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Patent 2462295 Summary

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(12) Patent: (11) CA 2462295
(54) English Title: ELEMENTAL SILICON NANOPARTICLE PLATING AND METHOD FOR THE SAME
(54) French Title: REVETEMENT PAR NANOPARTICULES DE SILICIUM ELEMENTAIRE ET PROCEDE ASSOCIE
Status: Deemed expired
Bibliographic Data
(51) International Patent Classification (IPC):
  • C25D 15/00 (2006.01)
  • C09D 5/44 (2006.01)
  • C25D 5/02 (2006.01)
  • C25D 5/10 (2006.01)
  • C25D 7/12 (2006.01)
  • C25D 9/00 (2006.01)
  • C25D 11/00 (2006.01)
  • C25D 11/32 (2006.01)
  • C25D 13/00 (2006.01)
  • C25D 13/02 (2006.01)
  • C25D 15/02 (2006.01)
  • H01L 21/288 (2006.01)
  • H01L 21/445 (2006.01)
(72) Inventors :
  • NAYFEH, MUNIR H. (United States of America)
  • BELOMOIN, GENNADIY (United States of America)
  • SMITH, ADAM (United States of America)
  • NAYFEH, TASIR (United States of America)
(73) Owners :
  • THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS (United States of America)
(71) Applicants :
  • THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS (United States of America)
(74) Agent: PERLEY-ROBERTSON, HILL & MCDOUGALL LLP
(74) Associate agent:
(45) Issued: 2007-08-28
(86) PCT Filing Date: 2002-09-30
(87) Open to Public Inspection: 2003-05-30
Examination requested: 2004-03-29
Availability of licence: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): Yes
(86) PCT Filing Number: PCT/US2002/030851
(87) International Publication Number: WO2003/044247
(85) National Entry: 2004-03-29

(30) Application Priority Data:
Application No. Country/Territory Date
10/002,865 United States of America 2001-11-15

Abstracts

English Abstract




According to the invention, silicon nanoparticles are applied to a substrate
using an electrochemical plating process, analogousto metal plating. An
electrolysis tank of an aqueous or non-aqueous solution, such as alcohol,
ether, or other solvents in which the particles are dissolved operates at a
current flow between the electrodes. In applying silicon nanoparticles to a
silicon, metal, or non-conducting substrate, a selective area plating may be
accomplished by defining areas of different conductivity on the substrate.
Silicon nanoparticle composite platings and stacked alternating material
platings are also possible. The addition of metal ions into the silicon
nanoparticle solution produces a composite material plating. Either composite
silicon nanoparticle platings or pure silicon nanoparticle platings may be
stacked with each other or with convention metal platings.


French Abstract

L'invention concerne un procédé consistant à appliquer des nanoparticules de silicium sur un substrat au moyen de procédés de revêtement électrochimique, analogues au revêtement métallique. Une cuve à électrolyse contenant une solution aqueuse ou non aqueuse, telle que de l'alcool, l'éther, ou d'autre solvants dans lesquelles les particules sont dissoutes, fonctionne à un écoulement de courant donné appliqué entre les électrodes. L'application de nanoparticules de silicium sur un substrat de silicium, métallique ou non conducteur, permet de réaliser un revêtement à zones sélectives, et ce par la définition, sur le substrat, de zones de différentes conductivités. Il est également possible de faire appel aux revêtements par composites de nanoparticules de silicium et aux revêtements par alternance de matériaux superposés. L'addition d'ions métalliques à la solution de nanoparticules de silicium produit un revêtement par matériau composite. Les revêtements par nanoparticules de silicium composites ou les revêtements par nanoparticules de silicium pures peuvent être superposés les uns sur les autres ou avec des revêtements métalliques classiques.

Claims

Note: Claims are shown in the official language in which they were submitted.





7

CLAIMS:

1. A method for plating silicon nanoparticles onto a substrate, the
method comprising steps of:
providing an electrolytic cell including a solution including silicon
nanoparticles and at least a portion of said substrate, and applying power to
the
electrolytic cell with the substrate as an electrode of the electrolytic cell
to permit
plating of silicon nanoparticles onto the substrate.

2. The method according to claim 1, wherein the substrate is metal.

3. The method according to claim 2, wherein the substrate is
stainless steel.

4. The method according to claim 1, wherein the substrate is a
silicon wafer.

5. The method according to claim 1, further comprising a
preliminary step of patterning the substrate with material to define areas of
different conductivity on the substrate.

6. The method according to claim 5, wherein the substrate
comprises a silicon wafer and the material to define areas comprises a thermal
oxide.

7. The method according to claim 1, wherein the substrate is
gradually advanced into the electrolytic cell during said step of applying
power.

8. The method according to claim 1, further comprising a steps of:
conducting an additional material plating after said step of applying
power, the additional material plating comprising an electrolytic plating of
the
additional material.

9. The method according to claim 8, wherein the additional material
is aluminum.

10. A method for plating a silicon nanoparticle composite onto a
substrate, the method comprising steps of:




8

providing an electrolytic cell including a solution of silicon
nanoparticles, metal ions and at least a portion of the substrate, applying
power to
the electrolytic cell with the substrate as an electrode of the electrolytic
cell for a
time to permit plating of silicon nanoparticles onto the substrate.

11. The method according to claim 10, wherein the substrate is
metal.

12. The method according to claim 11, wherein the substrate is
stainless steel.

13. The method according to claim 10, wherein the substrate is a
silicon wafer.

14. The method according to claim 10, further comprising a
preliminary step of patterning the substrate with material to define areas of
different conductivity on the substrate.

15. The method according to claim 14, wherein the substrate
comprises a silicon wafer and the material to define areas comprises a thermal
oxide.

16. The method according to claim 10, wherein the substrate is
gradually advanced into the electrolytic cell during said step of applying
power.

17. The method according to claim 10, further comprising a step of:
conducting an additional material plating after said step of applying
power, the second plating comprising an electrolytic plating of the additional
material.


Description

Note: Descriptions are shown in the official language in which they were submitted.



CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
1
ELEMENTAL SILICON NANOPARTICLE PLATING
AND METHOD FOR THE SAME
TECHNICAL FIELD
A field of the invention is electrochemical plating processes.
Another field of the invention is semiconductors.
BACKGROUND ART
Silicon nanoparticles are an area of intense study. When certain size
thresholds are reached, elemental silicon nanoparticles demonstrate properties
unlike the properties of bulk or atomic silicon. For example, silicon
nanoparticles
of ~ 1 nm diameter have shown stimulated emissions. Unlike bulk Si, an
optically
inert indirect gap material, ~ 1 nm diameter particles are extremely active
optically, exceeding the activity of fluorescein or coumarine, such that
single
particles are readily detected and imaged, using two-photon near-infrared
femto
second excitation. See, e.g:, Akcakir et al, Appl. Phys. Lett. 76, p. 1857
(2000);
Nayfeh et al., Appl. Phys. Lett. 75, p. 4112 (1999). Silicon nanoparticles
have
been synthesized with H- or O- termination, or functionalized with N- , or C-
linkages.
DISCLOSURE OF THE INVENTION
The present invention is directed to silicon nanoparticle plating. The
plating of a uniform layer of silicon nanoparticles on various substrates,
including
metals and silicon, is provided by the invention. The plating method of the


CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
2
invention allows the physical incorporation of silicon nanoparticles onto
important
substrates.
According to the invention, silicon nanoparticles are applied to a
substrate using an electrochemical plating processes, analogous to metal
plating.
An electrolysis tank of an aqueous or non-aqueous solution, such as alcohol,
ether,
or other solvents in which a colloid of particles are dissolved operates at a
current
flow between the electrodes when power is applied thereto. In applying silicon
nanoparticles to silicon substrates, a selective area plating may be
accomplished
by defining areas of different conductivity on the silicon substrate.
Silicon nanoparticle composite platings and stacked alternating
material platings are also possible. The addition of metal ions into the
silicon
nanoparticle solution produces a composite material plating. Either composite
silicon nanoparticle platings or pure silicon nanoparticle platings may be
stacked
with each other or with conventional metal platings.
BEST MODE OF CARRYING OUT THE INVENTION
The invention is a plating method for plating silicon nanoparticles
from a solution to a substrate of metal or silicon. Silicon nanoparticles are
plated
in an electrolytic cell to the substrate, which is the anode of the cell when
plating
silicon nanoparticles and may be the cathode for composite deposits including
silicon nanoparticles. The electrolytic cell for plating with the silicon
nanoparticles is otherwise the same configuration as conventional tanks used
in
metal plating. For biasing in the range of 100 to 500 Volts, the tank usually
supports a current flow of ~ 100 to 300 micro ampere respectively, with
electrodes
separated by ~ 1 cm. An increase in the water trace in the solution increases
the
current flow. A decrease in the electrode spacing increases the current flow.
A silicon nanoparticle source in the electrolytic cell is a colloid of
the particles. In experiments conducted, the electrolytic tank in which 1 nm
blue
luminescent particles are dissolved was observed under ultraviolet
illumination at


CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
3
365 nm from an incoherent ultraviolet lamp. The solution exhibits strong blue
luminescence visible to the naked eye and attributable to the dispersed
silicon
nanoparticles.
A stainless steel plate was plated by the above-described steps. The
plated stainless steel plate was examined under ultraviolet illumination at
365 nm.
The stainless steel plate exhibited the characteristic luminescence that was
observed in the solution. This indicated a successful plating of the
luminescence
particles on the stainless steel plate. Successful plating of silicon
substrates was
also experimentally demonstrated on other substrates. The substrates can be p
type or n-type. Using the method of the invention, a p-type silicon wafer has
been
plated by simply replacing the conducting substrate with a silicon substrate.
In the electroplating of silicon nanoparticles from the solution to the
silicon wafer, we find additional particles ~ deposit as a narrow line along
the
solution-air interface (the meniscus). This is due to the fact that the
conductivity of
the substrate is lower than the conductivity of the liquid, resulting in a
higher
concentration of the current at the meniscus, such that it penetrates the
least
distance into the semiconductor. This may be addressed by gradually advancing
the substrate to be plated into the solution thereby sweeping the meniscus
uniformly over a large area of the anode electrode.
A selective area plating may be achieved by defining different areas
of conductivity on the substrate to be plated. An oxide pattern establishes a
basis
for conductivity patterns on a silicon wafer. The thickness of the oxide may
range
from a few nanometers to hundreds of nanometers. In an experimental plating
according to the invention, a thermal oxide layer of 300 nm was grown on a p-
type
100 Si substrate. Patterns in the oxide were etched away to provide current
paths.
The substrate was then plated. Silicon nanoparticles selectively deposited in
the
pattern area. A variety of patterns on silicon wafers were deposited in this
manner.
We examined platings deposited according to the method of the
invention by Fourier transform infrared (FTIR) spectroscopy. Control samples


CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
4
were first prepared by precipitating particles on a silicon substrate by
simple
.evaporation. The FTIR of this type of sample presented is dominated by
hydrogen
and only 10 percent Si-O stretching at 1050 cni 1. Vibrations at 520-750 cni 1
are
observed due to Si-H~ scissors or Si-H3 symmetric or anti-symmetric
deformation,
. and another at 880-900 cni 1 is due to Si-H wagging. Observed vibrations at
2070 -
2090 cm-1 are characteristic of stretching monohydrides and coupled
(reconstructed) H-Si-Si-H (H attached to Si atoms with Si-Si bonding
arrangements different than for bulk Si). In contrast, the FTIR of plated
silicon
.wafer samples shows that hydrogen has been removed and replaced by a strong
Si-
O stretch at ~ 1050 cni 1. There are no peaks at 2869, 2881, 2931, and 2966
cni 1
characteristics of C-H stretch vibrations in CH3 or CHI groups. An observed
vibration at ~ 2300 pertains to CO~, air and oxygen. The absence of OH
vibrations
v at 3400 cm 1 indicates the absence of physioabsorbed (free) alcohol on the
silicon
nanoparticle plated film. X ray Photo Spectroscopy (XPS) studies confirm the
FTIR.
The method of the invention was also verified on several other
metallic objects. An alligator clip was plated with silicon nanoparticles. A
spoon
was also plated, further demonstrating the versatility of the method. Unlike
metal
plating, silicon nanoparticle plating is self limited. The plating current
decreases
over time. After 30 minutes of plating, for example, the current is one-half
its
original value. If plating continues for an extended period of time,
additional
material deposits but it does not stick. Upon removal from the tank, the top
layer
of the coating comes off, sinking as a cloud. The self limiting property of
the
plating process may be countered by adding to the particle solution some
conducting ions. Such mixing produces composite plating layers, though,
opposed
to a pure silicon nanoparticle plating.
Plating has also been achieved by simply replacing the 1 nm
particles with other silicon nanoparticles of larger size. We demonstrated the
process with red particles of 2.9nm diameter. An alcohol solution of 2.9nm


CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
particles was used. For those larger particles, the rate of deposition
increases by an
order of magnitude compared to plating with the 1 nm particles. The higher
plating
rate may be due to the larger surface area of the red particles.
The invention also includes embodiments for the deposit of silicon
5 nanoparticle composite films. As mentioned above, the addition of ions to
the
silicon nanopariticle alcohol colloid produces composite thin film plating.
Examples include aluminum or other conducting metals or their oxides as a
composite with the luminescent Si nanoparticles. For a composite aluminum and
silicon nanoparticle plating, for example, a tank of an alcohol solution in
which
the particles and aluminum chloride salt are dissolved operates at a current
flow
between the electrodes. As in metal plating, Al-Si particle plating occurs at
the
cathode. Thin film composites on metal, silicon substrates, foils, or
conducting
polymer.~films have been demonstrated. For: biasing in the range of 10 to 50
Volts, the tank usually supports a current flow of ~ 1 to 10 milli ampere
respectively.
Auger material analysis confirms that the film is a uniform
composite of silicon nanoparticles and aluminum oxide, and optical
spectroscopy
shows that the film is highly luminescent. The process proceeds in terms of
the
formation. of complex A1 ions with the silicon particles tagging along as
ligands.
The procedure can be extended to other metals. The thickness of the film is
controlled by controlling the period ~ of the deposition, concentration of the
material, and the current and voltage used. This would allow us to deposit
ultrathin
films. The percentage composition is controlled by varying the percentage
concentration of the material in the solution. The oxidation of aluminum is a
result
of the presence of traces of water in the solution. Other metals, such as
nickel, do
not oxidize when plated. Aluminum oxide is a very useful matrix for the
particles. It is a high hardness, high temperature material. A form of A1203
(corundum) is nearly as hard as diamond. Impurities in aluminum oxide have
been
known to give gems with beautiful colors. Ruby color is caused by Cr3+ ions.
To


CA 02462295 2004-03-29
WO 03/044247 PCT/US02/30851
6
avoid oxidation of Al, we use anhydrous aluminum cholaride dissolved in ether
with LiAlH4 and the plating process is accomplished in an inert atmosphere,
such
as a nitrogen or an argon atmosphere.
Alternate built-up platings may also be formed by depositing stacks
of alternating thin films of aluminum or other conducting metal compounds and
luminescent Si nanoparticle. In this case, a tank of an alcohol solution in
which
only particles are dissolved operates at a current flow between the
electrodes.
After formation of the required film of particles, the film is immersed into a
tank
in which only aluminum chloride salt is dissolved. The reversed polarity is
used
to drive aluminum onto the particles. Once the required thickness is achived,
the
film is then immersed into the particle plating tank, and so on. The
previously
discussed techniques for patterned plating deposits are also applicable here.
Thus,
composite and stacked platings offer potential for use flexible particle-based
displays.: These results have implications to flexible particle-based
displays.
While a specific embodiment of the present invention has been
shown and described, it should be understood that other modifications,
substitutions and alternatives are apparent to one of ordinary skill in the
art. Such
modifications, substitutions and alternatives can be made without departing
from
the a spirit and scope of the invention, which should be determined from the
appended claims.
Various features of the invention are set forth in the appended
claims.

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Administrative Status

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Administrative Status

Title Date
Forecasted Issue Date 2007-08-28
(86) PCT Filing Date 2002-09-30
(87) PCT Publication Date 2003-05-30
(85) National Entry 2004-03-29
Examination Requested 2004-03-29
(45) Issued 2007-08-28
Deemed Expired 2009-09-30

Abandonment History

There is no abandonment history.

Payment History

Fee Type Anniversary Year Due Date Amount Paid Paid Date
Request for Examination $800.00 2004-03-29
Registration of a document - section 124 $100.00 2004-03-29
Registration of a document - section 124 $100.00 2004-03-29
Application Fee $400.00 2004-03-29
Maintenance Fee - Application - New Act 2 2004-09-30 $100.00 2004-09-02
Maintenance Fee - Application - New Act 3 2005-09-30 $100.00 2005-09-01
Maintenance Fee - Application - New Act 4 2006-10-02 $100.00 2006-09-07
Final Fee $300.00 2007-06-12
Maintenance Fee - Patent - New Act 5 2007-10-01 $200.00 2007-08-31
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Past Owners on Record
BELOMOIN, GENNADIY
NAYFEH, MUNIR H.
NAYFEH, TASIR
SMITH, ADAM
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Abstract 2004-03-29 1 59
Claims 2004-03-29 2 73
Description 2004-03-29 6 303
Cover Page 2004-06-03 1 40
Cover Page 2007-08-03 2 46
Fees 2006-09-07 1 27
PCT 2004-03-29 5 243
Assignment 2004-03-29 15 606
Prosecution-Amendment 2004-08-17 3 84
Fees 2004-09-02 1 27
Fees 2005-09-01 1 26
Correspondence 2007-06-12 1 26