Note: Descriptions are shown in the official language in which they were submitted.
SYSTEM AND METHOD TO PREDICT A USABLE LIFE OF A VACUUM
INTERRUPTER IN THE FIELD
[0001] This application is a national phase of PCT Application Serial
No.
PCT/US2016/037699, filed on June 15, 2016, published as WO 216/205420 on
December 22, 2016.
FIELD
[0002] The present embodiments generally relate to a method to
predict a useful
life expectancy of vacuum interrupters while the vacuum interrupters are
installed in the field.
BACKGROUND
[0003] A need exists for a fast and reliable method to test vacuum
interrupters of
circuit breakers to determine the usable life expectancy thereof without
having to remove the
vacuum interrupters from their installed positions in the field.
[0004] A need exits for a method to determine the usable life
expectancy of vacuum
interrupters in the field that can reduce the occurrence of electrical
failures, death, and
destruction in the field.
[0005] A need exists for a method to test vacuum interrupters that
can avoid the
introduction of X-rays into work environments; thereby providing safe and
healthy work
environments.
[0006] The present embodiments meet these needs.
SUMMARY
[0006a] Accordingly then, in one aspect, there is provided a method
for
predicting a usable life of a vacuum interrupter, the method comprising:
placing a flexible
magnetic field coil around an installed vacuum interrupter; causing a DC
potential to be applied
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across one or more open contacts of the installed vacuum interrupter;
generating a magnetic
field around the installed vacuum interrupter using the flexible magnetic
field coil; measuring
a first ion current flow across the one or more open contacts; comparing the
first measured ion
current flow to a threshold value; if the first measured ion current flow is
greater than the
threshold value, indicating a first condition of the vacuum interrupter; and
if the first measured
ion current flow is less than the threshold value: increasing the magnetic
field around the
installed vacuum interrupter; measuring a second ion current flow across the
one or more open
contacts; and comparing the second measured ion current flow to the threshold
value.
10006131 In another aspect, there is provided a method for predicting
a usable life
of a vacuum interrupter, the method comprising: placing a flexible magnetic
field coil around
an installed vacuum interrupter; causing a DC potential to be applied across
one or more open
contacts of the installed vacuum interrupter; generating a first magnetic
field around the
installed vacuum interrupter using the flexible magnetic field coil; measuring
a first ion current
flow across the one or more open contacts; comparing the first measured ion
current flow to a
threshold value; if the first measured ion current flow is greater than the
threshold value,
indicating a first condition of the vacuum interrupter; and if the first
measured ion current flow
is less than the threshold value: increasing the magnetic field around the
installed vacuum
interrupter; measuring a second ion current flow across the one or more open
contacts;
comparing the second measured ion current flow to the threshold value; and
indicating a second
condition of the vacuum interrupter.
[00060 In a further aspect, there is provided a system for
predicting a usable life
of a vacuum interrupter, the system comprising: a flexible magnetic field coil
configured to be
placed around an installed vacuum interrupter; control circuitry configured to
cause a DC
potential to be applied across one or more open contacts of the installed
vacuum interrupter; a
current generator configured to generate a magnetic field around the installed
vacuum
interrupter using the flexible magnetic field coil and, after a first
condition, configured to
increase the generated magnetic field around the installed vacuum interrupter;
current sensing
circuitry configured to measure a first ion current flow across the one or
more open contacts
and to compare the first measured ion current flow to the threshold value and,
after the first
condition, configured to measure a second ion current flow across the one or
more open
contacts and to compare the second measured ion current flow to the threshold
value; and a
condition indicator configured to indicate the first condition of the vacuum
interrupter.
la
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BRIEF DESCRIPTION OF THE DRAWINGS
[0007] The detailed description will be better understood in
conjunction with the
accompanying drawings as follows:
[0008] Figure 1 depicts an electromagnetic testing device connected
to a flexible
magnetic field coil, power supply, and an installed vacuum interrupter using a
positive
engagement wire and a negative engagement wire according to one or more
embodiments.
[0009] Figure 2 depicts a data storage of the electromagnetic testing
device in
communication with a processor according to one or more embodiments.
[0010] Figure 3 depicts a vacuum interrupter according to one or more
embodiments.
[0011] Figure 4 depicts the electromagnetic testing device according
to one or more
embodiments.
[0012] Figures 5A and 5B depict detailed views of two different types
of fixed inner
diameter magnetic coils.
[0013] Figures 6A and 6B depict a diagram of the method according to
one or more
embodiments.
[0014] Figure 7 illustrates an example of an integrated embodiment of
the
electromagnetic testing device.
[0015] Figures 8A and 8B illustrate an example of a partially
integrated
embodiment of the electromagnetic testing device.
[0016] Figure 9 illustrates an example of a modular embodiment of the
electromagnetic testing device.
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100171 Figure 10
illustrates an example of a testing procedure for use in
accordance with the electromagnetic testing device illustrated in Figure 7.
[001.81 The present
embodiments are detailed below with reference to the listed
Figures.
DETAILED DESCRIPTION OF THE EMBODIMENTS
[00191 Before explaining
the present method in detail, it is to be understood that
the method is not limited to the particular embodiments and that it can be
practiced or carried
out in various ways.
100201 Historically_ air
magnetic and oil interrupters were the only types of
interrupters used on circuit breakers rated at 2.4 kilovolts (kV) or higher,
with air magnetic
interrupters being used on lower voltages in this rating, including voltages
ranging from 2.4
kV to 25 kV. and with oil interrupters being most commonly used on Volt ag e s
higher than 25
kV_ primarily because of their ability to interrupt higher arc energies.
[00211 Air magnetic
interrupters degrade somewhat each time they,' are opened
under load, and degrade significantly when they are interrupted under fault
Contacts can be
repaired or replaced if required; however. maintenance of such circuit
breakers is not always
properly scheduled, which can result in failures.
[00221 In addition to
maintenance issues, arc-chutes are large and heavy, and
some are chutes are fragile and can be broken if not properly handled,
100231 Oil interrupters
are heavy and submerged in oil, such that reaching the oil
interrupters for inspection is difficult. As such, oil interrupters are not
always maintained as
they should be.
100241 The present
embodiments relate to a method for vacuum interrupters that
provides for ease of testing and maintenance of the vacuum interrupters, use
of flexible and
lightweight testing equipment, and allowance for testing in the field, each of
which is not
available with prior testing methods for vacuum interrupters in the field.
100251 One or more of the
present embodiments relate to a closed contact method
to predict a usable life of' installed vacuum interrupters in the field, as
well as to an open
contact method to predict the usable life of installed vacuum interrupters in
the field.
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100261 The method Can include using fixed size portable magnetic cods,
1,µ hich
can he lightweight and easy to use.
100271 In embodiments, the method can be used on vacuum interrupters that
are
compact and sealed.
100281 The method can be used on vacuum interrupters that have short gap
travel
distances, such as gap travel distances ranging from about 8 mm to about 12
mm.
[00291 The method can cause less damage than other methods for testing
vacuum
interrupters.
100301 The method involves creating a plurality of ionic or current
versus
pressure curves as models of the useful life of different sized vacuum
interrupters, as well as
storing the plurality of ionic or current versus pressure curves in a library
in the data storage.
100311 The method further involves creating a plurality of trend data for
expected
life of different vacuum interrupters using pressure and other variables. as
vel 1 as stonng the
trend data in a trend data library in the data storage.
100321 The method has as a step creating a tube chart, which can include
different
values with different points. In operation, an individual vacuum interrupter
can be tested to
meet criteria that are different than criteria met by other individual vacuum
interrupters. As
such, a unique point value can be created for each criteria of each individual
vacuum
interrupter. The sum of the points can be placed into a unique algorithm that
can utilize the
trend data in the data storage to determine life expectancy for individual
vacuum interrupters.
[0033] For example, a first point value can be assigned based on a model
number
and the type of vacuum interrupter being tested. For example, a GE 40A1, 12
Ky. 1200 amp,
18 KA vacuum interrupter can have a high first point value for reliability.
[00341 The second point value can be a point value that depends on how
many
operations the individual vacuum interrupter has been used in. For example, 1-
100 operations
on the GE 40A1 can have a second point value of 5 points assigned to it. 101
to 1000
operations on the GE 40A1 can have a second point value of b points assigned
to it, 1001 to
2000 operations on the GE 40A1 can have a second point value of 7 points
assigned to it,
2001 to 3000 operations on the GE 40A I can have a second point value of 8
points assigned
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to it, and over 3001 operations on the GE 40A I can have a second point value
of 9 points
assigned to it The second point value can vary depending upon the particular
individual
vacuum interrupter and the number or operations it has been used in.
100351 A third point value can relate to an age of the individual vacuum
interrupter. For example. a 5 year old vacuum interrupter can have 5 points
assigned to it as
the third point value, a 10 year old vacuum interrupter can have 6 points
assigned to it as the
third point value, a 15 year old vacuum interrupter can have 7 points assigned
to it as the
third point value. a 20 year old vacuum interrupter can have 8 points assigned
to it as the
third point value, and a 25 year old vacuum interrupter can have 9 points
assigned to it as the
third point value. The third point value can vary depending upon the
particular individual
vacuum interrupter and the age of the particular individual vacuum
interrupter.
100361 A fourth point value can be for contact resistance and wear
information for
the individual vacuum interrupter. For example, if 30 micro Ohms are measured_
which
means 80 percent of a contact surface remains for a. particular individual
vacuum interrupter,
then the fourth point value can he 5_ if 40 micro Ohms are measured_ which
means 60 percent
of the contact surface remains, then the fourth point value can be 6, if Si)
micro Ohms are
measured, which means 40 percent or the contact surface remains, then the
fourth point value
can he 7, if 60 micro Ohms are measured, which means 20 percent of the contact
surface
remains, then the fourth point value can be 8, and if 70 micro Ohms are
measured, which
means 10 percent of the contact surface remains, then the fourth point value
can be 9. The
fourth point value can vary depending upon the particular individual vacuum
interrupter and
the amount of Ohms measured for the particular individual vacuum interrupter.
100371 A fifth point value that can be used for the calculation of life
expectancy of
the vacuum interrupters can be based on results obtained using the
electromagnetic testing
device with specific vacuum interrupters.
100381 Iii operation, the method has the vacuum interrupter rating 5
points when
tested at a pressure of 10 x E-6, rating 4 points when tested at a pressure of
10 x E-5, rating
3 points when tested at a pressure of 10 x E-4, rating points when tested at a
pressure o15.0
x E x 10-3, and rating 9 points when tested at a pressure of 10 x F-3.
100391 The calculation of the life expectancy can factor in a weighting
value
based on the number of vacuum interrupters tested with similar results. For
example, for 1-
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100 samples of a certain vacuum interrupter, the weighting value can be 1.5,
For 101-200
samples the weighting value can he 1.4, for 201-300 samples the weighting
value can be 1.1
for 301-400 samples the weighting value can be 1.2. for 401-500 samples the
weighting value
can be 1.1. and for vacuum interrupters that have had samples tests more than
500 times the
weighting value can be 1Ø
100401 A primer,' basis for the wide acceptance of vacuum interrupters is
financial. A life span and the number of vacuum interrupters can be increased
using the
method disclosed herein. The method can 3110W the life span for vacuum
interrupters to range
from about live times to about ten times longer_ particularly for SF-6 vacuum
interrupters.
100411 The method can use simple yet ruggedly constructed equipment to
test the
vacuum interrupters.
[00421 In operation, all of the point values can be added together to
attain a total
value for the vacuum interrupter. For example; all of the point values can be
added together
to equal 20 for a particular vacuum interrupter with a long life expectancy. A
larger total
-value would indicate a need to replace the vacuum interrupter sooner than
vacuum
interrupters having, a lower total value.
100431 The total value of point values can be multiplied by the Weighting
value
based on a sample 5i7e to provide a point value, and the life expectancy can
be determined
based on a category that the point value falls into.
100441 If the point value is between 20 and 30, this can indicate a long
life
expectancy and that the vacuum interrupter needs to be checked in 10 years.
[00451 If the point value is between 30 and 3,4_ this can indicate that
the vacuum
interrupter will need to be checked and probably replaced in 5 years.
100461 If the point value is between 35 and 44_ this can indicate that
the vacuum
interrupter will need to be checked in 2 years and probably replaced in 2
years.
100471 if the point value is over 45, this can indicate that the vacuum
interrupter is
about to fail and should be replaced immediately.
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100481 The use of the
weighting value can yield a better and more accurate result.
Computer instructions can be formed and/or stored in the data storage to
perform calculation
of the, life expectancy for each vacuum interrupter.
[00491 The method can
include using an electromagnetic testing device connected
to a flexible magnetic field coil to perform testing.
100501 The method can
also utilize calibration information, which can be created
without the electromagnetic testing device, and can be installed for use on
the
electromagnetic testing device.
[00511 The calibration
information can include an ionic or current versus pressure
calibration curve for each model vacuum interrupter.
100521 The calibration
information can be formed by testing a specific individual
model of a vacuum interrupter, which can have a Vacuum created therein tbr
testing at 40
different ionic currents to determine 40 different points of calculated
pressure or 40 different
points of measured amps: thereby creating an ionic or current versus pressure
calibration
curve tar a specific model of vacuum interruption.
100531 Each ionic or
current versus pressure calibration curve can be input into a
library of ionic or current versus pressure calibration curves in the data
storage connected to
the processor: thereby allowing a user to select a 'vacuum interrupter model
and obtain the
corresponding ionic or current versus pressure calibration curve.
100541 Additionally, a
library of trend data can be created for each of the vacuum
interrupters in the library of ionic or current versus pressure calibration
curves. The trend data
can be installed in the library of trend data in data storage associated with
the processor
100551 The trend data can
include: a vacuum pressure at a date of testing versus
vacuum pressure when the vacuum interrupter was manufactured to provide a leak
rate:
circuit breaker type: circuit breaker serial number: date of vacuum
interrupter manufacture,
circuit breaker condition at ambient atmosphere, circuit breaker insulation
resistance, circuit
breaker operating condition, such as an alkaline condition or an acidic
condition: serial
number of the installed vacuum interrupter: vacuum interrupter wear indication
data, installed
vacuum interrupter contact resistance: circuit criticality, such as a level of
importance of the
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circuit in the facility: manufacturer name for the installed vacuum
interrupters: manufacturer
pan number: an approximate number of operations on the vacuum interrupter:
circuit breaker
atmosphere; or combinations thereof
[00561 The method can include using the electromagnetic testing device
with the
data storage and the processor to perform testing.
[00571 The data storage with the associated processor can be a circuit
board. The
library of ionic or current versus pressure calibration curves and the library
of trend data can
be stored in the data storage.
[00581 Additionally, a tube chart can be installed in the data storage of
the
electromagnetic testing device.
100591 The tube chart can be formed from a plurality of tube types. Each
tube
type can have a tube identifier, such as a model number or serial number. Each
tube identifier
can have a tube specific ionic or current versus pressure calibration curve,
100601 A flexible magnetic Field coil can be connected to the
electromagnetic
testing device. The flexible magnetic field coil can be a loop made from a
plurality of
insulated copper wires.
100611 A positive pole and a negative pole can each be connected to the
flexible
magnetic field coil and connected to the electromagnetic testing device:
thereh allowing the
electromagnetic testing device to flow a high voltage to the flexible magnetic
field coil when
a test procedure is actuated.
[00621 The electromagnetic testing device can be connected to a power
supply to
allow the electromagnetic testing device to power the flexible magnetic field
coil and to
perform monitoring and calculation steps required for the testing.
[00631 The electromagnetic testing device can also be connected using a
positive
engagement is ire to the installed vacuum interrupter at a tube end_ and a
ground engagement
wire on another end. The electromagnetic testing device can then be connected
to a ground.
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100641 The method can be used for testing vacuum interrupters in the
field that
hav e three gaps. The method can allow for testing of the gaps between
internal contacts of the
vacuum interrupter and a metal vapor shield of the vacuum interrupter.
[00651 The three gaps in the vacuum interrupters can include a first gap
between a
moving contact portion of a contact assembly and a fixed contact portion of
the contact
assembly, a second gap between the moving contact portion and the metal vapor
shield of the
vacuum interrupter. and a third gap between the fixed contact portion and the
metal vapor
100661 The method can allow for simultaneous testing of all three gaps
for leak
detection. The method can prevent explosions of the vacuum interrupters by
enabling quick
and cheap field detection of leaks using flexible lightweight testing
equipment.
100671 The method can be used on v acuum interrupters that have metal
vapor
shields, which capture metal vapor or other contaminant particles created by
metallic arcing
that occurs when contacts open. The metal vapor shield can capture or inhibit
the metal vapor
or contaminant particles from entering the gap between the moving contact
portion and the
fixed contact portion.
10068] The metal vapor or contaminant particles can be highly ionized,
can cause
thermal expansion, and can be drawn to the metal vapor shield by electrostatic
forces. When
the metal vapor or contaminant particles contact the metal vapor shield, the
metal vapor or
contaminant particles can quickly solidify and adhere to the metal vapor
shield, which can
help maintain both a vacuum level inside the vacuum interrupter and efficient
working of the
vacuum interrupter.
100691 The metal vapor shield can also keep an electrostatic field
uniformly
distributed, both inside and outside of the vacuum interrupter, to ensure a
longer life for the
vacuum interrupter.
100701 The metal vapor shield can protect a ceramic body of the vacuum
interrupter from high levels of radiation during arcing and interruption, and
prevent high level
arcs from directly contacting the ceramic body.
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100711 Accordinetx , measuring the gap between the metal vapor shield and
the
moving contact and the gap between the metal vapor shield and the fixed
contact can ensure
proper functioning of the vacuum interrupter. Additionally, the method can be
used to
measure the gap between the fixed contact portion and moving contact portion,
also referred
to as the primary gap.
100721 The method can provide improved results when high-potential
testing is
performed on the vacuum interrupter. The method can allow a high-potential
voltage to be
applied across open contacts of the vacuum interrupter, allow the voltage to
increase to a test
value, and then measure leakage of current.
100731 The method can allow for determination of very low quantities of
current
leakage for both AC high-potential tests and DC high-potential tests.
[0074] The high-potential tests can use the Penning Discharge Principle,
The
method can apply the Penning Discharge Principle because when a high voltage
is applied to
open contacts in a gas and a contact structure is surrounded with a magnetic
field, an amount
of current flow between plates is a function of gas pressure, applied voltage,
and magnetic
field.
[0075] The method can include creating a magnetic field using a field
coil. The
vacuum interrupter can be placed into the field coil,
[0076] The magnetic field can be created using a flexible magnetic field
coil, and
then appl:v ing direct current (DC) to the flexible magnetic field coil, Next,
a constant DC
voltage, such as 10 kV, can be applied to open contacts, and current flow
through the vacuum
interrupter can be measured with the field coil. In one or more embodiments,
the DC voltage
can range front 10 volts to four thousand volts.
100771 Since the magnetic field (D) and the applied voltage (DC) are both
known,
the only variable remaining is the pressure of the gas. If the relationship
between the gas
pressure and the current flow is known, then the internal pressure can be
calculated based on
the amount of current flow. The method can use this calculation.
100781 One or more embodiments of the method do not generate X-rays damg
testing, in addition to providing accurate lest values in the field using DC
hialt-potemial tests.
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in other methods. DC voltages, when applied across the gaps of the contacts,
generate X-rays
that are known to be harmful to operators thoui protection.
100791 As such, the
method allows vacuum interrupters to be tested in the field
without the need for lead-based suits by reducing the potential of harm to
operators. By not
generating X-rays during testinn, the method can save lives and prevent known
harms to
humans.
100801 The method can be
used to provide high-potential tests and contact-
resistant tests to vacuum interrupters in the field to determine if the vacuum
interrupters need
to be replaced. The high-potential tests and contact-resistant tests can be
quickly performed
in the field using the method, such as in less than three hours.
100811 The method can
allow for testing of pressure inside the vacuum
interrupters. Magnetrons and associated equipment have traditionally been used
to test for
pressure inside vacuum interrupters. Magnetrons and associated equipment are
too bulky and
heavy for efficient use in the field, are difficult to calibrate when moved,
do not have trending
and prediction tools for evaluating, their tests, and require the removal of
the vacuum
interrupters from associated circuit breaker mechanisms.
100821 The method can be
easily implemented by less eNperienced operators in
the field without requiring removal of the vacuum interrupters from associated
circuit
breakers.
100831 The method can
allow for testing, prediction, and trending of vacuum
interrupter failure rates in the field.
100841 One or more
embodiments of the method can include applying a flexible
magnetic field coil directly to the vacuum interrupter. The flexible magnetic
field coil can be
used on an entire pole, such as when the vacuum interrupter is not readily
available.
[00851 Turning no, to the
figures. Figure 1 depicts an embodiment of the
electromagnetic testing device 59 having a connected body 10 and a closeable
lid I I.
10086] The
electromagnetic testing device 59 can have a face plate 12. Capacitors
beneath the face plate 12 can collect and release art electric charge. Also,
rectifiers, relays,
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and a circuit board with the processor and the data storage can be disposed
beneath the face
plate 12.
100871 The face plate 12
can have a power-ill plug 14 for receiving 110 volts or
220 volts of AC current or another current from a power supply 93.
100881 The capacitors
beneath the face plate 12 can connect to additional plugs in
the face plate 12, such as a high voltage output plug 15, a magnetic control
positive output
plug 16, and a magnetic control negative output plug 17.
100891 The
electromagnetic testing device 59 can connect to a flexible magnetic
field coil 79 through a positive magnetic control wire 78 engaging the
magnetic control
positive output plug 16 and a negative magnetic control wire 77 engaging the
magnetic
control negative output plug 17.
100901 In operation, upon
actuation of the electromagnetic testing device 59, the
electromagnetic testing device 59 can provide a current to the flexible
magnetic field coil 791
thereby creating a magnetic field around an installed vacuum interrupter 80.
100911 The installed
vacuum interrupter 80 can be installed at an installed location
84, such as a power plain's circuit breaker switch room.
100921 The installed
vacuum interrupter 80 can be connected to the
electromagnetic testing device 59 through a positive engagement wire 102 and a
ground
engagement wire 103.
100931 The fleNible
magnetic Field coil 79 can be wrapped around the installed
vacuum interrupter 80.
100941 The
electromagnetic testing device 59 can have a _ground plug 95
connecting to a ground wire 97 for grounding the electromagnetic testing
device .59.
[00951 A test button 18
can be installed on the face plate 12 to actuate computer
instructions in the data storage to actuate a test.
100961 A display 85 on
the face plate 12 can display calculated test results to a
user.
t?
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[00971 The electromagnetic testing device 59 can be in communication with
a
client device 96 through network 94 for remote monitoring and actuation of the
electromagnetic testing device 59.
[00981 In operation. when a strong magnetic field is applied around the
vacuum
interrupter 80, ions lvi 11 move producing a current across an open contact. -
This ionization
current is directiv, proportional to a pressure inside the vacuum interrupter
80. With a known
ionic or current versus pressure curve, the pressure inside the vacuum
interrupter 80 can be
easily determined through the Pennine Discharge Principle.
[00991 Figure 2 depicts the data storage 75 of the electromagnetic
testing
device 59 in communication with the processor 76.
1001001 A library of ionic or current versus pressure calibration curves
50 can be
stored in the data storage 75.
[001011 A libraiT of trend data 60 for each individual vacuum interrupter
can be
stored in the data storage 75.
1001021 The library of trend data 60 can include at least a vacuum
interrupter serial
number, a vacuum interrupter model or type, calculated pressure from other
tests by the
electromagnetic testing device testing identical model vacuum interrupters,
calculated amp
from other tests by the electromagnetic testing device testing identical model
vacuum
interrupter, or combinations thereof Additional trend data can be stored in
the library of trend
data.
1001031 A tube chart 70 of tube types 72 can be stored in the data storage
75. Each
tube type can have a tube identifier 73. Each tube identifier 73 can be linked
to a tube specific
ionic or current versus pressure calibration curve 74 in the library of ionic
or current versus
pressure calibration curves 50.
[01001 The data storage 75 can include computer instructions for
measuring ion
current flow across one or more gaps in the vacuum interrupter 101.
[01011 The data storage 75 can include computer instructions to ink one
of the
tube rvpes to a selected tube type to associate an ionic or current ersus
pressure calibration
curve with the selected tube type 120.
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101021 The data storage 75 can include computer
instructions to instruct the
processor to apply the DC potential across the one or more gaps in the
installed vacuum
interrupter 136a.
101031 The data storage 75 can include computer
instructions to instruct the
processor to form a magnetic field around the installed vacuum interrupter
using the flexible
magnetic field coil 136b_
101041 The data storage 75 can include computer
instructions to instruct the
processor to create an ion current flow across the one or more gaps of the
installed vacuum
interrupter 136c.
[01051 The data storage 75 can include computer
instructions to instruct the
processor to measure a quantity of ions travelling across the one or more gaps
to compare ion
current now before the one or more gaps to ion current How after the one or
more gaps 136d.
101061 The data storage 75 can include computer
instructions to instruct the
processor to calculate a pressure based on a difference in measured quantity
of ions flowing
across the one or more gaps 1.36e.
101071 The data storage 75 can include computer
instructions to instruct the
processor to position the calculated difference in measured quantity of ions
flowing across
the one or more gaps on an ionic or current versus pressure calibration curve
for the installed
vacuum interrupter from the library of ionic or current versus pressure
calibration curves
1361
[01081 The data storage 75 can include computer
instructions to instruct the
processor to present the calculated pressure or calculated amps based on the
calculated
pressure on a display of the electromagnetic testing device 136g.
101091 'Mc data storage 75 can include computer
instructions to calculate life
expectancy of the Vacu um interrupter using Lest results and the trend data
138.
101101 The data storage 75 can include computer
instructions to print the test
results on an installed printer integrated with the test unit 146.
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101111 Figure 3 depicts an embodiment of a vacuum interrupter
SO with a body
106. also referred to as an insulator body. The body 106 can be made of glass,
metal, ceramic.
or combinations of these materials. forming a case.
101121 The body 106 can have one or two segments.
101131 The vacuum interrupter 80 can have a top 111. bottom
115, and mounting
means 116.
101.141 The vacuum interrupter 80 can have a fixed contact 107,
which can be
metals slotted, solid, or combinations thereof 'Me fixed contact 107 can
engage a fixed
contact stem 110.
101151 One or more embodiments of the vacuum interrupter 80 can
have a vapor
shield 108, which can be for shielding metal vapor or other contaminates. The
vapor shield
108 can collect metal that comes off or contacts during application of current
to the contact,
can stop sputtering matenal from contaminating the inside of the case that
occurs, and can
control flashing.
101161 The vacuum interrupter 80 can have a moving contact 109
connected to a
moving contact stem 111 surrounded by a moving contact guide 113. which can be
made of
plastic.
101171 A bellows 112, which can be made of stainless steel, can
be disposed
Within the bottom 115 between the moving contact 109 and moving contact stem
111.
101181 In operation, the moving contact stem 111 can engage a
circuit breaker
motor, which is not shown.
101191 A first gap 81a can be formed between the moving contact
109 and the
vapor shield 108, a second gap 8lb can be formed between the fixed contact 107
and the
moving contact 109, and a third gap 8 1 c can he formed between the flied
contact 107 and the
vapor shield 108.
[01201 Figure 4 depicts another embodiment of the
electromagnetic testing device
59 having a housing 19.
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j01211 The face plate 12 can be disposed on the housing 19, and a circuit
hoard
Mat contains the data storage with the processor can he disposed beneath the
face plate 12.
The circuit board can connect to at least one capacitor beneath the face plate
12 for accepting
power from a power in plug engaging the power supple that can be connected to
the back of
the housing 19.
[01221 The power supply can provide power to the processor of the
electromagnetic testing device 59.
[01231 n ortioff switch
9 can be used to turn the electromagnetic testing
device 59 on and off.
[01241 Prior to initiating testing, a user can select a tube type. which
can be
displayed on a tube type display 20, such as by using a selector button 21
that connects to the
tube chart in the data storage, a number up selector 22, and a number down
selector 23.
[012.5] The user can also select between a single gap vacuum interrupter
test and a
double gap vacuum interrupter test, such as by reconnecting test leads to
shield contacts or
across contacts.
[0126] Additionally, the user can select, using a test selector switch
25, from a
fixed magnetic field test using non-flexible canisters of magnetic coils
having a fixed inner
diameter and a test using the flexible magnetic field coil.
[01.27] To initiate the testing by the electromagnetic testing device 59,
a test
button 18 can be depressed to actuate a series or computer instructions in the
data storage for
powering a capacitor, discharging the capacitor into the vacuum interrupter
vvhile powering
the magnetic field, and receiving signals from the magnetic field from a
signal input wire that
engages a signal input plug 26.
[01281 Computations performed using the computer instructions can be
displayed
on displays in the face plate 12. For example, results can be presented on a
main pressure or
amp results display 27 and an exponential factor display 28. Also, a unit
choice can be
indicated as Pascals or as Amps using light emitting diodes "LED- lights 29a
and 29b.
[0129] A print button Si.) can be used to actuate computer instructions
in the data
storage to print test results on a built in printer 31.
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101301 In one or more embodiments, the electromagnetic testing
device 59 can be
lightweight and usable for labs and shops. For example, the electromagnetic
'testing device 59
can weigh less than ten pounds. Additionally, the electromagnetic testing
device 59 can have
a measurement range from about I x 10-5 Pascals to about I x 10-1 Pascals. The
measurement accuracy- can be less than 10 percent thr measurements from I x 10-
4 Pascals
and 1 N. 10-1.
[0131] In operation, the electromagnetic testing device 59 can
be easy and safe to
operate without causing damage to the vacuum interrupter during testing, and
without
jeopardizing the life of the user during testing.
l01321 The electromagnetic testing device 59 can also have a
coil choice selector
24 for selecting a flexible magnetic field coil.
[01331 Figures 5A and 5B depict details of two different types
of Fixed inner
diameter magnetic coils 51a and 51b that can be used to test vacuum
interrupters instead of
using a flexible magnetic field coil.
101341 Each fixed inner diameter magnetic coil 51a and 5 lb can
have an insulated
metal housing 33a and 33b that has a central chamber 37a and 37b for receiving
vacuum
interrupters 80a and 80b.
i0135] A plurality of insulated copper wires 38a and 38b can be
disposed around
the central chambers 37a and 37b in the insulated metal housings 33a and 3317
to create the
magnetic field.
10136] A copper plate can be on a bottom of' the inside of the
insulated metal
housings 33a and 33b for connecting to the vacuum interrupters 80a and 80b
that have been
removed from a breaker or contactor. As such, a consistent and uniform
magnetic field can be
formed for accurate vacuum interrupter condition measurements. The fixed inner
diameter
magnetic coils 51a and 51b can have various inner diameter sizes.
101371 Each fixed inner diameter magnetic coil 51a and 5 lb can
have positive
magnetic connections 34a and 34b and negative magnetic connections 35a and
35b.
(0138] Each fixed inner diameter magnetic coil 51a and 51b can
have a fixed
inner diameter 32a and 32b.
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101391 Figures 6A and 613 depict an embodiment of the method.
101401 The method can include creating and installing the library of
ionic or
current ersus pressure calibration curves For individual ac u u m interrupters
in the data
storage of the electromagnetic testing device, as illustrated by box 6000.
101411 The method can include creating and installing, the library of
trend data for
each individual vacuum interrupter in the data storage of the electromagnetic
testing device.
as illustrated by box 6002.
[0142] The method can include creating and installing the tube chart in
the data
storage of the electromagnetic testing device, as illustrated by box 6004.
[0143] The method can include placing an installed vacuum interrupter
within a
flexible magnetic field coil without removing the installed vacuum interrupter
from an
installed location in an operating unit, as illustrated by box 6006.
101441 The method can include using a closed circuit test and actuating a
DC
potential from the electromagnetic testing device to cross the first gap in
the installed vacuum
interrupter between a vapor shield in the installed vacuum interrupter and a
contact assembly
in the installed vaciami interrupter, as illustrated by box 6008a; or the
method can include
using an open circuit test and placing the DC potential across the first gap
and a second gap a
first contact and a second contact of the installed vacuum interrupter in the
open position
allowing ion current flow across the first gap and second gap, as illustrated
by box 6008b.
101451 The method can include selecting a tube type using a pressure
sensitive
display on the electromagnetic testing device, as illustrated by box 6010,
101461 The method can include displaying the selected tube type for the
installed
vacuum interrupter on a display of the electromagnetic testing device, as
illustrated by
box 6012.
[01471 The method can include measuring ion current flow across the first
gap
and,Or the second gap of the installed vacuum interrupter by using a signal
from the flexible
magnetic Field coil and using computer instructions in the data storage for
measuring ion
current flow, as illustrated by box 6014.
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101481 The method can include linking one of the tube types to the
selected tube
type to associate an ionic or current versus pressure calibration curve with
the selected tube
type, as illustrated by box 6016
101491 The method can include selecting an output reading for the
electromagnetic testing device consisting of either a direct pressure reading
in Pascals or an
ionic current reading in amps, as illustrated by box 6018.
101501 The method can include actuating testing by the electromagnetic
testing
device by using compiler instructions in the data storage to instruct the
processor to: apply
the DC potential across the first gap and/or the second gap in the installed
vacuum
interrupter, fbrrn the magnetic field around the installed vacuum interrupter
using the fleKible
magnetic field coil, create the ion current flow across the first gap and'or
the second gap of
the installed vacuum interrupter, measure the quantity of ions travelling
across the first gap
and/or the second gap to compare ion current flow before the first gap anchor
the second gap
to ion current flow after the first gap and/or second gap, and calculate a
pressure based on the
difference in measured quantity of ions flowing across the first gap and/or
second gap. as
illustrated by box 6020.
101511 The method can include using -a closed circuit test and actuating
a DC
potential from the electromagnetic testing device to cross the third gap in
the installed
vacuum interrupter between the vapor shield in the installed vacuum
interrupter and the
contact assembly in the installed vacuum interrupter, as illustrated by box
6022.
101521 The method can include measuring ion current flow across the third
gap of
the installed vacuum interrupter by using a signal from the flexible magnetic
field coil and
using computer instructions in the data, storage for measuring ion current
flow, as illustrated
by box 6024.
101531 The method can include actuating testing by the electromagnetic
testing
device by using computer instructions in the data storage to instruct the
processor to: apply
the DC potential across the third gap in the installed vacuum interrupter,
form the magnetic
field around the installed vacuum interrupter using the flexible magnetic held
coil, create the
ion current flow across the first gap and/or the second gap of the installed
vacuum interrupter.
measure the quantity of ions travelling across the third gap to compare ion
current flow
before the third gap to ion current NA\ after the third gap, and calculate a
pressure based on
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the difference in measured quantity of ions flowing across the third gap, as
illustrated by box
6026.
[01541 The method can
include determining an anticipated life expectancy of the
installed vacuum interrupter by: positioning the calculated amp or calculated
pressure on the
ionic or current versus pressure calibration curve for the installed vacuum
interrupter and
identifying the trend data from the library of trend data corresponding to the
installed vacuum
interrupter and to the calculated pressure or to the calculated amp of the
installed vacuum
interrupter to determine the anticipated life, expectancy in years and months
for the installed
vacuum interrupter, as illustrated by box 6028.
[01551 The method cart
include providing the calculated amp or calculated
pressure to an RS232 interface or a printer, as illustrated by: box 6030.
[0156] The method can
include using a printer that is integrated with the
electromagnetic testing device to print the calculated amp or calculated
pressure and to
provide a location of the calculated amp or calculated pressure on the ionic
or current versus
pressure calibration curve of the installed va.cuurn interrupter, as
illustrated by box 6032.
101571 The method can
include resetting the display using a reset button on the
electromagnetic testing device to: turn off kUl LED light, clear the
calculated amp, clear the
calculated pressure, or combinations thereof, as illustrated by- box 6034.
j01581 The method can
include using the LED light to indicate when the
electromagnetic testing device is performing the test, as illustrated by box
6036.
[01591 The method can
include connecting the processor with a network for
communication to a client device remote to the processor, as illustrated by:
box 6038.
101601 While these
embodiments have been described with emphasis on the
embodiments. it should be understood that within the scope of the appended
claims, the
embodiments might be practiced other than as specifically described herein.
101611 For example,
Figure 7 illustrates an example embodiment of an
electromagnetic testing device 700 similar to that described above and
illustrated in Figures 1
and 4_ wherein the electromagnetic testing device 700 is shown integrated with
a high-
potential testing portion 720. The high-potential testing portion 720 may, in
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embodiments, comprise standalone circuitry referred to as a hipot tester. In
other
embodiments, such as that shown in Figure 7. the hipot tester circuitry (i.e.,
high-potential
testing portion 72(J) may be integrated with the electromagnetic testing
device 700. The
electromagnetic testing device 700, including high-potential testing portion
720, operates in
accordance with the foreuoing disclosure.
[01621 The electromagnetic testing device 700 is connected to an
electromagnetic
field coil 730 through a positive magnetic control wire 732 engaging magnetic
control
positive output plug 712 and a negative magnetic control wire 734 engaging
magnetic control
negative output plug 714. The electromagnetic field coil 730 is wrapped around
an installed
vacuum interrupter 740. During testing. the electromagnetic testing device 700
provides a
current to the electromagnetic field coil 730 to create a magnetic field
around the installed
vacuum interrupter 740.
101631 The hieh-potential testing portion 720 of the electromagnetic
testing
device 700 is connected to the vacuum interrupter 740 via a supply wire 722
and a return
wire 724. During testing, the high-potential testing portion 720 applies a DC
potential across
the open contacts the vacuum interrupter 740 by applying a supply voltage via
the supply
wire 722 and receiving a load return from the return wire 724, wherein the
return load is
received at a load return port 726.
101641 In the embodiment illustrated in Figure 7, the electromagnetic
testing
device 700 is integrated with the high-potential testing portion 720, and
includes an
integrated current sensing circuit 728 in series with the load return 726. As
discussed in
greater detail below, the integrated cutTent sensing circuit 728 is used to
control Pass/Fail
lights 718 or other suitable status indicators to indicate the condition of
the vacuum
interrupter 740_ Electromagnetic testing device 700 provides the benefit of
being able to
detect poor vacuum in installed vacuum interrupters prior to failure. In some
embodiments,
the electromagnetic testing device 700 is capable of performing two tests
simultaneously.
101651 Testing of the vacuum interrupter 740 is conducted via the
electromagnetic
testing device 700 in accordance with the foregoing disclosure. Thus, the high-
potential
testing portion 720 applies a DC potential across the open contacts of the
vacuum interrupter
740. When the high DC voltage is applied across the open contacts of the
vacuum interrupter
740, gas molecules inside the vacuum interrupter 740 are ionized. By applying
a strong
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magnetic field via the maimetic field cod 730. current will flow between the
contacts of the
vacuum interrupter 740 due to the entrapment of the ions in the magnetic
field. This ion
current is proportional to the gas pressure inside the vacuum interrupter 740.
and may be used
to determine the predicted usable life of the vacuum interrupter 740.
101661 The
electromagnetic test= device 700 includes an actuate button 716 (or
other suitable type of switch) which, when pressed, activates the magnetic
field to initiate
testing of the vacuum interrupter 740. Upon completion of the testing,
indication of the
condition of the vacuum interrupter 740 is provided by a condition indicator
such as, for
example. Pass/Fail lights 718. FOr example, a vacuum interrupter 740 having a
relatively
good vacuum will generate a low ion current (e.g., less than 1 mA) during
testing. wherein
the low ion current is such that it will not be great enough to activate
current sensing circuitry
in the high-potential testintz. portion 720 (or is otherwise below a low
current threshold).
When low ion current is detected tor not detected), the green -Pass" light
718A is
illuminated. Conversely. a vacuum interrupter 740 with a relatively poor
vacuum will
generate a high ion current (e.g._ greater than 1 ml) during testing_ wherein
the high ion
current is such that it will be great enough to activate current sensing
circuitry in the high-
potential testing portion 720 tor is otherwise above a low current threshold)
When high ion
current is detected, the red -Fair light 7188 is illuminated.
101671 In. some
embodiments, illumination of the "Pass" light 7181 Is indicative
of an acceptable predicted usable life of the vacuum interrupter 740. For
example.
illumination of the green "Pass" light 7181 may be indicative of five or more
years of a
usable life of the vacuum interrupter 740. Illumination of the -Fail- light
71813 may be
indicative of an unacceptable predicted usable life of the vacuum interrupter
740. For
example. illumination of the red -Fair light 718B made be indicative of Less
than five years
of a usable lire or the vacuum interrupter 740.
101681 Other implementations and embodiments may include further
modifications to the electromagnetic testing device 700. For example, some
embodiments
may feature three (or more) condition indicator lights such as. for example,
red, yellow, and
green lights. In such embodiments, the green light may be indicativ e of an
acceptable
predicted usable life (e.g.. more than five years). the yellow light may be
indicative of a less
acceptable predicted usable life (e.g., between three and five years). and the
red light may be
indicative of' a failed vacuum interrupter or a vacuum interrupter ha; ing an
unacceptable
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predicted usable tile(e.g., less than three years). Such an embodiment may be
accomplished
by applying various currents to the magnetic field coil 730 in increasing
order, and
determining, for each current level, whether a high ion current is detected
before movinit to
the next current level. For example, a first current may be applied such that
the magnetic
field coil 730 produces a first magnetic field (e.g., about 200 Gauss), and a
determination is
made whether the ion current is --high" or "low." lithe ion current is high,
then the red tient
is illuminated. Otherwise, the current is increased until a second magnetic
field is reached
(e.g., about 300 Gauss), and a determination is made whether the ion current
is high or low. If
the ion current is high. then the yellow light is illuminated Otherwise, the
green light is
illuminated. It should be understood that the operations of controlling the
current/magnetic
field, the associated timine, and other operations discussed herein are
capable of being
controlled using a programmable logic controller or other combinations of
hardware and
software.
[01691 It should be appreciated that the acceptable and unacceptable
predicted
usable life examples used herein are merely examples. Thus. other predictions
of a vacuum
interrupter usable life may be used for the various acceptable/unacceptable
conditions. For
example, an acceptable predicted usable life may be len or more years.
Additionally, the
current and Gauss measurements provided herein are merely exemplary.
Similarly, the
examples of a --high" or "low" ton current used herein are not intended to be
limiting. Thus_
other on currents may be determined to be a -high" or low" ion current. For
example, a low
ion current may be determined to be any value between I mA and 10 mA tor any
other
determined value). Thus, various combinations of low and high ion current
values may be
used to represent various acceptable predicted usable life values depending
upon various
testing parameters and/or user settings. For example, in sonic embodiments, a
low ion
current may be $ mA. which may correlate to an acceptable predicted usable
life of five
years.
101701 Reference is now made to Figures 8A and 8B, which illustrate
another
example embodiment of the disclosed electromagnetic testing device 800. The
electromagnetic testing device 800 is similar to that shown in Figure 7,
except that the
electromagnetic testmg, device 800 is a partially integrated embodiment
featuring a housing
805 for both a Magnetron Atmospheric Condition (MAC) unit 810 and a high-
potential
testing unit (hipot unit) 820. The MAC unit 810 features a power outlet 812.,
signal in port
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814. and a high-potential testing output port 816. The signal in port 814
receives the return
wire 724 that is connected to the vacuum interrupter 740, and the high-
potential testing
output port 816 provides a connection 818 to the load return port 822 of the
high-potential
testing portion 820. The MAC unit 810 also features a magnetic control
positive output plug
712 and a inannetic control negative output plug 714 for connecting the MAC
unit 810 to the
flexible electromagnetic field coil 730 via the positive magnetic control wire
732 and the
negative magnetic control wire 734. The MAC unit 810 also includes the actuate
button 716
and condition indicator lights 718.
101711 The
partially integrated embodiment of the electromagnetic testing deµ ice
800 allows a user to connect the MAC unit 810 to an existing high-potential
testing unit 820
without modification to the MAC unit 810 or high-potential testing unit 820,
The current
sensing circuitry (not shown) of the MAC unit 810 connects in series with the
load return port
822 of the high-potential testing unit 820 via connection 818. Thus, the MAC
unit 810 is
removable, as shown in Figure 8B. Once the MAC unit 810 is removed, the
housing 805
provides a compartment 860. which doubles as cable storage or other use.
Should be
understood that the MAC unit 810-s capable of being used with any high-
potential testing
unit 820, including any DC hipot
101721
Reference is now made Figure 9. which illustrates another example
embodiment of the disclosed electromagnetic testing device 900. The
electromagnetic testing
device 900 is similar to that shown in Figure 8, except that the
electromagnetic testing device
900 is a modular embodiment where the MAC unit 810 is separate from the high-
potential
testing unit 820 Thus. the MAC unit 810 is a stand-alone unit for use with a
standard hipot
unit (i.e.. high-potential testing unit 820). As shown in Figure 9. the MAC
unit 810 is
connected in lute with the high-potential testing unit 820 load return
terminal 822 via the
connection 818. En accordance vvith the foregoing disclosure. the MAC unit 810
has inline
current sensing circuitry (not shown) that activates the condition indicator
lights 718
according to preset current limits.
101731 Figure
10 illustrates an example of a testing; procedure in accordance with
the foregoing disclosure. The flowchart 1000 in Figure 10 is discussed with
reference to the
electromagnetic testing device 700 illustrated in Figure 7, but also includes
testing procedure
that is discussed with respect to other portions of the foregoing disclosure.
At 1001, a user
inspects contact wear for the installed vacuum interrupter 740. lf contact W
ear is outside the
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parameters of accepted tolerances, then the vacuum interrupter 740 is replaced
at 1002. If
contact wear is %A ithin the parameters of accepted tolerances, the user sets
or measures the
gap, and cleans the vacuum interrupter 740 and insulation at 1003. At 1004,
the
electromagnetic testing device 700 is connected and testing is performed
usin.g the high
potential testing portion thipot) 720. If the testing yields a failure of the
vacuum interrupter
740, then the polarity of the hipot connection is reversed at 1005. If the
testing yields a
second failure. then he vacuum interrupter 740 is replaced. If the testing
yields a pass on the
first try or upon reversing the polarity, then the electromagnetic held coil
730 is applied to
the vacuum interrupter 740 at 1006. At 1007, the voltage is set on the high-
potential testing
portion 720, and the actuate button 716 is pushed on the electromagnetic
testing device 700 to
initiate testing. If the electromagnetic testing device 700 detects a high ion
current, the red
"Fail" light 718B is illuminated at 100h. thereby indicating that the vacuum
interrupter 740
has an unacceptable predicted usable life (ag.. less than five years). II the
electromagnetic
testing device 700 detects a low ion current_ the green -Pass" light 718A is
illuminated at
1009, thereby indicating that the vacuum interrupter 740 has an acceptable
predicted usable
life (e g., greater than five years).
