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Patent 2452600 Summary

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(12) Patent: (11) CA 2452600
(54) English Title: HOLOGRAPHIC OPTICAL ELEMENT
(54) French Title: ELEMENT OPTIQUE HOLOGRAPHIQUE
Status: Deemed expired
Bibliographic Data
(51) International Patent Classification (IPC):
  • G02B 5/32 (2006.01)
  • G01B 11/00 (2006.01)
  • G01B 11/10 (2006.01)
  • G01B 11/24 (2006.01)
  • G01C 3/00 (2006.01)
(72) Inventors :
  • STUDER, URS-PETER (Switzerland)
  • KAESER, BEDA (Switzerland)
(73) Owners :
  • ZUMBACH ELECTRONIC AG (Switzerland)
(71) Applicants :
  • ZUMBACH ELECTRONIC AG (Switzerland)
(74) Agent: NORTON ROSE FULBRIGHT CANADA LLP/S.E.N.C.R.L., S.R.L.
(74) Associate agent:
(45) Issued: 2012-05-15
(22) Filed Date: 2003-12-08
(41) Open to Public Inspection: 2004-06-09
Examination requested: 2008-11-12
Availability of licence: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): No

(30) Application Priority Data:
Application No. Country/Territory Date
02027560.8 European Patent Office (EPO) 2002-12-09
03026493.1 European Patent Office (EPO) 2003-11-21

Abstracts

English Abstract

A holographic optical element is provided for measuring the dimension and position of an object with aid of a deflected laser beam generated by a monochromatic and coherent laser light source that sweeps across an angular range to produce a fan-shaped reference wave front. The element includes at least two interference patterns. Each interference pattern is created through simultaneous exposure of the element to the fan-shaped reference wave front generated by the monochromatic and coherent laser light source and a parallel partial wave front generated by the same monochromatic and coherent laser light source and hitting the element at a different angle than the reference wave front. The number of parallel partial wave fronts used for the exposure of the element corresponds to the number of interference patterns, and if the parallel partial wave fronts are virtually extended through the holographic optical element, they intersect behind the element in a center of a measuring field.


French Abstract

La présente invention concerne un élément optique holographique pour mesure les dimensions et la position d'un objet à l'aide d'un faisceau laser dévié généré par une source de lumière laser cohérente et monochromatique balayant une gamme d'écarts angulaires afin de produire un front d'onde de référence en forme d'éventail. L'élément comprend au moins deux diagrammes d'interférence, chacun étant créé par l'exposition simultanée de l'élément au front d'onde de référence en éventail généré par la source de lumière laser cohérente et monochromatique, ainsi qu'à un front d'onde partiel parallèle généré par la même source de lumière laser et touchant l'élément à un autre angle que celui du front d'onde de référence. Le nombre de fronts d'onde partiels utilisé pour exposer l'élément correspond au nombre de diagrammes d'interférence, et si les fronts d'onde partiels parallèles se prolongent virtuellement à travers l'élément optique holographique, ils se croisent derrière l'élément au centre d'un champ de mesure.

Claims

Note: Claims are shown in the official language in which they were submitted.





Embodiments of the invention in which an exclusive property or privilege is
claimed are defined as follows:


1. A holographic optical element for measuring at least one of the
dimension and position of an object with aid of a deflected laser beam
generated by a monochromatic and coherent laser light source that sweeps
across an angular range to produce a fan-shaped reference wave front, the
element comprising:
at least two interference patterns, wherein each interference pattern is
created through simultaneous exposure of the element to the fan-shaped
reference wave front generated by the monochromatic and coherent laser
light source and a parallel partial wave front generated by the same
monochromatic and coherent laser light source and hitting the element at a
different angle than the reference wave front, wherein the number of parallel
partial wave fronts used for the exposure of the element corresponds to the
number of interference patterns, and wherein if the parallel partial wave
fronts
are virtually extended through the holographic optical element, they intersect

behind the element in a center of a measuring field.


2. The element of claim 1, wherein the at least two interference patterns
comprises at least three different interference patterns.


3. The element of claim 2, wherein the at least two parallel partial wave
fronts are all located in a single plane.


4. The element of claim 3, wherein an angle between the reference wave
front and a common plane for the parallel partial wave fronts is 40 to 500 and

a bisector of the angle is positioned perpendicular on a plane in which the
holographic optical element lies.



12




5. The element of claim 1, wherein the element includes a plurality of
sections, and each section has a respective one of the interference patterns
and the sections are spatially separated from another section.


6. The element of claim 1, wherein the at least two interference patterns
at least partially overlap one another.


7. A measuring arrangement, comprising a transmitting part for
generating a laser beam and a receiving part, wherein both parts include a
holographic optical element and the holographic optical element of at least
the
transmitting part comprises the holographic optical element according to claim

1, said arrangement being adapted to be used to measure at least one of the
dimension and position of an object with the aid of the laser beam, which is
deflected so that it sweeps across a specific angular range.


8. The arrangement of claim 7, wherein each holographic optical element
is a holographic film plate.


9. A method of measuring at least one of a dimension and position of a
given element with a laser beam that sweeps across a specific angular range,
comprising utilizing the holographic optical element of any one of claims 1 to

6.


10. The method according to claim 9, wherein the given element comprises
one of a cable, profile, and a pipe.


11. A device for measuring at least one of the dimension and position of an
object, the device comprising:
a transmitter part for generating a monochromatic light beam and a
receiver part, wherein the transmitter part and the receiver part each include
a
holographic optical element, wherein the transmitter part includes means for


13




deflecting the light beam in the transmitter part through an angular region
onto
the holographic optical element in the transmitter part, and wherein at least
one of said holographic elements comprises the holographic optical element
according to any one of claims 1 to 6.


12. A method of measuring at least one of a dimension and a position of an
object located in a measuring field, comprising:
projecting a fan-shaped reference wave onto a holographic optical
element located in front of the measuring field, the holographic optical
element having a first interference pattern and a second interference pattern;
forming with the first interference pattern a first parallel partial wave
front from the fan-shaped reference wave, the first parallel partial wave
front
entering the measuring field and contacting the object;
forming with the second interference pattern a second parallel partial
wave front from the fan-shaped reference wave, the second parallel partial
wave front entering the measuring field and contacting the object;
receiving the first parallel partial wave front and the second parallel
partial wave front with at least one optoelectronic converter located behind
the
measuring field; and
determining the at least one of dimension and position of the object
based on the first parallel partial wave front and the second parallel partial

wave front received by the at least one optoelectronic converter.


13. The method of claim 12, wherein the first parallel partial wave front and
the second parallel partial wave front intersect in a center point of the
measuring field.


14. The method of claim 12, further comprising generating a laser beam with
a monochromatic and coherent light source; and deflecting the laser beam to
form the fan-shaped reference wave.



14




15. The method of claim 12, wherein the first parallel partial wave front and
the second parallel partial wave front are located in a common plane.


16. The method of claim 15, wherein the fan-shaped reference wave is
located in a second plane, and the second plane is angled with respect to the
common plane by an angle of between 40° and 50°.


17. The method of claim 12, wherein forming the first parallel partial wave
front comprises deflecting the first parallel partial wave front at a first
angle
with respect to the fan-shaped reference wave; and forming the second
parallel partial wave front comprises deflecting the second parallel partial
wave front at a second angle with respect to the fan-shaped reference wave.

18. The method of claim 12, further comprising forming a third parallel
partial
wave front from the fan-shaped reference wave using a third interference
pattern located on the holographic optical element, the third parallel partial

wave front entering the measuring field, wherein the third parallel partial
wave
front intersects the first parallel partial wave front and the second parallel

partial wave front in the measuring field.


19. The method of claim 12, further comprising measuring an amount of time
the first parallel partial wave front is interrupted by the object; and
measuring
an amount of time the second parallel partial wave front is interrupted by the

object.


20. The method of claim 12, further comprising deflecting the first parallel
partial wave front onto the at least one receiver using a first additional
interference pattern located on a second holographic optical element; and
deflecting the second parallel partial wave front onto the at least one
receiver
using a second additional interference pattern located on the second
holographic optical element.



15




21. The method of claim 12, wherein the first interference pattern and the
second interference pattern are separate from one another.


22. The method of claim 12, wherein the first interference pattern at least
partially overlaps the second interference pattern.


23. The method of claim 12, wherein the holographic optical element
comprises a holographic film plate.


24. The method of claim 12, wherein the object comprises one of a cable and
a pipe.


25. A method of making a measuring device for measuring at least one of a
dimension and position of an object, comprising:
making a holographic optical element, comprising:
generating a fan-shaped reference wave using a
monochromatic and coherent laser light source and projecting the fan-
shaped reference wave onto the holographic optical element;
generating a first parallel partial wave front from the
monochromatic and coherent laser light source and projecting the first
parallel partial wave front onto the holographic optical element at a
different angle than the fan-shaped reference wave to form a first
interference pattern on the holographic optical element; and
generating a second parallel partial wave front from the
monochromatic and coherent laser light source and projecting the
second parallel partial wave front onto the holographic optical element
at a different angle than the fan-shaped reference wave to form a
second interference pattern on the holographic optical element;



16




wherein virtual extensions of the first parallel partial wave front
and the second parallel partial wave front intersect one another at an
intersection point;
providing a laser light source in the measuring device in front of the
holographic optical element, the laser light source positioned to project a
fan-
shaped reference wave onto the first interference pattern and the second
interference pattern; and
providing at least one optoelectronic converter in the measuring device
behind the holographic optical element, the at least one optoelectronic
converter positioned to receive at least some light transmitted by the first
interference pattern and the second interference pattern.


26. The method of claim 25, wherein generating the first parallel partial wave

front comprises projecting the fan-shaped reference wave onto a first beam
splitter; and generating the second parallel partial wave front comprises
projecting the fan-shaped reference wave onto a second beam splitter.


27. The method of claim 25, further comprising generating a third parallel
partial wave front from the monochromatic and coherent laser light source and
projecting the third parallel partial wave front onto the holographic optical
element at a different angle than the fan-shaped reference wave to form a
third interference pattern on the holographic optical element, wherein virtual

extensions of the first parallel partial wave front, the second parallel
partial
wave front, and the third parallel partial wave front intersect one another at
the
intersection point.


28. The method of claim 25, wherein the first parallel partial wave front and
the second parallel partial wave front are located in a common plane.


29. The method of claim 25, wherein the holographic optical element
comprises a holographic film plate.



17




30. The method of claim 25, wherein the first interference pattern and the
second interference pattern are separate from one another.


31. The method of claim 25, wherein the first interference pattern at least
partially overlaps the second interference pattern.



18

Description

Note: Descriptions are shown in the official language in which they were submitted.


CA 02452600 2003-12-08
HOLOGRAPHIC OPTICAL ELEMENT
BACKGROUND OF THE INVENTION
The present invention relates to a holographic optical element for
measuring the dimension and position of an object with the aid of a deflected
light beam that sweeps across a specific angular range, the element having
an interference pattern in one section which can be created in a manner
known per se through simultaneous exposure to a fan-shaped reference wave
front, generated by a monochromatic and coherent laser light source, and a
parallel wave front that is also generated by the same monochromatic,
coherent laser light source, but hits the element at a different angle than
the
reference wave front, as well as through the subsequent development.
For the purpose of this document, a holographic optical element of this
type is henceforth referred to as an HOE.
A special holographic laboratory is generally required in order to
produce an HOE. The equipment by and large corresponds to that of a photo
laboratory, with the exception that only monochromatic, coherent laser light
is
used. Film plates (coated glass plates) are used to produce holograms and,
in particular an HOE. These plates are exposed to selected wave fronts and
are subsequently developed, depending on the film base that is used.
An HOE of this type is described, among other things, in European
Patent Application No. EP-A 0 245 19g. This reference also contains detailed
instructions for producing an HOE used in a device and with a method for
generating light beams for measuring the dimension andlor position of an
object in the deflection displacement region of this light beam:
If the HOE, produced as described in the above, is exposed to a
suitable laser reference wave front, then the other wave front used during the
picture taking is correspondingly reconstructed.
With the above-mentioned device, the object to be measured, in
particular a cable or the like, can be measured only in one direction.
1

CA 02452600 2003-12-08
SUMMARY OF THE INVENTION
1t is an object of the present invention to provide a holographic optical
element which can be used to determine several parameters of the object to
be measured.
The above and other objects are accomplished according to the
invention by the provision of a holographic optical element for measuring at
least one of the dimension and position of an object with aid of a deflected
laser beam generated by a .monochromatic and coherent laser light source
that sweeps across an angular range to produce a fan-shaped reference
wave front, the element comprising: at least two interference patterns,
wherein each interference pattern is created through simultaneous exposure
of the element to the fan-shaped reference wave front generated by the
monochromatic and coherent laser light source and a parallel partial wave
front generated by the same monochromatic and coherent laser light source
and hitting the element at a different angle than the reference wave front,
wherein the number of parallel partial wave fronts used for the exposure of
the
element corresponds to the number of interference patterns, and wherein if
the parallel partial wave fronts are virtually extended through the
holographic
optical element, they intersect behind the element in a center of a measuring
field.
The HOE according to the invention thus comprises at least two
different interference patterns which are present in a specific region of the
HOE. According to the invention, the interference patterns may be allocated
respectively to spatially separate sections, or may at least partially overlap
one another in one section. The type and design of these sections will be
explained in further detail in the following.
To produce the HOE according to our invention, the number of partial
wave fronts used during the exposure corresponds to the number of
interference patterns. The partial wave fronts are generated by the same
laser light source and their course is such that when virtually extended
2

CA 02452600 2003-12-08
through the holographic optical element, they intersect in one point andlor
one
region behind the element.
According to one preferred embodiment, the HOE according to the
invention has 3 or more (meaning 4, 5, 6, ...) interference patterns.
If the HOE created in this way is exposed to a suitable laser reference
wave front, then the other wave fronts used during the picture taking are
correspondingly reconstructed. Thus, with a suitable selection and
arrangement it is possible to generate an almost optional number of wave
fronts with a defined reference wave front.
In contrast to conventional optical elements, for example lenses,,
prisms and mirrors, which can reproduce only a single image through
refraction or reflection of light, the HOE is based on the diffraction
principle,
thus making it possible to generate several independent images with a
suitable film structure. A precondition for this, however, is the use of
monochromatic laser light which should have the same wave length as the
wave length for the laser light used during the picture taking.
The HOE according to our invention makes it possible to measure the
object to be measured in a device in several directions and thus be able to
determine not only the thickness in one direction when measuring cables, for
example, as is the case with the known device. By making it possible to take
measurements in several directions, it is also possible to measure other
parameters than the diameter, wherein these other parameters include, for
example, the non-roundness of a cable.
According to one preferred embodiment, the parallel partial wave fronts
used for exposing the HOE according to the invention are all located in one
plane. For the exposure, the angle between the reference wave front and the
joint plane for the parallel partial wave fronts is preferably 40° to
50° and, in
particular, approximately 45°, wherein the bisector of this angle in
particular is
positioned perpendicular on the plane of the holographic optical element.
According to another preferred embodiment, the HOE according to the
invention comprises separate andlor spatially separated sections with
3

CA 02452600 2003-12-08
respectively one interference pattern, wherein these interference patterns are
different. In other words, the first section comprises the first interference
pattern, the second section the second interference pattern and the third
section comprises the third interference pattern and so forth.
The sections with the different interference patterns, however, can also
spatially overlap on the HOE, at least in some regions, or can coincide
completely. Thus, an HOE according to the invention can have a single
section which comprises three superimposed interference patterns. In other
words, the aforementioned section represents a super-imposition of three
sections with separate interference patterns. Also possible are mixed forms
where the aforementioned sections overlap only in part.
The HOE according to the invention can be a component of a device
for detecting a dimension andlor position of an object, wherein this object
can
be a cable, a profile or a pipe leaving an extruder. A device of this type is
known and normally comprises a transmitter part and a receiver part. A light
beam is generated in the transmitter part, which is deflected such that it
sweeps over a specific angular range. The HOE according to the invention in
this case can be inserted into the transmitting part as well as the receiving
part or into both, depending on the problem definition. Of course, these HOEs
must be matched to each other. It is furthermore possible to install the HOE
according to the invention in either the transmitter part or the receiver part
and
to use an HOE of the known type in the other part. An HOE of this type
preferably is a holographic film plate.
The HOE according to the invention not only can be used in a device
as described in the above, but for all purposes where wave fronts are
generated as a result of diffraction on the HOE. However, the HOE according
to the invention is preferably used for measuring the dimension and position
of an object, in particular a cable or a pipe, with the aid of a deflected
laser
beam that sweeps over a specific angular range.
4

CA 02452600 2003-12-08
BRIEF DESCRIPTION OF THE DRAWINGS
The invention is explained in further detail in the following with the aid
of Figs., which show in:
Fig. 1 A schematic view of the front of a known device according to
EP-B 0 245 198 for determining the dimension and position of an object.
Fig. 2 A view from above of the known device shown in Fig. 1.
Fig. 3 A perspective basic view, showing the creationJexposure of an
HOE according to the invention.
Fig. 4 A perspective view of the exposure of the HOE according to
Fig. 3 with a deflected laser beam.
Fig. 5a A schematic view from above of a complete measuring system
for measuring a cable with an HOE having three separate sections with
respectively different interference patterns.
Fig. 5b A schematic view from the side of the system shown in Fig. 5a.
Fig. 6a A view from the top that approximately corresponds to Fig. 5a,
wherein the regions v~rith interference patterns of the HOE according to the
invention are not spatially separated and/or arranged separately.
Fig. 6b A side view of Fig. 6a.
Fig. 7 A schematic view from the tap of a measuring system where
two HOEs according to the invention are used, which are arranged at an
angle of approximately 90° to each other.
DETAILED DESCRIPTION OF THE INVENTION
Figs. 1 and 2 show a device for detecting a dimension andlor the
position of an object S1, indicated with dash-dot line in these Figs., such as
a
cable or pipe leaving an extruder. Features known from prior art are
otherwise provided with reference numbers having a capital S in front. For
example, the Figs. 1 and 2 are taken from European Patent Application No.
EP-B1 0 245 198, wherein the reference numbers are supplemented with the
aforementioned letter S. These two Figs. are provided for an easier
understanding of the options for using the HOE according to the invention.
5

CA 02452600 2003-12-08
The measuring device shown in Fig. 1 comprises a transmitting part
S2, which is used to generate a telecentric light beam in the measuring range.
A laser source S3 is provided which guides a continuous, monochromatic light
beam over a mirror S4 to a spherical expansion optic S5 from which the
expanded beam enters a cylindrical expansion optic S6. A flat light beam is
thus generated for which the plane extends parallel to the longitudinal axis
of
the object to be measured. This is indicated in Figs. 1 and 2 in that the
light
beam S7 has a very narrow width in the region of object S1 in the projection
according to Fig. 1, but has a certain width in the projection according to
Fig.
2. An expansion of this type, however, is not absolutely necessary. The
desired dimension can also be detected with a non-expanded light beam.
The light beam S7 is then transmitted via additional deflection mirrors
S8 and S9 onto an octagonal rotating mirror S10. When this mirror turns in a
clockwise direction, the entering light beam is periodically deflected from
the
top toward the bottom over an angular range indicated in Fig. 1 with dashed
lines. In the process, the beam hits a holographic optical element (HOE) S11.
This HOE, which has a very thin optically effective layer and is located on an
optically transparent carrier, is connected to a prism body S12 and is thus
mechanically stabilized. A partial radiation share of the Ot" order S7o
penetrates the HOE S11 without being diffracted and hits the front wall S13 of
the transmitter S2 housing from the inside. However, the main share of the
entering beam S7 is diffracted and leaves the HOE as beam of the 1S' order
S7~ under a specific angle. This beam is reflected on a totally reflecting or
mirrored surface S14 of the prism body S12 and is projected through a
window S15 into the measuring range. One or several optoelectronic
converters S16 can be arranged at the point where the exiting beam of the Ot"
order S7o impinges. On the opposite side of the measuring region, the beam
S7~ passes through a window S15 and enters the housing for a receiver S17,
which contains a prism body S18 that is designed to correspond to the prism
body S12 with an HOE S19 that corresponds to the HOE S11. The entering
light beam is projected by the reflecting surface S20 of the prism body S18
6

CA 02452600 2003-12-08
onto the HOE S19, which always projects the beam onto an optoefectronic
converter S21, for example a photoelectric cell.
With the periodic deflection of the telecentric beam around the
deflection displacement, delimited by the dashed lines in Fig. 1, the beam
travels to the converter S21 as long as it is not blanked out by the object
S1.
The dimension and the position of object S1 can be determined based on the
duration of the fadeout and the starting and ending point of the fadeout.
Additional instructions for calculating the required values can be found in
the
aforementioned European Patent Application No. EP-B1 0 245 198.
The HOE according to the invention is used to replace the HOE S12
shown in Fig. 1. Of course, the HOE according to the invention can also be
used in differently conFig.d devices of the same type.
The production and/or exposure of a first embodiment of an HOE
according to the invention is shown in Fig. 3 in a perspective and schematic
view that is not true to scale. A coherent wave front is generated with the
laser andlor the laser light source 1. To obtain a fan-shaped wave front, the
laser beam is focused with a lens 2 onto a pinhole mask 3. A point source is
thus created, which determines the geometric source of the reference wave
front 14.
The remaining wave fronts must be generated with the same laser
beam to meet the coherence conditions. In the process, a first deflection
occurs at the beam divider 4, which guides the deflected light beam onto the
parabolic mirror 5. The wave front reflected there is on the whole "divided"
into 3 parallel wave fronts by the beam dividers 6 and 7 that are arranged in
the beam path of the wave front reflected by the parabolic mirror 5. These
wave fronts consequently are parallel partial wave fronts.
The parallel partial wave front 16 in the center travels to a section 12 of
the HOE 10 where it generates on the HOE 10 the necessary interference
pattern and/or diffraction pattern 12' with the aid of the fan-shaped
reference
wave front 14. If the HOE 10 had only this one interference pattern 12', it
would represent an HOE as described in the prior art.
7

CA 02452600 2003-12-08
As previously explained in the above, two partial wave fronts 16 and 17
are deflected from the wave front reflected by the parabolic mirror 5 with the
aid of the beam dividers 6 and 7.
The two parallel partial wave fronts 15 and 17 on the side are beamed
with the aid of deflection mirrors 8 and 9 into the HOE sections 11 and 13 on
the side where they generate the corresponding interference patterns 11' and
13' together with the fan-shaped reference wave front 14. The optical length
of all partial wave fronts 15, 16, 17 and the reference front 14 in this case
must be the same. The holographic film plate 10 is thus exposed with the aid
of the interference patterns, generated as explained in the above, and is
subsequently developed.
The parallel partial wave fronts 15, 16 and 17 are selected andlor
deflected to the HOE 10, such that when they are virtually extended through
the HOE 10, they intersect behind this element 10 in the region/point 18 which
is positioned in the center of the future measuring field 18 of the measuring
device.
Otherwise, all three partial wave fronts 15, 16 and 17 are located in
one plane. The angle enclosed between the reference wave front 14 and this
plane is approximately 45°. The bisector of this angle is positioned
perpendicular on the plane for the HOE 10 and is thus located in the paper
plane for Fig. 3 if the HOE 10 is in this paper plane.
If a reference wave front 14 is beamed onto the HOE 10 that is
completed as described in the above, parallel wave fronts 15', 16' and 17'
that
intersect in the measuring field 18 are generated as a result of diffraction
on
the interference patterns of the corresponding HOE sections 11, 12 and 13;
as shown in Fig. 4. These wave fronts 15', 16' and 17' therefore extend in the
direction and in the plane corresponding to the previously mentioned virtual
extension of the partial wave fronts 15, 16, and 17 used for the exposure.
The HOE 10 behaves in the same way as a fan-shaped wave front if a laser
beam 21 is deflected fan-shaped by a rotating polygonal mirror 23 at the
source 3 for the reference wave front 14. If the deflected beam 14' hits the
8


CA 02452600 2003-12-08
sections 11, 12 and 13 of HOE 10, it is diffracted by the local, associated
interference pattern 25, 26, 27 in such a way that it is deflected parallel to
the
side in the measuring field after it leaves the HOE 10. The diameter of a
cable 20 can thus be determined from three different directions. The time
during which the parallel laser beam coming from one measuring direction is
interrupted therefore represents a measure for the respective diameter.
For the described HOE 10, the sections 11, 12 and 13 with the
associated interference patterns 25, 26 and 27 are spatially separated. In
other words, the HOE 10 has three separate andlor discrete sections 11, 12
and 13, wherein the measuring also occurs in three discrete axes.
Fig. 5a schematically shows a view from above of a complete
measuring system, not true to scale, while Fig. 5b shows a view from the side.
An HOE 10 according to Fig. 4 is integrated into the transmitting part of this
measuring system. The arrangement of the polygonal mirror 23 etc. also
corresponds to the one in Fig. 4, so that the same reference numbers are
used for the same parts and/or elements. Additionally shown in Fig. 5a is a
deflection mirror 19, which does not have a critical function:
However, HOE 10 is used only in the transmitting part, but not the
receiving part. An HOE 30 is used there which comprises only one section 31
with only one interference pattern 29. This HOE 30 consequently only
functions in the manner of a normal lens. If a parallel beam hits a lens, and
in
the present case the HOE 30 with the interference pattern 29, the parallel
rays
are focused in the focal point of the lens. This focal point normally lies on
the
optical axis if the parallel beam of rays also extends parallel to the optical
axis. These conditions exist for the central measuring beam 16' and the
following focusing beam path 34 up to the receiving element 35.
If the parallel beam is beamed at an angle into the HOE 30 andlor the
lens, the focal point is also displaced to the side, meaning to the axis
extending through the center of the lens or the HOE 30 and parallel to the
beam of rays. These conditions exist with the two measuring beams 15' and
9

CA 02452600 2003-12-08
17' on the side, so that the focusing beams 32 .and 36 correspondingly hit the
receivers 33 and 37 in the displaced focal points.
Since the HOE 10 in Fig. 5a has three separate and discrete sections
11, 12 and 13, the cable 20 is also measured in three discrete axes andlor
zones. With the view in Fig. 6a, which corresponds to the view in Fig. 5, the
HOE 10 of Fig. 5 is replaced with an HOE 40. This HOE 40 does not contain
separate sections and associated, separately arranged interference patterns.
Rather, this HOE 40 only contains one section with one interference pattern
28, consisting of three different interference patterns 43, 44 and 45 that
overlap. In order to create an HOE 40 of this type, the sections irradiated by
the parallel wave fronts must overlap. The HOE 40 in that case optically
behaves as if three different lens systems were nestled into each other, which
is not possible with normal lenses.
The HOE 30 in the receiver part for the embodiment shown in Fig. 6a
corresponds to the HOE 30 for the embodiment shown in Fig. 5a
The elements andlor parts shown in Figs. 6a and 6b are also given the
same reference numbers or reference characters as in Figs. 5a and 5b, but
are additionally provided with one or two apostrophes (' or ")
The use of extremely flat measuring angles, additionally shown in Fig.
6a, has the advantage that with an irregular profile a possible maximum
dimension can be clearly detected at the same time. The maximum can also
be interpolated for higher requirements.
Fig. 7 contains an additional embodiment in a view from above, shown
in a schematic representation that is not true to scale, wherein two HOEs 10,
10' are used which correspond to the HOE 10 for the embodiment shown in
Fig. 5a. However, these two HOES 10, 10' are arranged perpendicular to
each other, so that the cable 20 can be measured from two main directions
that are perpendicular to each other. For the embodiment shown in Fig. 7, the
same elements and/or parts are also given the same reference numbers or
reference characters and are provided additionally with one or two

CA 02452600 2003-12-08
apostrophes (' or "). Additional deflection mirrors 24, 24', 38 and 38' are
also
provided for practical and economic reasons.
With this embodiment, the HOEs 10, 10' have separate sections 11, 12
and 13, and 11', 12' and 13', respectively, in the transmitting part and thus
have separate interference patterns 25, 26 and 27, and 25', 26' and 27',
respectively. The HOES 30, 30', respectively have only one section and thus
one interference pattern 29. With this embodiment, cable 20 measurements
are possible for a total of 6 discrete directions andlor axes. In both HOE 10,
10' of the transmitter part, 2 x 3 separate sections are provided.
The invention has been described in detail with respect to referred
embodiments, and it will now be apparent from the foregoing to those skilled
in
the art, that changes and modifications may be made without departing from the
invention in its broader aspects, and the invention, therefore, as defined in
the
appended claims, is intended to cover all such changes and modifications that
fall within the true spirit of the invention.
11

Representative Drawing
A single figure which represents the drawing illustrating the invention.
Administrative Status

For a clearer understanding of the status of the application/patent presented on this page, the site Disclaimer , as well as the definitions for Patent , Administrative Status , Maintenance Fee  and Payment History  should be consulted.

Administrative Status

Title Date
Forecasted Issue Date 2012-05-15
(22) Filed 2003-12-08
(41) Open to Public Inspection 2004-06-09
Examination Requested 2008-11-12
(45) Issued 2012-05-15
Deemed Expired 2014-12-08

Abandonment History

There is no abandonment history.

Payment History

Fee Type Anniversary Year Due Date Amount Paid Paid Date
Registration of a document - section 124 $100.00 2003-12-08
Application Fee $300.00 2003-12-08
Maintenance Fee - Application - New Act 2 2005-12-08 $100.00 2005-11-14
Maintenance Fee - Application - New Act 3 2006-12-08 $100.00 2006-10-24
Maintenance Fee - Application - New Act 4 2007-12-10 $100.00 2007-12-05
Maintenance Fee - Application - New Act 5 2008-12-08 $200.00 2008-11-06
Request for Examination $800.00 2008-11-12
Maintenance Fee - Application - New Act 6 2009-12-08 $200.00 2009-11-20
Maintenance Fee - Application - New Act 7 2010-12-08 $200.00 2010-11-22
Maintenance Fee - Application - New Act 8 2011-12-08 $200.00 2011-11-29
Final Fee $300.00 2012-02-28
Maintenance Fee - Patent - New Act 9 2012-12-10 $200.00 2012-11-27
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
ZUMBACH ELECTRONIC AG
Past Owners on Record
KAESER, BEDA
STUDER, URS-PETER
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Abstract 2003-12-08 1 29
Description 2003-12-08 11 595
Claims 2003-12-08 3 96
Drawings 2003-12-08 6 242
Representative Drawing 2004-03-16 1 27
Cover Page 2004-05-14 1 62
Claims 2011-03-21 7 230
Claims 2011-10-19 7 233
Representative Drawing 2012-04-17 1 28
Cover Page 2012-04-17 1 64
Correspondence 2004-01-30 1 19
Assignment 2003-12-08 3 104
Assignment 2004-08-17 2 66
Prosecution-Amendment 2008-11-26 2 69
Prosecution-Amendment 2008-11-12 1 59
Prosecution-Amendment 2010-09-20 2 45
Prosecution-Amendment 2011-03-21 9 309
Prosecution-Amendment 2011-05-04 2 40
Prosecution-Amendment 2011-10-19 5 158
Correspondence 2012-02-28 2 63