Language selection

Search

Patent 2426124 Summary

Third-party information liability

Some of the information on this Web page has been provided by external sources. The Government of Canada is not responsible for the accuracy, reliability or currency of the information supplied by external sources. Users wishing to rely upon this information should consult directly with the source of the information. Content provided by external sources is not subject to official languages, privacy and accessibility requirements.

Claims and Abstract availability

Any discrepancies in the text and image of the Claims and Abstract are due to differing posting times. Text of the Claims and Abstract are posted:

  • At the time the application is open to public inspection;
  • At the time of issue of the patent (grant).
(12) Patent Application: (11) CA 2426124
(54) English Title: USE OF METALLIC TREATMENT ON COPPER FOIL TO PRODUCE FINE LINES AND REPLACE OXIDE PROCESS IN PRINTED CIRCUIT BOARD PRODUCTION
(54) French Title: UTILISATION DU TRAITEMENT METALLIQUE SUR DES FEUILLES DE CUIVRE AFIN DE PRODUIRE DES LIGNES FINES ET DE REMPLACER LE TRAITEMENT A L'OXYDE DANS LA FABRICATION DE PLAQUETTES DE CIRCUITS IMPRIMES
Status: Dead
Bibliographic Data
(51) International Patent Classification (IPC):
  • H05K 3/06 (2006.01)
  • H05K 3/24 (2006.01)
  • H05K 3/38 (2006.01)
(72) Inventors :
  • ANDRESAKIS, JOHN A. (United States of America)
(73) Owners :
  • OAK-MITSUI INC. (United States of America)
(71) Applicants :
  • OAK-MITSUI INC. (United States of America)
(74) Agent: GOWLING LAFLEUR HENDERSON LLP
(74) Associate agent:
(45) Issued:
(86) PCT Filing Date: 2001-10-17
(87) Open to Public Inspection: 2002-05-02
Examination requested: 2006-09-01
Availability of licence: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): Yes
(86) PCT Filing Number: PCT/US2001/032400
(87) International Publication Number: WO2002/035897
(85) National Entry: 2003-04-15

(30) Application Priority Data:
Application No. Country/Territory Date
09/697,614 United States of America 2000-10-26

Abstracts

English Abstract




The invention relates to the manufacture of printed circuit boards having
enhanced etch uniformity and resolution. The process eliminates the need for a
black oxide treatment to improve adhesion and improves the ability to
optically inspect the printed circuit boards. The process is performed by
conducting steps (a) and (b) in either order: a) depositing a first surface of
an electrically conductive layer onto a substrate, which electrically
conductive layer has a roughened second surface opposite to the first surface;
b) depositing a thin metal layer onto the roughened second surface of the
electrically conductive layer, which metal layer comprises a material having a
different etch resistance property than that of the electrically conductive
layer. Thereafter one deposits a photoresist onto the metal layer; imagewise
exposes and develops the photoresist, thereby revealing underlying portions of
the metal layer. The one removes the revealed underlying portions of the metal
layer, thereby revealing underlying portions of the conductive layer and
removes the revealed underlying portions of the conductive layer, to thereby
produce a printed circuit layer.


French Abstract

L'invention concerne la fabrication de plaquettes de circuits imprimés présentant une uniformité et une résolution de gravure améliorées. Le procédé selon l'invention s'affranchit du traitement à l'oxyde noir destiné à améliorer l'adhérence, et facilite l'inspection visuelle des plaquettes de circuits imprimés. Ledit procédé est mis en oeuvre par réalisation des étapes (a) et (b) dans un ordre quelconque, l'étape (a) consistant à déposer une première surface d'une couche électroconductrice sur un substrat, ladite couche électroconductrice présentant une deuxième surface rugueuse opposée à la première, et l'étape (b) consistant à déposer une fine couche métallique sur la deuxième surface rugueuse de la couche électroconductrice, ladite couche métallique contenant un matériau présentant des propriétés de résistance à la gravure différentes de celles de la couche électroconductrice. Ensuite, on dépose une photorésine sur la couche métallique, on expose la photorésine image par image et on développe ladite photorésine, révélant ainsi des parties sous-jacentes de la couche métallique. Puis on retire les parties sous-jacentes révélées de la couche métallique, révélant ainsi des parties sous-jacentes de la couche conductrice, et on retire les parties sous-jacentes révélées de la couche conductrice de manière à produire une couche de circuits imprimés.

Claims

Note: Claims are shown in the official language in which they were submitted.



What is claimed is:

1. A process for producing a printed circuit layer comprising conducting steps
(a) and (b) in either order:
a) depositing a first surface of an electrically conductive layer onto a
substrate,
which electrically conductive layer has a roughened second surface opposite to
the first surface;
b) depositing a thin metal layer onto the roughened second surface of the
electrically conductive layer, which metal layer comprises a material having a
different etch resistance property than that of the electrically conductive
layer;
and then
c) depositing a photoresist onto the metal layer;
d) imagewise exposing and developing the photoresist, thereby revealing
underlying portions of the metal layer;
e) removing the revealed underlying portions of the metal layer, thereby
revealing underlying portions of the conductive layer; and
f) removing the revealed underlying portions of the conductive layer, to
thereby produce a printed circuit layer.

2. The process of claim 1 wherein step a) is conducted and then step b) is
conducted.

3. The process of claim 1 wherein step b) is conducted and then step a) is
conducted.

4. The process of claim 1 wherein step a) is conducted by first roughening the
second surface of the electrically conductive layer, then treating with a
second
metal, and then depositing the first surface of the electrically conductive
layer
onto the substrate.

17



5. The process of claim 1 wherein step a) is conducted by first roughening the
second surface of the electrically conductive layer and then depositing the
first
surface of the electrically conductive layer onto the substrate.

6. The process of claim 1 wherein step a) is conducted by first depositing the
first surface of the electrically conductive layer onto the substrate and then
roughening the second surface of the electrically conductive layer.

7. The process of claim 1 wherein the roughened second surface of the
electrically conductive layer has an average roughness (Ra) value that ranges
from about 1 to about 10 microns.

8. The process of claim 1 wherein the roughened second surface of the
electrically conductive layer comprises micro-nodules of a metal or metal
alloy
on or in the roughened second surface.

9. The process of claim 1 wherein the roughened second surface of the
electrically conductive layer is micro-etched.

10. A process for producing a composite which comprises repeating steps a)
through f) of claim 1 at least once to thereby produce a plurality of printed
circuit layers and then subsequently attaching the printed circuit layers to
each
other via at least one intermediate stratum thus forming a printed circuit
board.

11. The process of claim 1 further comprising the step of removing any
remaining photoresist after step (e).

12. The process of claim 1 further comprising the step of removing any
remaining photoresist after step (f).

18



13. The process of claim 1 wherein the electrically conductive layer comprises
an electrically conductive foil.

14. The process of claim 1 wherein the metal layer comprises a metal foil.

15. The process of claim 1 wherein the conductive layer comprises a material
selected from the group consisting of copper , brass, stainless steel,
aluminum,
nickel and alloys and combinations thereof.

16. The process of claim 1 wherein the conductive layer is a copper foil.

17. The process of claim 1 wherein the conductive layer is laminated onto the
substrate.

18. The process of claim 1 wherein the conductive layer is deposited onto the
substrate by electrolytic or electroless deposition.

19. The process of claim 1 wherein the conductive layer is deposited onto the
substrate by coating, sputtering, or evaporation.

20. The process of claim 1 wherein the metal layer comprises a material
selected from the group consisting of nickel, tin, palladium, platinum,
chromium, molybdenum, titanium and alloys and combinations thereof

21. The process of claim 1 wherein the metal layer comprises nickel.

22. The process of claim 1 wherein the metal layer comprises tin.

19


23. The process of claim 1 wherein the metal layer is laminated onto the
conductive layer.

24. The process of claim 1 wherein the metal layer is deposited onto the
conductive layer by either electrolytic or electroless deposition techniques.

25. The process of claim 1 wherein the metal layer is deposited onto the
conductive layer by coating, sputtering, or evaporation.

26. The process of claim 1 wherein the revealed portions of the metal layer
are
removed by acid etching.

27. The process of claim 1 wherein the revealed portions of the conductive
layer are removed by alkaline etching.

28. The process of claim 1 wherein the revealed portions of the metal layer
and the underlying portions of the conductive layer are simultaneously
removed by acid etching.

29. The process of claim 1 wherein the substrate comprises a polymer film.

30. The process of claim 1 wherein the substrate comprises a polyimide,
polyester, or liquid crystal polymer film.

31. The process of claim 1 wherein the substrate comprises a reinforced
polymer.



32. The process of claim 1 wherein the substrate comprises a reinforced
polymer which comprises an epoxy, polyimide, cyanate ester, BT-Epoxy or
combinations thereof.

33. The process of claim 1 wherein the substrate comprises a reinforced
polymer wherein the reinforcement comprises fiberglass or an organic paper.

34. A printed circuit layer produced by the process of conducting steps a) and
b) in either order:
a) depositing a first surface of an electrically conductive layer onto a
substrate,
which electrically conductive layer has a roughened second surface opposite to
the first surface;
b) depositing a thin metal layer onto the roughened second surface of the
electrically conductive layer, which metal layer comprises a material having a
different etch resistance property than that of the electrically conductive
layer;
and then
c) depositing a photoresist onto the metal layer;
d) imagewise exposing and developing the photoresist, thereby revealing
underlying portions of the metal layer;
e) removing the revealed underlying portions of the metal layer, thereby
revealing underlying portions of the conductive layer; and
f) removing the revealed underlying portions of the conductive layer.

35. The printed circuit layer of claim 34 wherein the electrically conductive
layer comprises an electrically conductive foil

36. The printed circuit layer of claim 34 wherein the metal layer comprises a
metal foil.

21




37. The printed circuit layer of claim 34 wherein the conductive layer
comprises a
material selected from the group consisting of copper , brass, stainless
steel,
aluminum, nickel and alloys and combinations thereof .

38. The printed circuit layer of claim 34 wherein the conductive layer
comprises a
copper foil.

39. The printed circuit layer of claim 34 wherein the metal layer comprises a
material
selected from the group consisting of nickel, tin, palladium, platinum,
chromium,
molybdenum, titanium and alloys and combinations thereof .

40. The printed circuit layer of claim 34 wherein the metal layer comprises
nickel.

41. The printed circuit layer of claim 34 wherein the metal layer comprises
tin.

42. The printed circuit layer of claim 34 wherein the substrate comprises a
semiconductor.

43. The printed circuit layer of claim 34 wherein the substrate comprises
gallium
arsenide, silicon, compositions containing silicon and combinations thereof.

22


Description

Note: Descriptions are shown in the official language in which they were submitted.



CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
USE OF METALLIC TREATMENT ON COPPER FOIL TO PRODUCE
FINE LINES AND REPLACE OXIDE PROCESS IN PRINTED CIRCUIT
BOARD PRODUCTION
s
BACKGROUND OF THE INVENTION
FIELD OF THE INVENTION
The present invention relates to the manufacture of printed circuit boards
1 o having enhanced etch uniformity and resolution. The process of this
invention
eliminates the need for a black oxide treatment to improve adhesion and
improves the ability to optically inspect the printed circuit boards.
DESCRIPTION OF THE RELATED ART
15 Printed circuit boards have wide application in the field of electronics.
They
are useful for large scale applications, such as in missiles and industrial
control
equipment, as well as in small scale devices, such as telephones, radios and .
personal computers. In particular, when utilizing printed circuits it is
important that a high degree of accuracy and resolution is attained for very
20 small line and space widths (on the order of one hundred microns or less)
to
ensure good performance of the circuit.
The ability to produce accurate features having very small dimensions, on the
order of one hundred microns or less, is extremely important in the production
25 of small and large scale equipment. The precision of the etching process
becomes more important as the circuit patterns become ever smaller. It is well
known in the art to use known photolithographic techniques to produce printed
circuit boards having small features with high accuracy. In general, an
electrically conductive foil is deposited onto a substrate and a photoresist
is


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
then deposited onto the foil. That photoresist is then imagewise exposed and
developed, forming a pattern of small lines and spaces that are then etched
into
the conductive foil.
s Conventionally a matte side of a foil is laminated onto the substrate,
mainly
because the matte side of the foil is rougher and has better adhesion to the
substrate than the shiny side of the foil. However, it has been found that by
laminating the foil with the shiny side down against the substrate that much
more accurate etching could be achieved because the copper grains are
elongated and oriented vertically near the matte side and less side or
horizontal
etching occurs. In addition, there is less of a need to over etch to remove
the
tooth structure and treatment from the substrate, which results in better etch
uniformity.
15 When laminating the shiny side of the foil onto a substrate, it is
necessary to
roughen the surface to provide sufficient adhesion. One method to accomplish
this is to plate nodules to the shiny side of a copper foil. An example of
this
type of copper product is commercially available from Oak-Mitsui Inc., of
Hoosick Falls, N.Y. as MLS. Another method that has been used is to deposit
2o roughening layers, such as nodules, on each side of the foil, forming
"double
treated" foils. With this process one gets superior resist adhesion, as well
as
the elimination of the oxide process. This has not been preferred in the
industry because the exposed side of the foil may have the roughening layer
damaged during handling.
When the matte side is against the laminate another known method of
roughening the shiny layer is a process in which a copper foil is pre-
roughened
by chemical micro etching (using sodium persulfate or sulfuric acid/hydrogen
peroxide which are available from MacDermid of Waterbury CT or Shipley
2


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
Ronel of Marborough MA) or pumice scrubbing (machines available from LS
of Italy and Isioki of Japan) . The surface is later chemically treated to
deposit
a layer of black copper oxide (also available from MacDermid and Shipley
Ronel), allowing another insulating substrate to be laminated over the
circuit.
This sequence of chemical treatments is undesirable because it is cumbersome
and introduces waste disposal problems with the chemicals used. Therefore,
there is a need in the art for a process that does not have the problems of
double treating a conductive foil and which does not need a black oxide
treatment during the processing of multi-layer circuit boards, that will etch
circuit lines and spaces with high resolution and accuracy.
Efforts are continuously being made in the art to improve techniques by which
circuit boards are manufactured and thus the accuracy of these features. For
example, see U.S. patent 5,240,807 which teaches a photoresist article having
~ 5 a portable, conformable, built-on etch mask useful for enhancing image
contrast and reproducing parts having very small dimensions. Portions of a
conductive foil underlying the photoresist are selectively etched to form a
pattern of circuit lines. Another approach is disclosed in U.S. patent
6,042,711
which provides a metal foil with improved peel strength having a metal layer
of a dusty dendritic deposit and a metal flash layer. Additionally,
International
Publication WO 00/03568 discloses a method of forming circuit lines on a
substrate by applying a roughened conductive metal layer using a copper foil
carrier.
In yet another approach, U.S. patent 5,679,230 provides a copper foil for use
in
the manufacture of printed circuit boards. This copper foil can be used to
make multilayer circuit boards without requiring the conventional black oxide
treatment to improve adhesion.


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
The present invention provides an approach to solving the problems of the
prior art wherein a thin metal layer is deposited onto a conductive layer on a
substrate. This metal layer acts as an etch mask during etching of the
conductive layer, and improves etch accuracy and resolution. After etching,
this thin metal layer remains on the conductive layer obviating the need for
an
oxide layer.
The metal layers employed in this process are also highly uniform and
reflective, making the printed circuits formed thereby more compatible with
automatic optical inspection equipment than printed circuits of the prior art.
Further, the metal layers used herein have high mechanical strength, and are
highly resistant to mechanical damage, such as surface scratches and scuff
marks.
15 SUMMARY OF THE INVENTION
The invention provides a process for producing a printed circuit layer
comprising conducting steps (a) and (b) in either order:
a) depositing a first surface of an electrically conductive layer onto a
substrate,
which electrically conductive layer has a roughened second surface opposite to
2o the first surface;
b) depositing a thin metal layer onto the roughened second surface of the
electrically conductive layer, which metal layer comprises a material having a
different etch resistance property than that of the electrically conductive
layer;
and then
25 c) depositing a photoresist onto the metal layer;
d) imagewise exposing and developing the photoresist, thereby revealing
underlying portions of the metal layer;
e) removing the revealed underlying portions of the metal layer, thereby
revealing underlying portions of the conductive layer; and


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
f) removing the revealed underlying portions of the conductive layer, to
thereby produce a printed circuit layer.
The invention also provides a printed circuit layer produced by the process of
conducting steps a) and b) in either order:
a) depositing a first surface of an electrically conductive layer onto a
substrate,
which electrically conductive layer has a roughened second surface opposite to
the first surface;
b) depositing a thin metal layer onto the roughened second surface of the
1 o electrically conductive layer, which metal layer comprises a material
having a
different etch resistance property than that of the electrically conductive
layer;
and then
c) depositing a photoresist onto the metal layer;
d) imagewise exposing and developing the photoresist, thereby revealing
t 5 underlying portions of the metal layer;
e) removing the revealed underlying portions of the metal layer, thereby
revealing underlying portions of the conductive layer; and
f) removing the revealed underlying portions of the conductive layer.
2o DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
The invention broadly provides a process for producing a printed circuit layer
and printed circuit board.
The first step in conducting the process of the present invention is to
deposit a
25 layer of an electrically conductive material onto a suitable substrate.
Typical
substrates are those suitable to be processed into a printed circuit or other
microelectronic device. Suitable substrates for the present invention non-
exclusively include polymers reinforced with materials such as fiberglass,
aramid (Kevlar), aramid paper (Thermount), polybenzoxolate paper or


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
combinations thereof. Of these epoxy with fiberglass reinforcement is the
most preferred substrate. Also suitable are semiconductor materials such as
gallium arsenide (GaAs), silicon and compositions containing silicon such as
crystalline silicon, polysilicon, amorphous silicon, epitaxial silicon, and
silicon
dioxide (Si02) and mixtures thereof. The preferred thickness of the substrate
is of from about 10 to about 200 microns, more preferably from about 10 to
about 50 microns.
The conductive layer preferably comprises a material such as copper, zinc,
l0 brass, chrome, , nickel, aluminum, stainless steel, iron, gold, silver,
titanium
and combinations and alloys thereof. Most preferably, the conductive layer is
a copper foil.
Copper foils are preferably produced by electrodepositing copper from
solution onto a rotating metal drum. The side of the foil next to the drum is
typically the smooth or shiny side, while the other side has a relatively
rough
surface, also known as the matte side. This drum is usually made of stainless
steel or titanium which acts as a cathode and receives the copper as it is
deposited from solution. An anode is generally constructed from a lead alloy.
A cell voltage of about 5 to 10 volts is applied between the anode and the
cathode to cause the copper to be deposited, while oxygen is evolved at the
anode. This copper foil is then removed from the drum, cut to the required
size, and laminated onto the substrate. Lamination is preferably conducted in
a press at a minimum of about l 75°C, for about 30 minutes. Preferably,
the
press is under a vacuum of at least 28 inches of mercury, and maintained at a
pressure of about 150 psi.
Preferably but not necessarily prior to lamination, the conductive foil is
preferably, but not necessarily, electrolytically treated on the shiny side to
form
6


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
a roughening copper deposit, and electrolytically treated on the matte side to
deposit micro nodules of a metal or alloy. These nodules are preferably copper
or a copper alloy, and do not add roughness to the surface, but do increase
adhesion to a substrate. The surface microstructure of the foil is measured by
a
profilometer, such as a Perthometer model M4P or SSP which is commercially
available from Mahr Feinpruef Corporation of Cincinnati, Ohio. Topography
measurements of the surface grain structure of peaks and valleys are made
according to industry standard IPC-TM-650 Section 2.2.17 of the Institute for
Interconnecting and Packaging Circuits of 2115 Sanders Road, Northbrook,
Illinois 60062. In the measurement procedure, a measurement length Im over
the sample surface is selected. Rz defined as the average maximum peak to
valley height of five consecutive sampling lengths within the measurement
length Im (where Io is Im/5). Rt is the maximum roughness depth and is the
greatest perpendicular distance between the highest peak and the lowest valley
within the measurement length Im. Rp is the maximum leveling depth and is
the height of the highest peak within the measuring length Im. Ra, or average
roughness, is defined as the arithmetic average value of all absolute
distances
of the roughness profile from the center line within the measuring length Im.
The parameters of importance for this invention are Rz and Ra. The surface
treatments carried out produce a surface structure having peaks and valleys,
which produce roughness parameters wherein Ra ranges from about 1 to about
10 microns and Rz ranges from about 2 to about 10 microns.
The surface treatments carried out produce a surface structure having peaks
and valleys, on the shiny side, which produce roughness parameters wherein
Ra ranges from about 1 to about 4 microns, preferably from about 2 to about 4
microns, and most preferably from about 3 to about 4 microns. The Rz value


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
ranges from about 2 to about 4.5 microns, preferably from about 2.5 to about
4.5 microns, and more preferably from about 3 to about 4.5 microns.
The surface treatments carried out produce a surface structure having peaks
and valleys, on the matte side, which produce roughness parameters wherein
Ra ranges from about 4 to about 10 microns, preferably from about 4.5 to
about 8 microns, and most preferably from about 5 to about 7.5 microns. The
Rz value ranges from about 4 to about 10 microns, preferably from about 4 to
about 9 microns, and more preferably from about 4 to about 7.5 microns.
Preferably, the shiny side has a copper deposit about 2 to 4.5 ~,m thick to
produce an average roughness (Rz) of 2 ~m or greater. The matte side
preferably will have a roughness Rz as made of about 4-7.5 Vim. The micro
nodules of metal or alloy will have a size of about 0.5 Vim. Other metals may
be deposited as micro nodules if desired, for example, zinc, indium, tin,
cobalt,
brass, bronze and the like. This process is more thoroughly described in U.S.
patent 5,679,230, which is incorporated herein by reference. The shiny
surface has a peel strength ranging from about .7 kg/linear cm to about 1.6
kg/linear, preferably from about .9 kg/linear cm to about 1.6 kg/linear.
2o The matte surface has a peel strength ranging from about .9 kg/linear cm to
about 2 kg/linear, preferably from about 1.1 kg/linear cm to about 2
kg/linear.
Peel strength is measured according to industry standard IPC-TM-650 Section
2.4.8 Revision C.
The conductive layer preferably has a thickness of from about 0.5 to about 200
microns, more preferably from about 9 to about 70 microns. The conductive
layer may also be applied using any other well known method of metal
deposition such as electroless deposition, coating, sputtering, evaporation or
by lamination onto the substrate.
8


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
Also preferably but not necessarily prior to lamination, the foil is
preferably,
but not necessarily, electrolytically treated on either side with, a thin
metal
layer. This metal layer is preferably electrolytically deposited onto the
conductive layer. The metal layer may also be deposited onto the conductive
layer (after laminating to the substrate) by coating, sputtering, evaporation
or
by lamination onto the conductive layer. Preferably the metal layer is a thin
film and comprises a material selected such as nickel, tin, palladium
platinum,
chromium, titanium, molybdenum or alloys thereof. Most preferably the
1 o metal layer comprises nickel or tin. The metal layer preferably has a
thickness
of from about .O1 to about 10 microns, more preferably from about .2 to about
3 microns. This metal layer will serve as an etch mask to define a pattern of
circuit lines and spaces to be etched into the conductive layer.
~ 5 Once the metal layer is deposited onto the conductive layer, the next step
is to
selectively etch away portions of the metal layer, forming an etched pattern
in
the metal layer. This etched pattern is formed by well known
photolithographic techniques using a photoresist composition.. First, a
photoresist deposited directly onto the thin metal layer. The photoresist
2o composition may be positive working or negative working and is generally
commercially available. The resist can be very thin (5 to 20 microns) since
it's
main function is to only define the thin metal layer and does not need to
withstand severe etch conditions. This allows much greater resolution.
Suitable positive working photoresists are well known in the art and may
25 comprise an o-quinone diazide radiation sensitizer. The o-quinone diazide
sensitizers include the o-quinone-4-or-5-sulfonyl-diazides disclosed in U. S.
Patents Nos. 2,797,213; 3,106,465; 3,148,983; 3,130,047; 3,201,329;
3,785,825; and 3,802,885. When o-quinone diazides are used, preferred
binding resins include a water insoluble, aqueous alkaline soluble or
swellable
9


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
binding resin, which is preferably a novolak. Suitable positive
photodielectric
resins may be obtained commercially, for example, under the trade name of
AZ-P4620 from Clariant Corporation of Somerville, New Jersey as well as
Shipley I-line photoresist. Negative photoresists are also widely commercially
available.
The photoresist is then imagewise exposed to actinic radiation such as light
in
the visible, ultraviolet or infrared regions of the spectrum through a mask,
or
scanned by an electron beam, ion or neutron beam or X-ray radiation. Actinic
radiation may be in the form of incoherent light or coherent light, for
example,
light from a laser. The photoresist is then imagewise developed using a
suitable solvent, such as an aqueous alkaline solution, thereby revealing
underlying portions of the metal layer.
Subsequently, the revealed underlying portions of the metal layer are removed
through well known etching techniques while not removing the portions
underlying the remaining photoresist. Suitable etchants non-exclusively
include acidic solutions, such as cupric chloride (preferable for etching of
nickel) or nitric acid (preferable for etching of tin). Also preferred are
ferric
2o chloride or sulfuric peroxide (hydrogen peroxide with sulfuric acid).
During
this step, the portions of the conductive layer underlying the etched off
portions of the metal layer are revealed. This patterned metal layer defines
an
excellent quality etch mask for etching the conductive layer with high
accuracy
and precision.
Next, the revealed underlying portions of the conductive layer are removed by
etching while not removing the portions of the conductive layer underlying the
non-removed portions of the metal layer. Suitable etchants for removing the
conductive layer non-exclusively include alkaline solutions, such as


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
ammonium chloride/ammonium hydroxide. This circuit board may then be
rinsed and dried. The result is a printed circuit board having excellent
resolution and uniformity, and having excellent performance.
In another preferred embodiment wherein the metal layer comprises nickel, a
one pass etching process may be conducted. In this embodiment, after the
photoresist has been imaged and developed, each of the revealed portions of
the metal layer and the underlying electrically conductive layer may be etched
in a cupric chloride etcher. For etching of other metal layers, including Tin,
the appropriate etchant is unable to properly etch the underlying conductive
foil and a second etching step is still required. This single etching step is
preferred for etching lines or spaces of greater than about 3 mils. When a
single etching step is used, it may also be necessary to increase the dwell
time
in the etcher by possibly 10'to 25% depending on the etch system. .Higher
spray pressures and temperature may accomplish the same results.
After the circuit lines and spaces are etched through the metal layer and the
conductive layer, the remaining photoresist can optionally be removed from
the metal layer surface either by stripping with a suitable solvent or by
asking
by well known asking techniques. The photoresist may also be removed after
2o etching the metal layer, but prior to etching the conductive foil.
In a preferred asking process, plasma is generated in a microwave plasma
generator located upstream of a stripping chamber and stripping gases pass
through this generator so that reactive species produced from the gases in the
plasma enter the stripping chamber. Plasma ions are removed such as by
filtering from plasma radicals. The term "radical", as used herein is intended
to define uncharged particles such as atoms or molecular fragments which are
generated by the upstream plasma generator. The plasma generator may
comprise any plasma generator known in the art. Plasma generators which are


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
capable of providing a source of radicals, substantially without ions or
electrons, are described, for example, in U.S. patent 5,174,856 and U.S.
patent
5,200,031, the disclosures of which are hereby incorporated by reference.
While any type of conventionally generated plasma may, in general, be used in
the practice of the invention, preferably the plasma used is generated by a
microwave plasma generator such as, for example, a Model AURA plasma
generator commercially available from the GaSonics of San Jose, Cali~
Another upstream plasma generator which is capable of supplying a source of
radicals in the substantial absence of electrons and/or ions is commercially
available from Applied Materials, Inc. as an Advanced Strip Passivation (ASP)
Chamber. Plasma ashers are also commercially available from Mattson
Technology of Fremont, California. Ashing may also be performed in an
anisotropic method through the use of in situ ashing in an etch chamber such
as a TEL DRM 85, available from Tokyo Electron Ltd.
At this point, another insulating substrate may be laminated over the circuit
without an additional roughening step and without black oxide treatment of the
matte side of the foil. The thin metal layer does not need to be removed after
etching and acts as an oxide replacement and supplies enough adhesion to
form a multilayer structure. Also, the metal layer is more uniform and
reflective than a conductive foil alone and is easily inspected using well
known automatic optical inspection (AOI) equipment.
The following non-limiting examples serve to illustrate the invention.
EXAMPLE 1
A copper foil is treated on the shiny with copper nodules and a Zn-Cr barrier
layer is applied. The matte side is also treated with nodules but is
subsequently
12


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
treated with nickel. The foil is laminated to an epoxy impregnated fiberglass
(with the shiny side against the material) to form a substrate. A liquid
photoresist is applied to the substrate to a thickness of 12 microns and
exposed
with UV light through a mask to from an image. The photoresist is developed
using potassium carbonate, exposing the nickel surface. The nickel is
removed using a cupric chloride etch, exposing the copper underneath. The
copper is etched using an ammonia based system to define the traces. The
photoresist removed using a sodium hydroxide solution. Holes are punched in
the perimeter of the substrate based on the image pattern. These will be used
to for registration. The traces are inspected using an automatic optical
inspection
machine and repaired if necessary (and allowed). The completed substrate
with etched traces (core) is laminated between epoxy fiberglass with other
cores (if required) with copper foil on the outside. This printed circuit
board
"blank" is drilled, external circuitry defined, and completed by putting on
soldermask and solder. The finished board is tested and then assembled.
RY 0 MPT F 7
Example 1 is repeated except the matte side of the laminate is against the
substrate and is treated with Zn-Cr. The shiny side has nodules plated as in
Example 1 but is treated with nickel.
EXAMPLE 3
Example 2 is repeated except the shiny surface is roughened by microetching
prior to the nickel treatment.
13


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
EXAMPLE 4
Example 2 is repeated except the shiny side is roughened by pumice
scrubbing prior to nickel treatment.
EXAMPLE 5
Example 1 is repeated except the photoresist is of a permanent nature and is
not removed after etching.
to
rv n r ~rr~T r c
Example 1 is repeated except etching is done in one step with cupric chloride.
I5 EXAMPLE 7
Example 1 is repeated except the photoresist is exposed using a direct laser
imaging system.
2o EXAMPLE 8
Example 1 is repeated except tin is plated in place of nickel and etching is
done using nitric acid.
2s EXAMPLE 9
Copper foils are produced by electrodepositing copper from solution onto a
rotating metal drum according to Example I of U.S. patent 3,293,109. Copper
is dissolved in sulfuric acid and then electrodeposited in a solution of 70-
105
14


CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
g/L of copper as copper sulfate, 80-160 g/L of free sulfuric acid, at 40 -60
degrees C. The solution is brought into contact with a rotating metal dram,
usually of titanium, which acts as a cathode and receives the copper as it is
deposited from solution. The anode is constructed from a lead alloy. A cell
voltage of about 5 to 10 volts is applied between the anode and the cathode to
cause the copper to be deposited, while oxygen is evolved at the anode.
Copper builds up a continuous film of copper on the drum at a thickness of
from about 18 to 70 Vim, which is removed, slit to the required width and
finally wound in rolls. The side of the foil next to the drum is smooth (the
to "shiny side") while the other side has a relatively rough surface (the
"matte
side").
Samples of the copper foil are treated on either of the shiny or matte sides
to
produce surface nodules according to U.S. patent 5,679,230. Other samples of
the copper foil are microetched with cupric chloride on either of the shiny or
matte sides. Samples of the copper are measured for surface roughness and
peel strength. Surface roughness is measured according to IPC-TM-650
Section 2.2.17 and peel strength is measured according to IPC-TM-650
Section 2.4.8 Revision C. The following results are noted:
Copper Treatment Surface Peel Strength*
Foil Roughness
Side (Ra in microns) (kg/ linear cm)
Shiny None 0.25 <0.18


Shiny Micro-etch 1.20 0.39


Shiny Nodules 3.56 1.52


Matte None 5.08 0.63


Matte Micro-etch 5.72 0.93


3o Matte Nodules 7.60 1.91




CA 02426124 2003-04-15
WO 02/035897 PCT/USO1/32400
* Peel strength was determined by laminating the copper to an epoxy prepreg.
This simulates the peel strength inside the finished circuit board.
While the present invention has been particularly shown and described with
reference to preferred embodiments, it will be readily appreciated by those of
ordinary skill in the art that various changes and modifications may be made
without departing from the spirit and scope of the invention. It is intended
that
the claims be interpreted to cover the disclosed embodiment, those
alternatives
1o which have been discussed above and all equivalents thereto.
16

Representative Drawing

Sorry, the representative drawing for patent document number 2426124 was not found.

Administrative Status

For a clearer understanding of the status of the application/patent presented on this page, the site Disclaimer , as well as the definitions for Patent , Administrative Status , Maintenance Fee  and Payment History  should be consulted.

Administrative Status

Title Date
Forecasted Issue Date Unavailable
(86) PCT Filing Date 2001-10-17
(87) PCT Publication Date 2002-05-02
(85) National Entry 2003-04-15
Examination Requested 2006-09-01
Dead Application 2011-10-17

Abandonment History

Abandonment Date Reason Reinstatement Date
2010-09-30 R30(2) - Failure to Respond
2010-09-30 R29 - Failure to Respond
2010-10-18 FAILURE TO PAY APPLICATION MAINTENANCE FEE

Payment History

Fee Type Anniversary Year Due Date Amount Paid Paid Date
Registration of a document - section 124 $100.00 2003-04-15
Application Fee $300.00 2003-04-15
Maintenance Fee - Application - New Act 2 2003-10-17 $100.00 2003-10-03
Maintenance Fee - Application - New Act 3 2004-10-18 $100.00 2004-07-28
Maintenance Fee - Application - New Act 4 2005-10-17 $100.00 2005-09-15
Maintenance Fee - Application - New Act 5 2006-10-17 $200.00 2006-07-25
Request for Examination $800.00 2006-09-01
Maintenance Fee - Application - New Act 6 2007-10-17 $200.00 2007-09-27
Maintenance Fee - Application - New Act 7 2008-10-17 $200.00 2008-08-21
Maintenance Fee - Application - New Act 8 2009-10-19 $200.00 2009-10-05
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
OAK-MITSUI INC.
Past Owners on Record
ANDRESAKIS, JOHN A.
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

To view selected files, please enter reCAPTCHA code :



To view images, click a link in the Document Description column. To download the documents, select one or more checkboxes in the first column and then click the "Download Selected in PDF format (Zip Archive)" or the "Download Selected as Single PDF" button.

List of published and non-published patent-specific documents on the CPD .

If you have any difficulty accessing content, you can call the Client Service Centre at 1-866-997-1936 or send them an e-mail at CIPO Client Service Centre.


Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Claims 2006-09-01 5 157
Abstract 2003-04-15 1 64
Claims 2003-04-15 6 172
Description 2003-04-15 16 603
Cover Page 2003-07-21 1 44
Prosecution-Amendment 2006-09-01 2 57
Fees 2004-07-28 1 35
Fees 2005-09-15 1 32
PCT 2003-04-15 4 130
Assignment 2003-04-15 3 81
Assignment 2003-05-20 3 147
PCT 2003-05-20 6 297
Correspondence 2003-07-15 1 26
Assignment 2003-08-07 1 30
PCT 2003-04-16 5 275
Fees 2003-10-03 1 35
Fees 2006-07-25 1 42
Prosecution-Amendment 2006-09-01 6 192
Fees 2007-09-27 1 54
Fees 2008-08-21 1 43
Prosecution-Amendment 2010-03-30 4 134
Fees 2009-10-05 1 48