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Patent 3089622 Summary

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(12) Patent: (11) CA 3089622
(54) English Title: CARRIER-TYPE PULSED EDDY CURRENT TESTING METHOD AND DEVICE
(54) French Title: PROCEDE ET DISPOSITIF D'ESSAI DU COURANT DE FOUCAULT PULSE DE TYPE TRANSPORTEUR
Status: Granted and Issued
Bibliographic Data
(51) International Patent Classification (IPC):
  • G01N 27/90 (2021.01)
(72) Inventors :
  • WU, XINJUN (China)
  • SONG, YUN (China)
(73) Owners :
  • HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
(71) Applicants :
  • HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)
(74) Agent: MACRAE & CO.
(74) Associate agent:
(45) Issued: 2023-08-29
(86) PCT Filing Date: 2019-10-17
(87) Open to Public Inspection: 2021-01-17
Examination requested: 2020-08-05
Availability of licence: N/A
Dedicated to the Public: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): Yes
(86) PCT Filing Number: PCT/CN2019/111666
(87) International Publication Number: CN2019111666
(85) National Entry: 2020-08-05

(30) Application Priority Data:
Application No. Country/Territory Date
201910646239.9 (China) 2019-07-17

Abstracts

English Abstract


The disclosure belongs to the technical field of non-destructive testing, and
specifically
discloses a carrier-type pulsed eddy current testing method and a carrier-type
pulsed eddy current
testing device. First, a metal plate is mounted under a pulsed eddy current
sensor, and a square
wave excitation is applied to the pulsed eddy current sensor to receive an
attenuation curve, i.e., a
carrier signal, of an induced voltage in the pulsed eddy current sensor over
time as the square wave
excitation decreases. Then, a metal component to be tested is placed under the
pulsed eddy
current sensor mounted with the metal plate, and the square wave excitation is
applied to the pulsed
eddy current sensor to receive an attenuation curve i.e., a modulating signal,
of the induced voltage
in the pulsed eddy current sensor over time as the square wave excitation
decreases. The carrier
signal and the modulating signal are demodulated to obtain the pulsed eddy
current testing signal
of the metal component to be tested. The disclosure solves the problem that
the pulsed eddy
current testing signal of metal components such as thin plates and small-
diameter pipes is rapidly
attenuated and cannot be effectively collected, and expands the application
scope of pulsed eddy
current testing.


Claims

Note: Claims are shown in the official language in which they were submitted.


WHAT IS CLAIMED IS:
1. A carrier-type pulsed eddy current testing method, comprising steps below:
S1: mounting a metal plate (7) under a pulsed eddy current sensor (9) and
applying a
square wave excitation to a driver coil (6) in the pulsed eddy current sensor
(9) to receive a first
attenuation curve, i.e., a carrier signal, of a first induced voltage signal
in the pulsed eddy current
sensor (9) over time as the square wave excitation decreases, wherein the
first induced voltage
signal is generated by a superimposed magnetic field formed by a first
magnetic field and a second
magnetic field, wherein the first magnetic field is generated by a excitation
current flowing through
the driver coil (6), and the second magnetic field is generated by an eddy
current induced in the
metal plate (7);
S2: placing a metal component (8) to be tested under the pulsed eddy current
sensor (9)
mounted with the metal plate (7) and applying the square wave excitation to
the pulsed eddy
current sensor (9) to receive a second attenuation curve, i.e., a modulating
signal, of a second
induced voltage signal in the pulsed eddy current sensor (9) over time as the
square wave excitation
decreases, wherein the second induced voltage signal is generated by a
superimposed magnetic
field formed by the first magnetic field in step S 1, the second magnetic
field in step Sl, and a third
magnetic field, wherein the third magnetic field is generated by an eddy
current induced in the
metal component (8) to be tested; and
S3: performing a finite difference operation between the modulating signal and
the carrier
signal to obtain an original pulsed eddy current testing signal of the metal
component (8) to be
tested, wherein based on the original pulsed eddy current testing signal, a
wall thickness or defect
detection of the metal component (8) to be tested is realized by:
measuring the wall thickness of the metal component (8) by extracting a signal
feature of
1 0

a late signal attenuation rate, and
detecting a defect of the metal component (8) by performing differentiation
with a signal
of a defect-free region.
2. The carrier-type pulsed eddy current testing method according to claim 1,
wherein the
metal component (8) to be tested is a thin plate with a thickness of 2 mm to
40 mm or a pipe with
a diameter greater than 25 mm.
3. The carrier-type pulsed eddy current testing method according to claim 1,
wherein the
square wave excitation in S1 and S2 is 0.1 A to 5 A.
4. A carrier-type pulsed eddy current testing device for implementing the
method
according to any one of claims 1 to 3, comprising an external control unit,
wherein
the pulsed eddy current sensor (9) is configured to induce the induced voltage
signal when
subjected to the square wave excitation,
the external control unit is connected to the pulsed eddy current sensor (9)
and is
configured to provide the square wave excitation to the pulsed eddy current
sensor (9) and receive
the induced voltage signal from the pulsed eddy current sensor (9), and
the metal plate (7) is mounted under the pulsed eddy current sensor (9).
5. The carrier-type pulsed eddy current testing device according to claim 4,
wherein the
pulsed eddy current sensor (9) comprises a sensor cover (2), an aviation
connector (5), a driver
coil (6), a pickup coil (4), and a sensor base (3), wherein
the sensor cover (2) is mounted on the sensor base (3),
the aviation connector (5) is fixed on the sensor cover (2) and is connected
to the external
control unit, and
the driver coil (6) and the pickup coil (4) are both fixed on the sensor base
(3) and are
11

connected to the aviation connector (5).
6. The carrier-type pulsed eddy current testing device according to claim 4,
wherein the
external control unit comprises a computer (15), a main control unit (14), a
D/A conversion unit
(12), an A/D conversion unit (13), a power amplifier unit (10), and a weak
signal conditioning unit
(11), wherein
the computer (15) is connected to the main control unit (14),
the main control unit (14) is connected to the D/A conversion unit (12) and
the A/D
conversion unit (13),
the D/A conversion unit (12) is connected to the power amplifier unit (10),
the A/D conversion unit (13) is connected to the weak signal conditioning unit
(11), and
the power amplifier unit (10) and the weak signal conditioning unit (11) are
both
connected to the pulsed eddy current sensor (9), wherein
at the time of test, a square wave signal generated by the computer (15) is
transmitted to
the D/A conversion unit (12) via the main control unit (14),
the D/A conversion unit (12) converts the square wave signal into an analog
signal and
transmits it to the power amplifier unit (10),
the power amplifier unit (10) converts the analog signal into the square wave
excitation
and provides it to the pulsed eddy current sensor (9),
the pulsed eddy current sensor (9) receives the induced voltage signal due to
action of the
square wave excitation,
the weak signal conditioning unit (11) obtains the induced voltage signal,
amplifies and
filters it, and transmits it to the A/D conversion unit (13),
the A/D conversion unit (13) converts the amplified and filtered the induced
voltage
12

signal into a digital signal and transmits it to the computer (15) via the
main control unit (14), and
the computer (15) processes the digital signal to obtain relevant information.
7. The carrier-type pulsed eddy current testing device according to claim 4,
wherein the
metal plate (7) is made of a highly magnetically conductive or highly
electrically conductive
material.
8. The carrier-type pulsed eddy current testing device according to claim 4,
wherein a
thickness of the metal plate (7) is 1 mm to 20 mm.
13

Description

Note: Descriptions are shown in the official language in which they were submitted.


CARRIER-TYPE PULSED EDDY CURRENT TESTING METHOD AND DEVICE
BACKGROUND
[Technical Field]
[0001] The disclosure relates to the technical field of non-destructive
testing, and more
particularly, to a carrier-type pulsed eddy current testing method and a
carrier-type pulsed eddy
current detection device.
[Description of Related Art]
[0002] In industries such as oil and gas, chemical engineering, electricity,
and heating, during
the long-term service, metal components such as natural gas pipelines and
pressure vessels are
prone to large-area corrosion due to the influence of extreme temperature,
high pressure, and
complex external environment, as well as erosion and corrosion of the medium.
As a result,
cracking can arise and cause leakage or even explosion, which leads to huge
economic losses, and
causes great pollution and harms to the environment. The pulsed eddy current
testing technique
has the advantages of on-line testing, the ability of penetrate the cladding,
etc., and has broad
application in the detection of wall thinning of metal components. However,
due to the limitation
of acquisition accuracy, some extreme-sized metal components, such as thin
plates and small-
diameter pipes, are beyond the detection range of existing pulse eddy current
testing instruments,
which has become a major bottleneck restricting the development of this
technique.
[0003] Patent CN104849349A discloses a weld seam detection method for thin-
wall small-
diameter pipes. The method uses the combined technique of phased array
ultrasonic testing,
which can be used to detect weld seams on small-diameter pipes with wall
thicknesses greater than
or equal to 3.5 mm and less than or equal to 7 mm. The method produces no
radiation and no
pollution, besides, it is simple to operate, intuitive and easy to understand,
because the detection
-1-
CA 3089622 2020-08-05

results are displayed in the form of a three-dimensional image. Therefore, the
method is suitable
to detect weld seams on the thin-wall small-diameter pipes. However, similar
to conventional
ultrasonic testing, in this method, coupling agent is necessary during
testing, so the installation of
the sensor is much more difficult, resulting in the low testing efficiency. In
addition, this method
is not applicable to the detection of the component with coatings.
[0004] Chinese Standard GB/T 28705-2012 stipulates a pulsed eddy current
testing method for
detecting wall thinning caused by large-area corrosion without removing the
cover layer, which is
applicable to ferromagnetic components made of carbon steel and low alloy
steel with diameters
of no less than 50 mm, thicknesses of 3 mm to 65 mm and covered by insulations
with thicknesses
of 0 to 200 mm in a temperature of -150 C to 500 C. However, with regard to
thin plates with
thicknesses less than 3 mm or small-diameter pipes with diameters smaller than
50 mm, pulsed
eddy current testing signals attenuate quickly, leading to poor acquisition
accuracy. Therefore, this
method is invalid for these components.
SUMMARY
[0005] In view of the limitations of the above existing technology, the
disclosure provides a
carrier-type pulsed eddy current testing method and a carrier-type pulsed eddy
current testing
device. Specifically, a metal plate with high permeability or high
conductivity is mounted under
the pulsed eddy current sensor, named carrier plate in this patent. The pulsed
eddy current signals
are obtained by the sensor with the carrier plate. And then two signals are
respectively measured
with the metal component to be tested and without it. This method can solve
the problem that the
pulse eddy current testing signal of metal components such as thin plates and
small-diameter pipes
attenuates rapidly, so that signals of such components can be collected.
[0006] In order to achieve the above objective, an aspect of the disclosure
provides a carrier-
type pulsed eddy current testing method, including steps below.
-2-
CA 3089622 2020-08-05

[00071 Si: A metal plate is mounted under a pulsed eddy current sensor, and
square wave
excitation is applied to the pulsed eddy current sensor to receive an
attenuation curve, i.e., a carrier
signal, of an induced voltage in the pulsed eddy current sensor over time as
the square wave
excitation decreases.
[0008] S2: A metal component to be tested is placed under the pulsed eddy
current sensor
mounted with the metal plate, and square wave excitation is applied again to
the pulsed eddy
current sensor to receive an attenuation curve, i.e., a modulating signal, of
an induced voltage in
the pulsed eddy current sensor over time as the square wave excitation
decreases.
[0009] S3: The carrier signal and the modulating signal are demodulated to
obtain the pulsed
eddy current testing signal of the metal part to be tested, and based on the
original pulsed eddy
current testing signal, a wall thickness or defect detection of the metal part
to be tested can be
realized.
[0010] Preferably, the metal component to be tested is a thin plate with a
thickness of 2 mm to
40 mm or a pipe with a diameter greater than 25 mm.
[0011] Preferably, the square wave excitation in S1 and S2 is 0.1 A to 5 A.
[0012] Another aspect of the disclosure provides a carrier-type pulsed eddy
current testing
device for implementing the method, including a pulsed eddy current sensor, an
external control
unit, and a metal plate. The pulsed eddy current sensor is configured to
induce the induced
voltage when subjected to square wave excitation. The external control unit is
connected to the
pulsed eddy current sensor and is configured to provide the square wave
excitation to the pulsed
eddy current sensor and receive the induced voltage signal from the pulsed
eddy current sensor.
The metal plate is mounted under the pulsed eddy current sensor.
[0013] Preferably, the pulsed eddy current sensor includes a sensor cover, an
aviation connector,
a driver coil, a pickup coil, and a sensor base. The sensor cover is mounted
on the sensor base.
The aviation connector is fixed on the sensor cover and is connected to the
external control unit.
-3-
CA 3089622 2020-08-05

The driver coil and the pickup coil are both fixed on the sensor base and are
connected to the
aviation connector.
[0014] Preferably, the external control unit includes a computer, a main
control unit, a D/A
conversion unit, an A/D conversion unit, a power amplifier unit, and a weak
signal conditioning
unit. The computer is connected to the main control unit. The main control
unit is connected
to the D/A conversion unit and the A/D conversion unit. The D/A conversion
unit is connected
to the power amplifier unit. The A/D conversion unit is connected to the weak
signal
conditioning unit. The power amplifier unit and the weak signal conditioning
unit are both
connected to the pulsed eddy current sensor.
[0015] At the time of test, a square wave signal generated by the computer is
transmitted to the
D/A conversion unit via the main control unit. The D/A conversion unit
converts the square
wave signal into an analog signal and transmits it to the power amplifier
unit. The power
amplifier unit converts the analog signal into square wave excitation and
provides it to the pulsed
eddy current sensor. The pulsed eddy current sensor generates an induced
voltage due to action
of the square wave excitation. The weak signal conditioning unit obtains the
induced voltage
signal, amplifies and filters it, and transmits it to the A/D conversion unit.
The A/D conversion
unit converts the amplified and filtered induced voltage signal into a digital
signal and transmits
it to the computer via the main control unit. The computer processes the
digital signal to obtain
relevant information.
[0016] Preferably, the metal plate is made of a highly magnetically conductive
or highly
electrically conductive material.
[0017] Preferably, a thickness of the metal plate is 1 mm to 20 mm.
[0018] Generally, compared with the existing technology, the above technical
solutions
conceived in the disclosure mainly have the following technical advantages.
[0019] 1. In the disclosure, a metal plate is adopted to obtain a carrier
signal, and a pulsed eddy
-4-
CA 3089622 2020-08-05

current testing signal of a metal component to be tested is obtained through a
demodulation
method, which solves the problem that it is difficult to effectively collect
the signal of metal
components such as thin plates and small-diameter pipes due to excessively
rapid attenuation, and
expands the application scope of pulsed eddy current testing.
[0020] 2. The disclosure reduces the requirements for signal acquisition
precision and speed,
and thus can simplify the pulsed eddy current testing device.
[0021] 3. The disclosure adopts a highly magnetically conductive or highly
electrically
conductive material to make the metal plate, and the eddy current is
attenuated slowly in the metal
plate, which reduces the attenuation rate of the obtained signal and is
beneficial for signal
collection.
BRIEF DESCRIPTION OF THE DRAWINGS
[0022] FIG. 1 is a schematic view showing a magnetic field distribution at the
time of pulsed
eddy current testing according to an embodiment of the disclosure.
[0023] FIG. 2 is an overall structural view showing a carrier-type pulsed eddy
current testing
device according to an embodiment of the disclosure.
[0024] FIG. 3 is a schematic structural view showing a pulsed eddy current
sensor according to
an embodiment of the disclosure.
[0025] FIG. 4 is a waveform diagram showing a carrier signal and a modulating
signal when a
small-diameter pipe is tested according to an embodiment of the disclosure.
[0026] FIG. 5 is diagram showing a waveform of an pulsed eddy current testing
signal of a
small-diameter pipe measured in an embodiment of the disclosure and a
comparison waveform.
[0027] In all the drawings, the same reference numerals are used to denote the
same elements
or structures: 1- screw, 2- sensor cover, 3- sensor base, 4- pickup coil, 5-
aviation connector, 6-
driver coil, 7- metal plate, 8- metal component to be tested, 9- pulsed eddy
current sensor, 10-
-5-
CA 3089622 2020-08-05

power amplifier unit, 11- weak signal conditioning unit, 12- D/A conversion
unit , 13- AID
conversion unit, 14- main control unit, 15-computer.
DESCRIPTION OF THE EMBODIMENTS
[0028] To provide a further understanding of the objectives, technical
solutions, and advantages
of the disclosure, the disclosure will be further described in detail below
with reference to the
accompanying drawings and the embodiments. It should be understood that the
specific
embodiments described herein are only used to interpret the disclosure and are
not intended to
limit the disclosure. In addition, the technical features involved in the
various embodiments of
the disclosure described below can be combined with each other as long as
there is no conflict
with each other.
[0029] A carrier-type pulsed eddy current testing method provided in an
embodiment of the
disclosure includes the following steps.
[0030] Si: A metal plate 7 is mounted under a pulsed eddy current sensor 9,
and square wave
excitation is applied to a driver coil 6 in the pulsed eddy current sensor 9.
The excitation current
generates a changing magnetic field in space, as shown in FIG. 1. Thus, an
eddy current is
induced in the metal plate 7, and the eddy current also generates a
corresponding magnetic field.
The above two magnetic fields form a superimposed magnetic field, and a pickup
coil 4 receives
an attenuation curve, i.e., a carrier signal, of the induced voltage generated
by the superimposed
magnetic field over time as the square wave excitation decreases.
[0031] S2: A metal component 8 to be tested is placed under the pulsed eddy
current sensor 9
mounted with the metal plate 7, and square wave excitation is applied to the
driver coil 6. The
excitation current generates a changing magnetic field in space. eddy currents
are induced in
both the metal plate 7 and the metal component 8 to be tested, and the eddy
currents also generate
corresponding magnetic fields. The magnetic fields of the driver coil 6, the
metal plate 7, and
-6-
CA 3089622 2020-08-05

=
the metal component 8 to be tested together form a superimposed magnetic
field. The pickup
coil 4 receives an attenuation curve, i.e., a modulating signal, of the
induced voltage generated by
the superimposed magnetic field over time as the square wave excitation
decreases.
[0032] S3: A finite difference operation is performed between the obtained
modulating signal
and the obtained carrier signal (i.e. using the obtained modulating signal to
minus the obtained
carrier signal) for demodulation to obtain an original pulsed eddy current
testing signal of the
metal component 8 to be tested, and based on the original pulsed eddy current
testing signal, a
wall thickness or defect detection of the metal component 8 to be tested can
be realized.
Specifically, wall thickness measurement can be realized by extracting the
signal feature of the
late signal attenuation rate, and a component defect can be detected by
performing differentiation
with the signal of a defect-free region.
[0033] Specifically, the square wave excitation is 0.1 A to 5 A, and the
applicable metal
component 8 to be tested is a thin plate with a thickness of 2 mm to 40 mm or
a pipe with a
diameter greater than 25 mm.
[0034] The above method is implemented by a carrier-type pulsed eddy current
testing device,
which includes a pulsed eddy current sensor 9, a metal plate 7, and an
external control unit.
[0035] As shown in FIG. 3, the pulsed eddy current sensor 9 includes a sensor
cover 2, an
aviation connector 5, a driver coil 6, a pickup coil 4, and a sensor base 3.
The sensor cover 2 is
fixed on the sensor base 3 by screws I. The aviation connector 5 is mounted in
a mounting hole
of the sensor cover 2 and is connected to the external control unit. The
driver coil 6 and the
pickup coil 4 are both located inside the sensor base 3, are positioned by a
mandrel, and are
connected to the aviation connector 5. The lower part of the sensor base 3 is
provided with a
slot, and the metal plate 7 is mounted under the sensor base 3 through the
slot.
[0036] As shown in FIG. 2, the external control unit includes a computer 15, a
main control unit
14, a D/A conversion unit 12, an AID conversion unit 13, a power amplifier
unit 10, and a weak
signal conditioning unit 11. The computer 15 is connected to the main control
unit 14. The
-7-
CA 3089622 2022-11-24

=
main control unit 14 is connected to the D/A conversion unit 12 and the A/D
conversion unit 13.
The D/A conversion unit 12 is connected to the power amplifier unit 10. The
A/D conversion
unit 13 is connected to the weak signal conditioning unit 11. The power
amplifier unit 10 and
the weak signal conditioning unit 11 are both connected to the pulsed eddy
current sensor 9.
[0037] At the time of test, a square wave signal generated by the computer 15
is transmitted to
the D/A conversion unit 12 via the main control unit 14 through the USB
protocol. The D/A
conversion unit 12 converts the square wave signal into an analog signal and
transmits it to the
power amplifier unit 10. The power amplifier unit 10 converts the analog
signal into square wave
excitation and provides it to the pulsed eddy current sensor 9. Due to the
action of the square
wave excitation, the pulsed eddy current sensor 9 generates an induced
voltage. The weak signal
conditioning unit 11 obtains the induced voltage signal, amplifies and filters
it, and transmits it to
the A/D conversion unit 13. The A/D conversion unit 13 converts the amplified
and filtered
induced voltage signal into a digital signal and transmits it to the computer
15 via the main control
unit 14. The computer 15 processes the digital signal to obtain relevant
information.
[0038] Further, the metal plate 7 is made of a highly magnetically conductive
or highly
electrically conductive material, such as #45 steel or aluminum, and the
thickness of the metal
plate 7 is 1 mm to 20 mm.
[0039] A specific example will be described below.
[0040] Example 1
[0041] A pulsed eddy current testing signal of a small-diameter pipe made of
304 stainless steel,
with an outer diameter of 50 mm and a wall thickness of 10 mm, was obtained
through the above
device, and the adopted metal plate was an aluminum plate with a thickness of
6 mm.
[0042] The aluminum plate was mounted under the pulsed eddy current sensor,
and square wave
excitation was applied to obtain a carrier signal. Then, the small-diameter
pipe was placed under
the pulsed eddy current sensor mounted with the aluminum plate, and square
wave excitation was
-8-
CA 3089622 2020-08-05

applied to obtain a modulating signal. The obtained carrier signal and the
obtained modulating
signal are as shown in FIG. 4, where the vertical axis represents the induced
voltage (V), and the
horizontal axis represents the time (s).
[0043] Differentiation was performed on the carrier signal and the modulating
signal to obtain
a modulated/demodulated signal, i.e., the pulsed eddy current testing signal
of the small-diameter
pipe, as shown in FIG. 5, where the vertical axis represents the induced
voltage (V), and the
horizontal axis represents the time (s). Meanwhile, FIG. 5 also shows an
original signal of the
small-diameter pipe obtained by the pulsed eddy current sensor without the
metal plate. It is
shown that due to the limitation of the acquisition speed of the device, the
early signal could not
be accurately obtained, and its attenuation pattern deviated greatly from the
theory. In contrast,
the signal obtained by the method of the disclosure basically conforms to the
theoretical
attenuation law and can be used for subsequent defect or wall thickness
analysis.
[0044] Those skilled in the art can easily understand that the above is only a
preferred
embodiment of the disclosure and is not intended to limit the disclosure. Any
modification,
equivalent replacement, and improvement made within the spirit and principle
of the disclosure
should be included in the protection scope of the disclosure.
-9-
CA 3089622 2020-08-05

Representative Drawing
A single figure which represents the drawing illustrating the invention.
Administrative Status

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Event History

Description Date
Maintenance Fee Payment Determined Compliant 2024-09-24
Maintenance Request Received 2024-09-24
Inactive: Office letter 2024-03-28
Inactive: Grant downloaded 2023-09-01
Inactive: Grant downloaded 2023-09-01
Letter Sent 2023-08-29
Grant by Issuance 2023-08-29
Inactive: Cover page published 2023-08-28
Inactive: Final fee received 2023-06-22
Pre-grant 2023-06-22
Inactive: Office letter 2023-04-14
Letter Sent 2023-04-05
Notice of Allowance is Issued 2023-04-05
Inactive: Approved for allowance (AFA) 2023-02-27
Inactive: Q2 passed 2023-02-27
Amendment Received - Voluntary Amendment 2022-11-24
Amendment Received - Response to Examiner's Requisition 2022-11-24
Inactive: Report - QC passed 2022-05-31
Amendment Received - Response to Examiner's Requisition 2021-12-10
Amendment Received - Voluntary Amendment 2021-12-10
Examiner's Report 2021-09-02
Inactive: Report - No QC 2021-08-18
Inactive: Cover page published 2021-02-12
Inactive: First IPC assigned 2021-01-28
Inactive: IPC assigned 2021-01-28
Application Published (Open to Public Inspection) 2021-01-17
Inactive: IPC removed 2020-12-31
Letter Sent 2020-11-24
Inactive: Single transfer 2020-11-10
Common Representative Appointed 2020-11-07
Inactive: IPC assigned 2020-09-30
Inactive: First IPC assigned 2020-09-30
Letter sent 2020-09-02
Application Received - PCT 2020-09-01
Letter Sent 2020-09-01
Priority Claim Requirements Determined Compliant 2020-09-01
Request for Priority Received 2020-09-01
Inactive: QC images - Scanning 2020-08-05
Request for Examination Requirements Determined Compliant 2020-08-05
All Requirements for Examination Determined Compliant 2020-08-05
Small Entity Declaration Determined Compliant 2020-08-05
National Entry Requirements Determined Compliant 2020-08-05

Abandonment History

There is no abandonment history.

Maintenance Fee

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Fee History

Fee Type Anniversary Year Due Date Paid Date
Request for examination - small 2024-10-17 2020-08-05
Basic national fee - small 2020-08-05 2020-08-05
Registration of a document 2020-11-10
MF (application, 2nd anniv.) - small 02 2021-10-18 2021-09-03
MF (application, 3rd anniv.) - small 03 2022-10-17 2022-10-11
Final fee - small 2020-08-05 2023-06-22
MF (patent, 4th anniv.) - small 2023-10-17 2023-10-16
MF (patent, 5th anniv.) - small 2024-10-17 2024-09-24
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Past Owners on Record
XINJUN WU
YUN SONG
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Representative drawing 2023-08-15 1 8
Description 2020-08-04 9 402
Abstract 2020-08-04 1 30
Claims 2020-08-04 3 106
Drawings 2020-08-04 4 60
Claims 2021-12-09 3 111
Description 2022-11-23 9 554
Claims 2022-11-23 4 177
Confirmation of electronic submission 2024-09-23 1 63
Courtesy - Office Letter 2024-03-27 2 189
Courtesy - Acknowledgement of Request for Examination 2020-08-31 1 432
Courtesy - Letter Acknowledging PCT National Phase Entry 2020-09-01 1 592
Courtesy - Certificate of registration (related document(s)) 2020-11-23 1 365
Commissioner's Notice - Application Found Allowable 2023-04-04 1 580
Final fee 2023-06-21 1 34
Electronic Grant Certificate 2023-08-28 1 2,527
Non published application 2020-08-04 6 127
Amendment / response to report 2020-08-04 7 245
Examiner requisition 2021-09-01 3 145
Amendment / response to report 2021-12-09 8 283
Examiner requisition 2022-07-31 4 236
Amendment / response to report 2022-11-23 12 382
Courtesy - Office Letter 2023-04-13 1 158