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Patent 2997335 Summary

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Claims and Abstract availability

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(12) Patent: (11) CA 2997335
(54) English Title: AUTOMATICALLY GENERATING IMAGE DATASETS FOR USE IN IMAGE RECOGNITION AND DETECTION
(54) French Title: GENERATION AUTOMATIQUE D'ENSEMBLES DE DONNEES IMAGE DESTINEE A LA RECONNAISSANCE ET LA DETECTION D'IMAGE
Status: Granted
Bibliographic Data
(51) International Patent Classification (IPC):
  • G06T 11/60 (2006.01)
  • G06V 10/00 (2022.01)
  • G06T 5/00 (2006.01)
(72) Inventors :
  • CHUNG, WONCHANG (Canada)
  • MARQUIS BOLDUC, MATHIEU (Canada)
  • DUPLESSIS, FRANCIS A. (Canada)
  • RAINY, JEFFREY (Canada)
(73) Owners :
  • SERVICENOW CANADA INC. (Canada)
(71) Applicants :
  • ELEMENT AI INC. (Canada)
(74) Agent: BCF LLP
(74) Associate agent:
(45) Issued: 2023-04-25
(22) Filed Date: 2018-03-05
(41) Open to Public Inspection: 2019-09-05
Examination requested: 2022-03-03
Availability of licence: N/A
(25) Language of filing: English

Patent Cooperation Treaty (PCT): No

(30) Application Priority Data: None

Abstracts

English Abstract

Systems and methods relating to image processing and artificial intelligence. Given a small number of defect images, a multitude of other defect images can be generated to serve as training data sets for training artificially intelligent systems to recognize and detect similar defects. Given original images showing defects, a clean image of the background of the original images is created. The defect image is then isolated from each of the original images. The characteristics of each defect image are determined and characteristics of similar defects are also determined, either from other images or from subject matter experts. Based on these characteristics of similar defects, multiple other defect images are then generated. The generated defect images are combined with the clean image to result in defect images with a suitable background. Each of the resulting images can be used in training systems in recognizing and detecting defects.


French Abstract

Des systèmes et des méthodes liés au traitement dimage et à lintelligence artificielle sont décrits. Au moyen dun petit nombre dimages de défauts, une multitude dautres images de défauts peut être générée pour servir densembles de données dentraînement de systèmes dintelligence artificielle pour reconnaître et détecter des défauts semblables. Au moyen dimages originales montrant les défauts, une image propre du fond des images originales est créée. Limage de défaut est ensuite isolée de chacune des images originales. Les caractéristiques de chaque image de défaut sont déterminées et les caractéristiques de défauts semblables sont aussi déterminées, soit à partir dautres images ou de la part dexperts en la matière. En fonction de ces caractéristiques de défauts semblables, de multiples autres images de défauts sont générées. Ces images générées sont combinées à limage propre pour produire des images de défauts comportant un fond approprié. Chacune des images produites peut être utilisée pour entraîner les systèmes à reconnaître et à détecter les défauts.

Claims

Note: Claims are shown in the official language in which they were submitted.


What is claimed is:
1. A method for image manipulation comprising:
a) capturing an original image, said original image
including a specific feature of interest and said original
image being a digital image;
b) obtaining a clean image, said clean image being an image
similar to said original image but not including said
specific feature of interest, said clean image being a
digital image and said clean image being derived from said
original image;
c) extracting a feature image from said original image,
said feature image comprising an extracted version of said
specific feature of interest from said original image;
d) determining specific characteristics of said specific
feature of interest from said feature image;
e) generating new features of interest based on said
specific characteristics determined in step d), said new
features of interest being non-existent in said original
image and said new features of interest having
characteristics similar to said specific characteristics
determined in step d);
f) generating new feature images, each of said new feature
images including at least one of said new features of
interest and said new feature images being digital images;
and
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g) combining said new feature images and said clean image
to result in at least one new image data set, said at least
one new image data set comprising at least one new digital
image derived from a combination of said new feature images
and said clean image,
wherein said at least one new image data set is used in training
artificial intelligence systems for automatic feature detection
and recognition.
2. The method according to claim 1, wherein step f) comprises
generating said new feature images based on Gaussian noise
combined with said specific characteristics determined in step
d) and with said characteristics of said new features of
interest generated in step e).
3. The method according to claim 1, wherein said original
image is a transparent image.
4. The method according to claim 1, wherein said original
image is a reflective image.
5. The method according to claim 1, wherein said specific
feature of interest is a defect in a manufacturing of a product.
6. The method according to claim 1, wherein said a least one
new image data set is used to train image processing systems.
7. The method according to claim 6, wherein said image
processing systems use machine learning.
8. The method according to claim 1, further including a step
of denoising at least one of said feature image, said new image,
and said clean image.
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9. The method according to claim 1, wherein in step e), said
characteristics similar to said specific characteristics
determined in step d) are retrieved from a database.
10. The method according to claim 1, wherein step b) comprises
selecting a section of a background of said original image, said
section of said background not including said specific feature
of interest and extracting said section of said background.
11. The method according to claim 10, wherein step b) further
comprises creating said clean image from said section of said
background, said clean image being created by tiling said
section previously extracted to result in said clean image.
12. The method according to claim 1, wherein step b) comprises
obtaining a clean image as an image of a section of a
manufactured product that does not include said specific feature
of interest.
13. The method according to claim 1, wherein step c) comprises
subtracting said clean image from said original image to result
in said feature image.
14. A method for digital image manipulation comprising:
a) capturing at least one original image of a
manufacturing defect;
b) extracting a section of a background of said at least
one original image, said section not including any pixels
showing said manufacturing defect, said original image
being a digital image;
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c) creating a clean image from said section extracted in
step b), said clean image being a digital image;
d) extracting at least one defect section from said at
least one original image, said defect section including
only pixels showing said manufacturing defect;
e) determining specific characteristics of said
manufacturing defect shown in said defect section;
f) generating images of new manufacturing defects based on
said specific characteristics determined in step e), said
new manufacturing defects being non-existent in said
original image and said new manufacturing defects having
characteristics similar to said specific characteristics
determined in step e);
g) generating new defect sections, each of said new defect
sections including at least one of said images generating
in step f); and
h) combining said new defect sections with said clean image
to result in multiple images of possible manufacturing
defects,
wherein said multiple images of possible manufacturing
defects are used in training artificial intelligence
systems for automatic feature detection and recognition.
15. The method according to claim 14, wherein step d) comprises
subtracting said clean image from said at least one original
image to result in said at least one defect section.
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16. The method according to claim 14, wherein step g) further
comprises using Gaussian noise in generating said new defect
sections.
17. The method according to claim 14, further comprising
repeating said method for said at least one original digital
image.
18. The method according to claim 14, further including
determining a location of said manufacturing defect within said
at least one original image.
19. Non-transitory computer readable media having encoded
thereon computer-readable and computer-executable instructions
that, when executed, implement a method comprising:
a) capturing an original image, said original image being a
digital image;
b) determining a location of a specific feature of interest
in said original image;
c) selecting a section of a background of said original
image, said section of said background not including said
specific feature of interest;
d) extracting said section of said background;
e) creating a clean image from said section of said
background, said clean image being created by tiling said
section extracted in step d) to result in said clean image,
said clean image being a digital image;
f) subtracting said clean image from said original image to
result in a feature image, said feature image comprising an
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extracted version of said specific feature of interest from
said original image;
g) determining specific characteristics of said specific
feature of interest from said feature image;
h) generating new features of interest based on said
specific characteristics determined in step d), said new
features of interest being non-existent in said original
image and said new features of interest having
characteristics similar to said specific characteristics
determined in step d);
i) generating new feature images, each of said ne feature
images including at least one new feature of interest; and
j) combining said new feature images and said clean image
to result in said new image data sets,
wherein said new image data sets are used in training artificial
intelligence systems for automatic feature detection and
recognition.
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Description

Note: Descriptions are shown in the official language in which they were submitted.


Attorney Docket No. 1355P002CA01
AUTOMATICALLY GENERATING IMAGE DATASETS FOR USE IN IMAGE
RECOGNITION AND DETECTION
TECHNICAL FIELD
The present invention relates to image processing and
computer vision. More specifically, the present invention
relates to the generation of image data sets that can be used in
training systems for defect detection.
BACKGROUND
The digital revolution of the past few years has led to the
use of digital technology in most areas. Automated
manufacturing has given rise to faster, more efficient machines
and better quality goods. As part of automated manufacturing,
robots and machines are now able to perform quality assurance
testing. Goods automatically manufactured can be inspected by
machines faster than a human can and with better accuracy.
However, one issue with this is that such machines need to be
properly programmed or "trained" to find defects and issues with
the manufactured goods.
Automated quality assurance testing to spot defects in
manufactured goods is a combination of using computer vision and
pattern recognition as well as artificial intelligence. In one
type of quality assurance testing, computer vision systems would
use digital cameras to inspect the relevant surfaces of
manufactured goods. Any blemishes and/or surface imperfections
would be detected and the QA system would determine if the
imperfection is a defect in the manufactured good or not. To
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determine if a defect has been found, the system would need to
be "trained" to recognize defects and this can be done by using
Al and pattern recognition to differentiate between known
defects, defects previously encountered, and a simple
imperfection. (Of course, depending on the industry, any
imperfection might be considered as a defect. As an example, in
the microprocessor manufacturing industry, any imperfection on
the manufactured die would be considered a flaw or a defect.)
To train such systems, especially when Al is being used for
pattern recognition, it is usual to provide the system with a
large number of examples of previously encountered manufacturing
defects. The system then "learns" to recognize images of
defects in much the same way that current image recognition
systems learn to recognize human faces in digital images. Thus,
since defects come in all shapes, sizes, and types, to be able
to recognize a specific type of defect, large numbers of images
of that type of defect is preferably available. These images of
that type of defect are then presented to the system as training
data. The system's logic (whether implemented as a convolutional
neural network or as some other form of artificial intelligence)
then learns to recognize that type of defect in the images.
Current systems are suitable for the above described
manufacturing methods and QA processes. However, there are some
defects that can be quite rare and, because of their rarity, not
a lot of images of these defects are available. Because of the
paucity of such images, current systems are either unable to be
trained to detect such defects or, more commonly, such systems
are improperly trained. Improperly trained systems would
therefore not recognize such defects, leading to issues with the
finished product.
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Based on the above, there is therefore a need for systems
and methods which would allow for such current systems to be
properly trained in the detection and recognition of such rare
defects.
SUMMARY
The present invention provides systems and methods relating
to image processing and artificial intelligence. Given a small
number of defect images, a multitude of other defect images can
be generated to serve as training data sets for training
artificially intelligent systems to recognize and detect similar
defects. Original images showing defects can be used to
generate training data sets. A clean image of the background of
the original images is created. The defect image is then
isolated from each of the original images. The characteristics
of each defect image are determined and characteristics of
similar defects are also determined, either from other images or
from subject matter experts. Based on these characteristics of
similar defects, multiple other defect images are then
generated. The generated defect images are combined with the
clean image to result in suitable defect images with a suitable
background. Each of the resulting images can then be used as
part of a training data set for training AT systems in
recognizing and detecting defects illustrated in images.
In one aspect, the present invention provides a method for
generating image data sets from an original image, said original
image having a specific feature of interest within said original
image, the method comprising:
a) receiving said original image;
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b) obtaining a clean image, said clean image being an image
similar to said original image but not including said
specific feature of interest;
c) subtracting said clean image from said original image to
result in a feature image, said feature image comprising an
extracted version of said specific feature of interest from
said original image;
d) determining characteristics of said specific feature of
interest from said feature image;
e) determining characteristics of features of interest
similar to said specific feature of interest;
f) generating new feature images based on characteristics
determined in steps d) and e);
g) combining said new feature images and said clean image to
result in said new image data sets;
wherein said new image data sets are used in image
recognition and detection.
In another aspect, the present invention provides a method of
generating additional digital image data sets from at least one
original digital image of a manufacturing defect, the method
comprising:
a) extracting a section of a background of said at least one
original image, said section of a background not including
any pixels showing said manufacturing defect;
b) creating a clean image from said section extracted in step
a);
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c) extracting at least one defect section from said at least
one original image, said defect section including only pixels
showing said manufacturing defect;
d) determining characteristics of said manufacturing defect
shown in said defect section;
e) generating other defect sections showing other possible
manufacturing defects based on said characteristics
determined in step d) and possible characteristics of other
manufacturing defects similar to said manufacturing defect
shown in said at least one original defect; and
f) combining said other defect sections with said clean image
to result in multiple images of possible manufacturing
defects.
Yet a further aspect of the present invention provides
computer readable media having encoded thereon computer readable
and computer executable instructions that, when executed,
implements a method for generating image data sets from an
original image, said original image having a specific feature of
interest within said original image, the method comprising:
a) receiving said original image;
b) determining a location of said specific feature of
interest in said original image;
c) selecting a section of a background of said original
image, said section of said background not including said
specific feature of interest;
d) extracting said section of said background;
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e) creating a clean image from said section of said
background, said clean image being created by tiling said
section extracted in step d) to result in said clean image;
f) subtracting said clean image from said original image to
result in a feature image, said feature image comprising an
extracted version of said specific feature of interest from
said original image;
g) determining characteristics of said specific feature of
interest from said feature image;
h) determining characteristics of features of interest
similar to said specific feature of interest;
i) generating new feature images based on characteristics
determined in steps g) and h);
j) combining said new feature images and said clean image to
result in said new image data sets;
wherein said new image data sets are used in image
recognition and detection.
BRIEF DESCRIPTION OF THE DRAWINGS
The embodiments of the present invention will now be
described by reference to the following figures, in which
identical reference numerals in different figures indicate
identical elements and in which:
FIGURE 1 is block diagram of a system which may be used to
practice the invention;
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FIGURE 2 illustrates two original images having specific
features of interest (manufacturing defects in this example);
FIGURE 3 illustrates a step in one aspect of the present
invention, that of generating a clean image from extracted
sections of the original image;
FIGURE 4 illustrates another step in one aspect of the
present invention, that of extracting the feature of interest
from the original image;
FIGURE 5 schematically shows determining characteristics of
the feature extracted in Figure 4;
FIGURE 6 schematically shows the synthesis or generation of
new feature images based on the characteristics of the
feature of interest;
FIGURE 7 shows the combination of the feature images
generated in Figure 6 with the clean image generated in
Figure 3; and
FIGURE 8 illustrates a flowchart detailing the steps in a
method of one aspect of the present invention.
DETAILED DESCRIPTION
In one aspect, the present invention provides a method for
automatically generating additional digital images for use in
training systems for automatic defect detection and recognition
from one or more original images of such defects. Referring to
Figure 1, a block diagram of a system that the invention can be
practiced on is illustrated. The system 10 has a processor 20,
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storage 30, and, preferably, a display 40. The system receives
an original image having a specific feature of interest (e.g. a
defect) and processes that original image. The specific feature
of interest is, preferably, centered, extracted, and saved as a
feature image (i.e., an image of the feature of interest). In
one implementation, a section of the background of the original
image (i.e., the background being pixels of the original image
and not including any pixels of the specific feature of
interest) is extracted. This section is then tiled and
replicated multiple times to result in a clean image of the
background.
Once the clean image has been created or obtained, and once
the feature image has been isolated, the characteristics of the
specific feature of interest are then determined.
Characteristics of similar features (i.e., similar defects) can
then be added to a list of the characteristics.
Based on these
characteristics and based on randomly generated characteristics,
images of similar features can then be generated. Once
generated, these new feature images can then be combined to
result in new images that can be used in data sets for training
Al systems in defect recognition and detection.
Referring to Figure 2, two original images of the same
manufacturing defect is illustrated. The left image is a
transparent image of the feature of interest while the right
image is a reflective image of the defect. It should be clear
that multiple images of the same defect or feature of interest
may be used as the process is similar regardless of the type of
original image used.
For clarity, the images provided as examples are for a
display unit. Transparent images, in the context of the example
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images, are images where a backlight is on and with no ambient
light. The transparent images in the Figures are in rich colors
while the reflective images look like black and white images.
It should also be clear that reflective images are those taken
with the backlight off and with ambient light reflecting on the
display. These types of images are only provided as examples
and other types of images may also be used with the present
invention.
Prior to processing the original image, the feature or the
defect in the original image can first be located within the
image and, preferably, centered within the image. Centering the
feature would simplify later processing.
Once the feature has been located and centered in the
original image, a section of the background of the original
image is then isolated and extracted (see Figure 3). The
background is the part of the original image that does not
include any pixels that display any part of the feature or
defect. As can be seen in Figure 3, a small section to the
upper right of the defect is isolated and extracted. In this
embodiment, the original image is divided into a grid and one
grid that does not cover any part of the feature of interest is
the background section to be extracted.
With the background section extracted, a gridded image is
created and the extracted section is then replicated into each
of the various grids in the gridded image. In other words, the
section is tiled across the gridded image to result in a clean
image, i.e. an image that does not include the feature or defect
but which includes the background of the original image. In
Figure 3, the clean images from the transparent and reflective
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images are on the right side of the feature while the original
images are on the left side of the Figure.
Regarding the size of the section extracted, the only
limitation is the pixel size as well as the size of the feature.
As long as the section extracted does not include any pixels
that include any part of the feature, then the section can be
used. Thus, the section extracted can be as large as necessary
or it can be as small as a single pixel.
On the subject of a clean image, the above step outlines
how a clean image can be obtained by extracting a section of the
background and then tiling that section to result in a clean
image without the defect. However, for images with a non-
uniform background, a clean image may be obtained by merely
using an image of a similar section or area of the manufactured
device that does not have the defect. As an example, if one
manufactured device has a specific defect in one part, another
instance of the same device may not have such a defect. An
image of the non-defect area of the non-defect device can then
be used as the clean image. This clean image can then be used
as outlined below.
The next step is to isolate the feature or defect from the
original image. As can be seen from Figure 4, this can be done
with the help of the clean image generated or obtained
previously. A simple image operation of subtracting the clean
image from the original image results in a feature image that
consists only of the feature or defect from the original image.
Other steps to clean up or render more clearly the feature image
(e.g. denoising the resulting feature image) may be carried out
as well. Of course, other methods for extracting or isolating
the feature or defect can also be used.
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From the feature image, the characteristics of the features
(i.e., the defects in this example) can then be determined (see
Figure 5). Accordingly, the color, shape, type of edges of the
feature (i.e., edge style), direction, the size of the feature
(relative to the pixel size in this example), as well as other
characteristics, can be found. A suitable process for
extracting specific characteristics about the feature can be
formulated by a person of skill in the art. It should be clear
that such a process may include specifically detailing the
characteristics being extracted or determined. Thus, the
characteristics may be specific to the type of original image
being used (e.g. if it is a reflective image, the color may be
"thin" such that it looks like a black and white image while an
original transparent image may have a full spectrum of available
colors) as well as the scale of the original image (e.g. if the
original image is large, then the scale of the feature may be
based on a scale different from a pixel scale). Of course, if
multiple feature images are available (i.e., multiple original
images are being used), this list of characteristics may be
lengthy with each feature image having its own list of
characteristics. For such an embodiment, all the various
characteristics from all of the multiple feature images from the
various original images are collated into a single
characteristic list. Of course, the single characteristic list
would only be compiled if all of the original images are of
features that are of the same type, class, configuration, or
even orientation as desired by the user.
The list of characteristics for the feature can be, once
compiled, added to using other known characteristics. These
other characteristics can be from a known database or from human
experts in the field. Similarly, the other characteristics may
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have been previously compiled from other source or original
images. These other characteristics are added to the list
compiled in the previous step.
With the list of characteristics compiled, the system can
then generate multiple feature images based on the
characteristics in the characteristic list. The characteristics
may be divided into a number of categories, with necessary
categories being marked as such while optional categories are
equally marked as such. The system would then select one
characteristic from each of the necessary categories and,
depending on the configuration of the system, one or more
characteristics from optional categories. These selected
characteristics would then be used as the basis for an
automatically generated feature image. Of course, the resulting
feature image would have the characteristics as selected from
the various categories. (See Figure 6) As an example from
Figure 6, a feature image generated from the list of
characteristics might have a color that is black, a free form
shape, a smooth edge, and a size that is smaller than one pixel.
It should be clear that, depending on the desired size of the
data set for training, multiple feature images can be generated.
As an example, if there are 5 necessary categories (and no
optional categories) and each category lists four different
characteristics, then, theoretically, there are a total of 4 x 4
x 4 x 4 x 4 = 1024 possible feature images that can be
generated. These various feature images would, of course, only
contain the artificially generated feature (e.g. a defect) with
the characteristics automatically selected by the system.
One option for auto-generating a feature image with
specific characteristics might be to use the original feature
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image. The feature image can be rotated to any suitable angle,
elongated, shortened, or have its shape altered appropriately.
Similarly, the feature image can have its color adjusted
appropriately or have its shape rounded or sharpened to a
suitable shape. Of course, these image adjustments can be made
with reference to the characteristics selected as noted above.
As an added randomization feature, the various feature
images may also be adjusted on the basis of random (i.e.,
Gaussian) noises. Thus, a Gaussian-based random element can be
introduced into one or more of the feature images to ensure that
not all the resulting feature images are necessarily
deterministic.
Once the various feature images have been generated, each
of the feature images can then be combined with the related
clean image (see Figure 7). Of course, if the feature image
resulted from an original image that is a transparent image, the
clean image derived from the original transparent image is used.
Similarly, if the feature image resulted from the original image
that is a reflective image, then the clean image derived from
the original reflective image is used. By combining the various
automatically generated feature images with the clean images,
the resulting new image reflects the look of the original image.
These new images (i.e., the combination of the new feature
images and the relevant clean image) can then be combined into a
new image data set. The new image data set can then be used to
train artificial intelligence system (e.g. convolutional neural
networks) for feature recognition and detection. For this
example, since the features of interest in the original images
were manufacturing defects, then the AT system can then be
trained in defect detection and recognition from digital images.
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And, of course, the original images can also be added to the
data set for such training. The resulting image data set can be
used for training other types of neural networks, image
classification software, as well as any other type of system
that operates to recognize or detect an image/object.
Similarly, the resulting image data set can be used in various
forms of machine learning or artificial intelligence.
In addition to the above, the resulting data set may also
be used to train classifier software so that certain defects
and/or images can be properly classified and/or
detected/recognized.
It should be clear that the above method can include other
well-known steps as necessary and as known to those of skill in
the art. As well, the method may be practiced on various system
and using various types of images. As an example, RGB images,
black and white, or grey scale original images may be used.
Similarly, the feature images, the clean images and the
resulting new images may be RGB, black and white, or grey scale
images as necessary.
The method detailed above can be outlined as shown in the
flowchart in Figure 8. The method begins at step 100, that of
receiving the original image at the processor. The feature of
interest (i.e. the defect in one embodiment) is then centered
and/or located within the original image (step 110). A
background section is then extracted (step 120) and this
background section is used to create a clean image (step 130).
The feature (i.e., the defect) is then extracted from the
original image (step 140) and its characteristics determined
(step 150). Additional characteristics for similar features can
then be added to the characteristics list (step 160). Based on
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CA 2997335 2018-03-05

Attorney Docket No. 1355P002CA01
the augmented characteristics list (along with possibly some
Gaussian noise parameter), numerous feature images are then
generated (step 170). These generated feature images are then
combined with the clean image to result in images which can be
used for training.
The embodiments of the invention may be executed by a
computer processor or similar device programmed in the manner of
method steps, or may be executed by an electronic system which
is provided with means for executing these steps. Similarly, an
electronic memory means such as computer diskettes, CD-ROMs,
Random Access Memory (RAM), Read Only Memory (ROM) or similar
computer software storage media known in the art, may be
programmed to execute such method steps. As well, electronic
signals representing these method steps may also be transmitted
via a communication network.
Embodiments of the invention may be implemented in any
conventional computer programming language. For example,
preferred embodiments may be implemented in a procedural
programming language (e.g. "C") or an object-oriented language
(e.g. "C++", "java", "PHP", "PYTHON" or "C#"). Alternative
embodiments of the invention may be implemented as pre-
programmed hardware elements, other related components, or as a
combination of hardware and software components.
Embodiments can be implemented as a computer program
product for use with a computer system. Such implementations may
include a series of computer instructions fixed either on a
tangible medium, such as a computer readable medium (e.g., a
diskette, CD-ROM, ROM, or fixed disk) or transmittable to a
computer system, via a modem or other interface device, such as
a communications adapter connected to a network over a medium.
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CA 2997335 2018-03-05

Attorney Docket No. 1355P002CA01
The medium may be either a tangible medium (e.g., optical or
electrical communications lines) or a medium implemented with
wireless techniques (e.g., microwave, infrared or other
transmission techniques). The series of computer instructions
embodies all or part of the functionality previously described
herein. Those skilled in the art should appreciate that such
computer instructions can be written in a number of programming
languages for use with many computer architectures or operating
systems. Furthermore, such instructions may be stored in any
memory device, such as semiconductor, magnetic, optical or other
memory devices, and may be transmitted using any communications
technology, such as optical, infrared, microwave, or other
transmission technologies. It is expected that such a computer
program product may be distributed as a removable medium with
accompanying printed or electronic documentation (e.g., shrink-
wrapped software), preloaded with a computer system (e.g., on
system ROM or fixed disk), or distributed from a server over a
network (e.g., the Internet or World Wide Web). Of course, some
embodiments of the invention may be implemented as a combination
of both software (e.g., a computer program product) and
hardware. Still other embodiments of the invention may be
implemented as entirely hardware, or entirely software (e.g., a
computer program product).
A person understanding this invention may now conceive of
alternative structures and embodiments or variations of the
above all of which are intended to fall within the scope of the
invention as defined in the claims that follow.
- 16 -
CA 2997335 2018-03-05

Representative Drawing
A single figure which represents the drawing illustrating the invention.
Administrative Status

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Administrative Status

Title Date
Forecasted Issue Date 2023-04-25
(22) Filed 2018-03-05
(41) Open to Public Inspection 2019-09-05
Examination Requested 2022-03-03
(45) Issued 2023-04-25

Abandonment History

There is no abandonment history.

Maintenance Fee

Last Payment of $277.00 was received on 2024-02-14


 Upcoming maintenance fee amounts

Description Date Amount
Next Payment if standard fee 2025-03-05 $277.00
Next Payment if small entity fee 2025-03-05 $100.00

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Please refer to the CIPO Patent Fees web page to see all current fee amounts.

Payment History

Fee Type Anniversary Year Due Date Amount Paid Paid Date
Application Fee $400.00 2018-03-05
Maintenance Fee - Application - New Act 2 2020-03-05 $100.00 2020-02-07
Maintenance Fee - Application - New Act 3 2021-03-05 $100.00 2021-03-02
Registration of a document - section 124 2021-12-21 $100.00 2021-12-21
Maintenance Fee - Application - New Act 4 2022-03-07 $100.00 2022-03-03
Request for Examination 2023-03-06 $814.37 2022-03-03
Maintenance Fee - Application - New Act 5 2023-03-06 $210.51 2023-02-07
Final Fee $306.00 2023-03-02
Maintenance Fee - Patent - New Act 6 2024-03-05 $277.00 2024-02-14
Owners on Record

Note: Records showing the ownership history in alphabetical order.

Current Owners on Record
SERVICENOW CANADA INC.
Past Owners on Record
ELEMENT AI INC.
Past Owners that do not appear in the "Owners on Record" listing will appear in other documentation within the application.
Documents

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Document
Description 
Date
(yyyy-mm-dd) 
Number of pages   Size of Image (KB) 
Maintenance Fee Payment 2021-03-02 1 33
Request for Examination / PPH Request / Amendment 2022-03-03 21 714
Maintenance Fee Payment 2022-03-03 1 33
Claims 2022-03-03 6 196
Examiner Requisition 2022-05-03 5 246
Amendment 2022-09-02 19 553
Claims 2022-09-02 6 292
Maintenance Fee Payment 2023-02-07 1 33
Final Fee 2023-03-02 6 144
Amendment after Allowance 2023-03-02 13 356
Acknowledgement of Acceptance of Amendment 2023-03-09 1 185
Office Letter 2023-03-17 1 203
Acknowledgement of Rejection of Amendment 2023-03-17 2 215
Representative Drawing 2023-03-31 1 3
Cover Page 2023-03-31 1 40
Electronic Grant Certificate 2023-04-25 1 2,527
Abstract 2018-03-05 1 24
Description 2018-03-05 16 606
Claims 2018-03-05 5 150
Drawings 2018-03-05 8 270
Correspondence Related to Formalities 2018-10-31 3 115
Representative Drawing 2019-07-26 1 2
Cover Page 2019-07-26 2 39