are adjusted on the 1st of January every year. The amounts above are the current amounts if received by December 31 of the current year.
Please refer to the CIPO Patent Fees web page to see all current fee amounts.

Fee History

Fee Type Anniversary Year Due Date Paid Date
Basic national fee - standard 2000-06-16
Registration of a document 2000-07-14
MF (application, 2nd anniv.) - standard 02 2000-12-08 2000-11-16
MF (application, 3rd anniv.) - standard 03 2001-12-10 2001-11-22
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
SICED ELECTRONICS DEVELOPMENT GMBH & CO. KG
Past Owners on Record
DIETER MUNZ
DIETRICH STEPHANI
HEINZ MITLEHNER
RICHARD SCHMIDT
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Representative drawing 2000-09-12 1 4
Description 2000-06-15 22 734
Claims 2000-06-15 6 233
Abstract 2000-06-15 1 69
Drawings 2000-06-15 5 70
Cover Page 2000-09-12 2 74
Reminder of maintenance fee due 2000-08-27 1 110
Notice of National Entry 2000-08-28 1 193
Courtesy - Certificate of registration (related document(s)) 2000-08-28 1 120
Courtesy - Abandonment Letter (Maintenance Fee) 2003-01-05 1 176
Reminder - Request for Examination 2003-08-10 1 112
PCT 2000-06-15 13 482