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Sommaire du brevet 2057832 

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Disponibilité de l'Abrégé et des Revendications

L'apparition de différences dans le texte et l'image des Revendications et de l'Abrégé dépend du moment auquel le document est publié. Les textes des Revendications et de l'Abrégé sont affichés :

  • lorsque la demande peut être examinée par le public;
  • lorsque le brevet est émis (délivrance).
(12) Demande de brevet: (11) CA 2057832
(54) Titre français: PROCEDE ET APPAREIL POUR EXAMINER DES ELEMENTS OPTIQUES, NOTAMMENT DES ELEMENTS OPTIQUES POUR L'OEIL ET DISPOSITIF POUR ECLAIRER DES OBJETS D'ESSAI CLAIRS ET TRANSPARENTS
(54) Titre anglais: PROCESS AND APPARATUS FOR EXAMINING OPTICAL COMPONENTS, ESPECIALLY OPTICAL COMPONENTS FOR THE EYE AND DEVICE FOR ILLUMINATING CLEAR-TRANSPARENT TEST-OBJECTS
Statut: Réputée abandonnée et au-delà du délai pour le rétablissement - en attente de la réponse à l’avis de communication rejetée
Données bibliographiques
(51) Classification internationale des brevets (CIB):
  • G1M 11/00 (2006.01)
  • G1M 11/02 (2006.01)
  • G1N 21/88 (2006.01)
  • G1N 21/95 (2006.01)
(72) Inventeurs :
  • HOFER, PETER (Allemagne)
  • HAGMANN, PETER (Allemagne)
  • HAUCK, ROLAND (Allemagne)
  • GEISSLER, WOLFGANG (Allemagne)
  • LUTZ, HUBERT (Suisse)
(73) Titulaires :
  • BODENSEEWERK GENAETETECHNIK GMBH
  • NOVARTIS AG
(71) Demandeurs :
  • BODENSEEWERK GENAETETECHNIK GMBH (Allemagne)
  • NOVARTIS AG (Suisse)
(74) Agent: SMART & BIGGAR LP
(74) Co-agent:
(45) Délivré:
(22) Date de dépôt: 1991-12-17
(41) Mise à la disponibilité du public: 1992-06-20
Requête d'examen: 1998-12-04
Licence disponible: S.O.
Cédé au domaine public: S.O.
(25) Langue des documents déposés: Anglais

Traité de coopération en matière de brevets (PCT): Non

(30) Données de priorité de la demande:
Numéro de la demande Pays / territoire Date
4032/90-7 (Suisse) 1990-12-19
P 41 24 003.0 (Allemagne) 1991-07-19

Abrégés

Abrégé anglais


V-18471/A/TIT 28
Process and apparatus for examining optical components, especially optical
components for the eve and device for illuminating clear-transparent test-objects
ABSTRACT
A process and an apparatus for the examination, especially the quality control, of optical
components, in which an image of the particular component to be examined is produced
and flaws in the imaged article are detected by image analysis, as well as the integration of
that examining process into the manufacture of the component. The optical components
may be optical components for the eye, such as spectacle lenses, contact lenses,intraocular lenses and the like.
(Fig. 1)

Revendications

Note : Les revendications sont présentées dans la langue officielle dans laquelle elles ont été soumises.


- 15 -
What is claimed is:
1. A process for examining optical components, in which an image of the particular
component to be examined is produced and flaws in the imaged article are detected by
image analysis, wherein a two-dimensional high-contrast image of the particular
component to be examined is produced and the image area of the flaws which have been
made visible is determined and compared with one or more threshold values.
2. A process according to claim 1, wherein to produce the high-contrast image a dark field
illumination of the optical component to be examined is carried out.
3. A process according to either claim 1 or claim 2, wherein the image area of the flaws
detected is divided into pixels and the pixels are counted, and the number of pixels
ascertained is compared with a predetermined number of pixels.
4. A process according to any one of claims 1 to 3, wherein the detection of flaws is
carried out in one or more production stages of the manufacture of the component.
5. A process according to any one of claims 1 to 4, wherein the detection of flaws is
carried out in the manufacture of optical components for the eye.
6. A process according to any one of claims 1 to 5, wherein different threshold values are
set as quality standards for different zones of the component to be examined.
7. A process according to any one of claims 1 to 6, wherein in the examination of a contact
lens, different threshold values are set as quality standards for the optical zone, the
lenticular zone and the perimeter of the lens.
8. An apparatus for examining optical components having an optical image-producing
device and an image-processing device for carrying out a process according to any one of
claims 1 to 7, wherein the illuminating means (1) has a high-contrast- image producing
device (5) and the image-processing means (2) comprises an image-recording means (3)
with an image sensor (4) for area determination of the flaws detected in the high-contrast
image.

- 16 -
9. An apparatus according to claim 8, wherein the high-contrast-image producing device
(5) is in the form of a dark field illumination means for the component (6) to be examined.
10. An apparatus according to claim 8, wherein the image sensor (4) is in the form of a
CCD.
11. An apparatus according to any one of claims 8 to 10, wherein a reading means (7) for
reading the imaged flaw areas by pixels is connected to the image sensor (4).
12. An apparatus according to any one of claims 8 to 11, wherein the image-processing
device (2) has a comparator (24, 25, 26), which is connected to an area determination
means (20, 21, 23) and to a threshold value storage means (27, 28, 29).
13. An apparatus according to any one of claims 8 to 12, wherein the threshold values
(quality standards) are preset area sizes.
14. An illuminating device for illuminating clear-transparent test objects in order to
examine the test objects for flaws, wherein a light source (120) and an illuminating lens
(118, 128) are provided for illuminating the test objects in dark field illumination, and the
illumination geometry of the illuminating lens (118, 128) is adjustable to enable
adaptation to the test object.
15. An illuminating device according to claim 14, wherein
(a) a first reflector body (110) is arranged below a support (148) having a support plane for
test objects,
(b) the first reflector body (110) has an end face (112) essentially parallel to the supporting
plane of the support (148), which end face forms a background for the test objects,
(c) the first reflector body (110) furthermore has, remote from the said end face (112), a
convex-conical first reflector (118) of which the cone axis coincides with a system axis
(114) which extends at right angles to the end face (112),
(d) the light source (120) is arranged on the system axis (114) and

- 17 -
(e) a second reflector body (130) having a concave annular reflector (128) is arranged
coaxially with the system axis (114).
16. An illuminating device according to claim 15, wherein the concave annular reflector
(128) is cylindrical.
17. An illuminating device according to either claim 15 or claim 16, wherein the light
source (120) is combined with the first reflector (118) in a sub-assembly (170) which is
displaceable along the system axis (114) relative to the second reflector body (130) and to
the support (148).
18. An illuminating device according to any one of claims 14 to 17, wherein the light
source is a barretter-ring light.
19. An illuminating device according to claim 18, wherein the radiation characteristic of
the barretter-ring light is adaptable to the geometry of the test object.
20. An illuminating device according to any one of claims 14 to 19, wherein a plate (146),
provided on both sides with an anti-reflection layer, is provided as a support (148) for the
test object.
21. An illuminating device according to any one of claims 15 to 17, wherein the first and
the second reflector (118 and 120) are specular.
22. An illuminating device according to any one of claims 15 to 17, wherein the surfaces
of the first and of the second reflector (118 and 120) are partially diffuse-reflecting.
23. An apparatus for examining optical components according to any one of claims 8 to
13, wherein the illuminating device is designed in accordance with any one of claims 14 to
22.

Description

Note : Les descriptions sont présentées dans la langue officielle dans laquelle elles ont été soumises.


2~3~7~32
- 1 .
V-18471/A/'I~T 28
Process and apparatus for examinin~ oPtical components~ especia~ly optical
componen~s for the eye and device fvr illuminatir~ ~lear-transParent test ob.iects
The invention relates to a process and an apparatus for examining optical components, in
which an image of the particular component to be examined is produced and flaws in the
imaged article are detected by image analysis, and furthe}more to an illuminating device
for illuminating clear-transparent test objects.
In the manufacture and quality control of optical components, especially opticalcomponents for the eye, such as contact lenses, examination is still ca$ried out visually.
Attention may be drawn in this connection, for example, to DIN specification 5~ 223.
Visual quality control is a subjective examination only, which depends on the person
concerned and is likely to vary depending on the time of day. Consequently there are
inevitably shifts in the quality standards of the quality control and it is not possible to
achieve adequate reproducibility of the quality of the products. In addition, the
possibilities of automation, especially where such components are mass-produced, are
considerably handicapped.
Detection of the presence or absence of scratches and the like on the curved suIface of
lenses in contact lens manufacture by means of an optical projector device and an image-
processing device is known from EP O 359 084 A2. The said speci~lcation does not,
however, disclose how the projector device and the image-processing device are designed
so that they can be used for a reproducible quality control, especially in the automatic
production of optical components.
Referring to illumination of test objects, the illumination of objects in a rnicroscope by
means of "dark field illumination" is known. Such a dark ~leld illumination comprises
illuminating an object by means of a light source and an illuminating lens (condenser) in
such a manner that the illuminating light beam does not itself enter the ray path of the
microscope. Consequently, only the light that is scattered into the ray path by the object is
observed.
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Illuminating lenses for dark field illumination are known in which there is arranged in the
ray path a central diaphragm plate which covers the central portion of the illuminating
light beam. It is thus an annular illuminating light beam which strLlces a condenser lens
and which is collected by the edge parts of the condenser lens in the plane of the object
and then directed to the side past the ray path of the microscope lens.
Also known is a so-called "cardioid condenser" in which an annular illuminating light
beam is fully reflected at a concave surface at the object side of a first lens. The light
beam deflected outwards in this manner st~ikes an essentially cylindrical generated surface
of a second lens. The light beam is again fully reflected by this generated surface. The
second lens collects again in the plane of the object the light beam reflected inwards from
the edge. From there the light beam, in the shape of a cone, again passes by the ray path of
the microscope (Grimsehls Lehrbuch der Physik, 11th edition (1~43), vol. 2, published by
B.G. Teubner, pages 707-708). These known arrangements are concerned with the
illumination of objects in a microscope having an invariable illuminating lens.
Starting from this state of the art it is an object of the invention to create a process and an
apparatus for examining optical components that promote the automation of the examining
steps and the manufacture of the optical components. Furthermore, it is another object of
the invention to provide an illurninating device for illurninating clear-transparent test
objects in order to examine the test objects for flaws, which device permits the flaws to be
made clearly detectable. Test objects for such a device may be optical elements, such as
lenses, or also spectacle lenses, contact lenses etc.. Another problem underlying the
invention is especially so to design such an illuminating device that it permits automatic
flaw evaluation by observing the test objects using an electronic image-recording device
and image-processing.
The problem is solved in the invention as far as the process is concerned by a process in
which a two-dimensional high-contrast image of the particular component to be examined
is produced and the image area of the flaws which have been made visible is determined,
for the purpose of quality control, by comparison with one or more threshold values.
With respect to apparatus, this problem is solved in the invention by providing an optical
image-producing device that has a high-contrast-image producing device, and also an
image-processing device which comprises an image-recording means with an image
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sensor that can carry out an area deterrnination of the flaws detected in the high-contrast
image.
In the invention an illuminating means is used that renders possible the simultaneous
high-contrast representation, in two-dimensional form, of all structures that are of interest
on the component to be examined. There is used in combination with this illuminating
means an image-recording means with an optical image sensor. The image-recordingmeans may also optionally be provided with a focussing lens with which the high-contrast
image can be recorded. The high-contrast image is transmitted to an image-processing
device. For that purpose it is advantageous to divide the high-contrast image into image
elements (pixels). When a CCD is used as image sensor, this division into image elements
is already provided by the design or construction of the CCD. The image elements are
converted by means of a converter into digital image signals which can be stored and
processed. In this manner an analysis of the structural features of the optical component to
be examined (an area determination), and consequently of the flaws detected in the
high-contrast image, is possible. For the conversion, advantageously a binary image is first
of all produced.
In order to produce the high-contrast image, preferably a dark ~leld illumination of the
component to be examined is carried out. With the aid of appropriately scattered light, the
component to be exarnined is illuminated against a dark background, using a carnera that
optionally contains the image sensor. The image sensor is pre~erably in the form of a
CCD. In this manner a dark field illumination image is taken of the illuminated test
specimen. Such an image gives a high-contrast representation of flaws, these flaws
appearing as areas on the high-contrast image representation. For example, the flaws in a
dark field illumination are represented as light flecks with well-defined areas against a
dark (black or grey) background that has no flaws. The flaws may be scratches, holes, air
bubbles, fissures, adhering fragments and accumulations of dirt or shrunken areas and the
like. The flaws present themselves as areas in the image area. It is also possible, however,
to detect errors at the perimeter of the test specimen, which can be represented as two-
dimensional shapes. These may be gaps in the perimeter, flash, fissures, fragments
adhering to the perimeter, accumulations of dir~ and shrunken areas at the perimeter, and
perimeter inhomogeneities.
The image areas of the detected flaws can be divided into pixels timage area elements).
By means of the number of image area elements (pixels) it is possible to ascertain the
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2~'~7~2
- 4 -
extent of a particular flaw or of all the flaws. For this purpose a scanning/counting means
may be provided by means of which the pixels can be counted. The number of pixels
ascertained for the individual image areas of the detected flaws is compared with a
predetermined number of pixels. This predeterminecl number of pixels is a quality
standard which the test specimen has to meet.
For the examination the test specimen can also be divided into different zones for which
different threshold values are preset as quality standards. For the examination of a contact
lens, for example, different quality standards in the torm of preset image areas may be
stipulated for the optical zone and the lenticular zone. The quality of the perimeter of the
lens can also be determined on the basis of the shape of the two-dimensional image of the
perimeter of the contact lens.
Preferably, the invention can be used during the individual production stages of the
manufacture of the optical component. For that purpose the flaw detection and quality
control according to the invention can be integrated into one or more of the production
stages so that there is a continuous automatic quality control during the production of the
optical component. For this it is possible to preset appropriate quality standards for the
respective production stage so that reproducible quality controls are achieved for each of
the production stages in automatic production. The invention can advan~ageously be used
in the quality control of optical components, for example optical lenses, especially optical
components for the eye, such as spectacle lenses, contact lenses, intraocular lenses and the
like. An automatic final control and, as already explained, also a continuous automatic
monitoring of the quality during manufacture of the components, can be achieved in this
way.
In the case of contact lens manufacture, for example, both dry examination (examination
in air) and wet examination (examination in storage solution) of hydrated contact lenses
can be carried out. If the components are stored in transparent containers it is possible to
carry out a final control of the components inside the containers.
In the illuminating device already mentioned there are provided a light source and an
illuminating lens for illuminating the test objects in dark field illumination. The
illumination geometry of the illuminating lens is adjustable to enable adaptation to the test
object.
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In this manner, by appropriate adjustment of the illuminating lens an illumination adapted
to the dimensions and shape of the test objects can be achieved, which permits flaws such
as bubbles, ~lssures or the like to appear as distinct contrasts. The contrasts produced in
this manner can be recorded by an electronic image-recording device and evaluated by
means of image-processing in order to detect flaws. It has been found that such a
representation of flaws in clear-transparent test objects in the form of contrasts is possible
by means of dark field illumination, but that it is necessary for this to make ~he
illuminating lens adjustable. Further developments of the invention form the subject of the
dependant claims.
Referring to drawings, the invention is explained in more detail by way of embodiment
examples.
Fig. 1 is a diagrammatic representation of an image analysis device representing one
embodiment example of the invention;
Fig. 2 shows an image of the test specimen produced by the image analysis device of
Figure 1, with ~laws reproduced diagrammatically in two-dimensional form;
Fig. 3 is a positioning diagram for the image analysis of a test specimen in the form of a
contact lens;
Fig. 4 shows a zone division of a test specimen in the form of a contact lens;
Fig. 5 shows a detection diagram for perimeter flaws in a test specimen in the form of a
contact lens;
Fig. 6 is a graph representation of the perimeter flaws detected in accordance with Fig. 5;
Fig. 7 is a diagrammatic representation of various production stages in the manufacture of
a contact lens with integrated automatic examining steps;
Fig. 8 is a diagrammatic representation of various production stages of another
manufacturing process for contact lenses with integrated automatic examining steps;
Fig. 9 shows in plan view a packaging, especially for contact lenses, suitable for a final
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-6-
examination using the process according to the invention;
Fig. 10 is a sectional rep~esentation of the packaging shown in Fig. 9;
Fig. 11 is a block diagram for an image analysis device shown in Fig. l; and
Fig. 12 shows a longitudinal section of an illuminating device for illuminating
clear-transparent test objects in dark field illumination.
Fig. 1 shows an apparatus used for examining optic~ll components. A component 6 to be
examined is disposed on a holding and transpor~ing means 8. An illuminating means 1
comprises a high-contrast-image producing device S, which may take the form of a dark
field illumination device. Using a light source 18 of which the light is repeatedly reflected
and scattered, the component 6 to be examined is illuminated in front of a dark
background 19.
An image-processing device 2 is provided for processing the high-contrast image or
dark-field image produced in that manner. The image-processing device 2 comprises an
image-recording means 3 with an image sensor 4. This may be, for example, a video
camera with the image sensor 4 designed as a CCD.
The video camera may be connected to a monitor, not illustrated, on which the
two-dimensional high-contrast image can be made visible. If the image sensor is in the
forrn of a CCD, then, on account of the CCD construction, division of the image into
image elements (pixels), for example 500 x 700, is automatic, that is to say there is
automatic image division. Using a reading and converting device 7, the individual image
elements of the high-contrast image can be scanned and converted into binary signals,
which are then stored and further processed as explained in the following.
One embodiment example of a high-contrast image 12 of a test specimen is shown in ~;ig.
2 in the form of a binary image. This may be, for example, the high-contrast image 12 of a
contact lens that is to be examined. Flaws on the surface of the test specimen 6 or enclosed
flaws are shown as two-dirnensional representations in the high-contrast image 12. These
are, for example, the flaws 13, 14, 15, 16 and 17 shown as two-dimensional
representations, and may be holes, air bubbles, inclusions, adhering fragments etc..
.
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As shown in Fig. 2, these flaws or flaw areas shown as two-dimensional representations
are divided into individual image elements, so-called pixels. Such a division can be
effected, for example, using the image sensor 4 (CCD) in cooperation with the reading and
converting device 7.
Connected to the device 7 is an image analysis device 9 (image division, counting of
pixels, pixel comparation) which ascertains the nurnber of pixels, for example by
counting. For that purpose the image analysis device 9 may have an appropriatelydesigned counting means (pixel counter 23 in Fig. 11).
The mode of operation of the image analysis device 9 is explained with reference to Fig.
11, which is a block diagram of the function units contained in the image analysis device
9.
An image-capture store 20 receives from the reading device 7 (Fig. 1) the image of the
component 6 to be examined that has been recorded by the video camera or the image
sensor 4 of the image-Tecording means 3. That image may ta~e the form shown in Fig. 2.
In order, for the quality control, to arrange the component 6 to be examined centrally and
correctly in the image-producing device 1 and image-processing device 2, an alignment
and centering control means 22 is connected to the image-capture means 2û. The control
means 22 controls the holding and transporting means 8 (Fig. 1) accordingly if the test
specimen 6 is not arranged centrally. In order to position the lens in the square field shown
in Fig. 3, first of all the perimeter of the lens is detected, which represents the outer
boundary of the search field. Upon positioning, the search is then carried out "from the
outside inwards".
Since contact lenses are usually engraved, it is necessary for the examination to cut out the ;.
engraving, since otherwise it would cause the indication of a flaw. For that purpose the
square field shown in Fig. 3 is divided into eight sectors. In the embodiment example
illustrated, the positioning is so carried out that the engraving is aTranged half in sector II
and half in sector III. One half of the engraving is to the left of the twelve o'clock position
and the other half is to the right, the two halves of the engraving being equidistant from
the twelve o'clock position. So that the test specimen 6 is positioned correctly, the holding
and transporting means ~ may have an x-y displacement means.
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If the component 6 to be examined is formed Irom various zones or parts for which
different quality standards suffice or are even re(luired, it is advantageous to divide the
recorded image (Fig. 2) of the component 6 to be examined into corresponding zones.
Fig. 4 is a diagrammatic representation of such a division into zones, for example for a
contact lcns. One region, which is defined by a radius rl, forms an optical zone OZ of the
contact lens. The radii r2 and r3 define a writing zone, which is to be blanked out, in the
sector with the engraving.
A lenticular zone LZ is defined by a region between radii rl and r4 and the perimeter R of
the lens is defined by the radius r4.
Different flaw thresholds can be set for the optical zone OZ and the lenticular zone LZ, the
flaw threshold for the optical zone OZ having to be set lower than the flaw threshold -for
the lenticular zone LZ. A perimeter error threshold can also be set for the perimeter R; for
example, the longitudinal and/or transverse dimensions may not be greater than 50 ~lm.
The flaw threshold can in the case of the invention, however, be set even lower, for
example at 20 ~m. This applies also to the flaw thresholds in the optical region OZ and in
the lenticular region LZ. The flaw threshold is set in accordance with how high the quality
of the contact l~ns or of the component 6 to be examined is to be.
Whereas, for the two-dimensional zones of the image, appropriate associated flawthresholds are set, flaw detection for the contact lens perimeter R can be carried out in
accordance with the principle illustrated in Figures S and 6. For this various criteria can be
taken into consideration individually or all together. One criterion may be whether the
radius at a particular perimeter position deviates from a mean radius Rm beyond a preset
radius deviation ~Rg/2 or not. A further criterion for consideration may be whether those
excessive radius deviations as a whole exceed a certain threshold or not. Finally, a further
criterion that may be examined is whether the curve shape of the perimeter markedly
deviates from a circular shape or not, as is illustrated, for example, between the two curve
portions Cl and C2 resp. between the curve portions C3 and C4 in Fig. 5. Fig. 6 shows, for
example, that approximately at 150 there is a pronounced radius deviation. This is shown
by Rl - R2 in Fig. 5. It is also possible to see in Fig. 6 the pronounced deviation of the
perimeter from the circular shape between the curve portions C3 and C4. Also in Fig. 6, a
pronounced radius deviation is recognisable in the region from approximately 260 to
3ooo.
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The aforesaid flaws can be detected in the image analysis device 9 (Fig. 1) with the aid of
a storage means 21 (Fig. 11), in which the zone division shown in Fig. 4 is set, in
conjunction with threshold value stores. For example, a threshold value store 27 is
provided for the optical zone OZ, a threshold value store 28 is provided for the lenticular
zone LZ and a third threshold value store 29 is provided for the perimeter R. There are
associated pixel counters for the corresponding zones. The pixel counters, which indicate
values for the sizes of flaw in the respective zones, deliver those values to comparators 24,
25 and 26, which are connected to the described associated threshold value stores 27, 28
and 29. The result of the comparison may be filed in an intermediate store 30 for the
respective zones and optionally reproduced, together with the recorded image in the
image-capture store 20, on a monitor 10.
Furthermore, depending on the respective comparison results of the comparators 24, 25
and 26, a selector 11 (Fig. 1) is actuated either directly or by way of the intermediate store
30. The selector 11 is connected to or is in operative connection with the holding and
transporting means 8. This is illustrated diagrammatically by a broken line in Fig. 1. The
component 6 to be exarnined is left on the holding and transporting means 8 whenaccording to the comparison result it satis~les the quality requirements. The component 6
to be examined is then transferred to the next processing station. If the component 6 does
not satisfy the quality requ*ements, it is removed from the holding and transporting means
8 by the achon of the selector 11.
An embodiment of the device for illuminating the test object, e.g. for illuminating the
contact lens, is shown in Fig. 12. In this figure, reference sign 110 indicates a central first
reflector body. The first reflector body 110 has a planar, upper end face 112. The upper
end face 112 extends at right angles to a system axis 114. Adjacent to the end face 112 the
reflector body 110 has a cylindrical generated surface 116 which is coaxial with the
system axis 114. On the underside, the reflector body 110 forms a convex-conical first
reflector 118. The cone axis of the reflector 118 coincides with the system axis 114.
A light source 120 is arranged below the reflector body 110 on the system axis 114. From
the light source 120 a central light beam 122 strikes the convex-conical first reflector 118.
The light beam 122 is fanned out radially by the first reflector 118. In the drawing, the
edge rays 124 and the central ray 126, which extends along the system axis 114, of the
light beam 122 are shown before and after reflection at the first reflector 118.

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The radially fanned-out light beam 122 s~ikes a second reflector 12~. The second reflector
128 is concave-cylindrical and coaxial with the system axis 114. The second reflector 128
is disposed on a second reflector body 130. The second reflector body has an annular,
planar end face 132. The cylindrical reflector 128 is adjacent on the inside to the end face
132. On the outside the reflector body 130 has, adjacent to the end face 132, a cylindrical
generated surface 134 which is coaxial with the reflector 128. Adjacent to the cylindlical
generated surface 134 the reflector body 130 has a conical portion 136. Adjacent to the
conical portion 136 is a cylindrical portion 138 which is provided with an external thread.
On the inside there is adjacent to the cylindrical reflector 128 a conical portion 140. At the
bottom, the reflector body 130 has a lower end face 142 having a central aperiure 144. The
light source 120 projects through that aperture 144 into the interior of the reflector body
130.
On the upper end face 132 of the reflector body 130 there is a clear-transparent plate 146
which, with its flat upper side, forrns a support 148 for the test objects. The supporting
plane defined by the support 148 is perpendicular to the system axis 114 and accordingly
parallel to the end face 112 of the first reflector body 110. The plate 148 is provided at the
top and bottom with reflection-reducing layers 150, 152. The concave-cylindrical second
reflector 128 reflects the radially fanned-out light beam 122 in such a manner that it is
collected almost glancingly in the middle of the support 148 in one light spot.
The second reflector body 130 is screwed, by the portion 138 provided with an external
thread, into a pot-shaped housing member 156 provided with an internal thread 154. The
housing member 156 carries on the inside, on the system axis 114, a base 158 for the light
source 120. In addition, support rods 160 are mounted in the base of the pot-shaped
housing member 156, which rods support the first reflector body 110. The support rods
160 are guided through aligned apertures in the base of the housing member 156, and
through a transverse bore 162 of clamping screws 164. The clamping screws 164 are
seated in radial threaded bores 166 in the base of the housing member 156 between the
said aligned apertures. The clamping screws 164 can be released. The support rods 160
and consequently the first reflector body 110 are then vertically displaceable relative to
the pot-shaped housing member 156. It is thus possible to adjust the reflector body 110 in
relation to the light source 120. The housing member 156, the light source 120 and the
first reflector body 110 iorm a coherent subassembly 170 which, by means of the internal
thread 154 and the externally threaded portion 138 of the second reflector body 130, is
;
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displaceable as a whole, in the direction of the system axis 114, relative to the seconc~
reflector body 130 and thus to the second reflector 128 and to the support 148 (or vice
versa).
By means of this displacement, firstly, the light spot produced in the support plane is
adapted to the dimensions of the test objects, and secondly the apparatus can be so
adjusted that optimum contrast is provided for the detection of flaws.
The reflectors 118 and 128 may be specular. The sul~aces of the first and of the second
reflector 118 and 128 may, however, alternatively be designed to be partially
diffuse-reflecting.
An alternative solution may consist in the light source being a barretter-ring light. The
adjustability of the illumination geometry in that case may consist in the radiation charac-
teristic of the barretter-ring light being adaptable to the geomet~y of the test object.
Referring to Figs. 7 and 8, two different manufacturing processes for contact lenses are
used to show how the image analysis according to the invention combined with other
image-processing operations can be intregrated into the manufacturing process at differen~
production stages or steps, so that automation of the entire manufacture of the contact lens
is achieved.
In Fig. 7 a so-called full mold process, which comprises molding the contact lens, is
shown in its individual stages, with integrated automatic examination using the image
analysis according to the invention. Full mold processes are known (e.g. EP 0 367 513 and
WO 87/04390).
In a production stage 31, the mold inserts (optical tools), which consist of high-grade
metals/alloys, are produced, for example, by machining. Even at this stage a first
examining step 32 can be carried out using image analysis. This examining step can
examine the surface quality of the mold inserts and the geometry of the mold inserts.
Then, in a step 33, the mold inserts are inserted into an injection molding tool. At this
stage, too, an optical examination can be carried out using image analysis in an examining
step 35 for examining the surface quality and the assembly dimensions.
Following this there is the manufacture of the plastics molds, that is to say the two mold
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halves (molds), in which the cont~ct lens is to be produced by molding (production stage
34). Here, too, an exarnining step 36 by image analysis can be incolporated, so that the
surface quality, the geomehy (distortion and the like) and freedom from dust of the
manufactured mold halves can be checked. Following this, the polymerisation mixture for
the contact lens material is dispensed and the two rnold halves are closed in a production
stage 37. An examining step 38 can also be incorporated here, it being possible to
determine whether the closure is correct and whether air bubbles are present using the
illustrated image analysis.
There then follows, in a production stage 39, the polymerisation of the contact lens
material enclosed by the two mold halves. During this it is possible in an examining step
40 to monitor in a closed mold that is transparent not only the progress of the
polymerisation but also the polymerisation shrinkage of the polymerised material and a
suitable adjustment of the two mold halves in that respect. Where appropriate, the
adjustment of the two mold halves to compensate for the polymerisation shrinkage can be
controlled as a function of the result of the image analysis and the ascertainedpolymerisation shrinkage.
In a further production stage 41, the two mold halves are opened. It is possible within the
scope of an integrated examining step 42 to carry out an intermediate inspection here with
respect to crude flaws, such as fissures, gaps etc. in the lens body.
In the subsequent production stage 43, the contact lens is removed from the mold, and dry
examination can be carried out on the contact lens in an examining step 44 using the illus-
trated image analysis. This may be followed in a production stage 45 by the hydration of
the lens body. In a further production stage 46 the lens (dry or hydrated) is introduced into
small glass vessels or so-called foil packs 68, which are illustrated in Figures 9 and 10.
Then, in an examining step 47, it can be checked whether the lens has been introduced into
the storage container 69. This is effected in the course of a so-called preserice check.
Whether the level of liquid in the storage container is correct can also be checlced. In
addition, the cleanliness of the storage liquid and of the lens itself can be inspected. Also,
lens quality and refractive power can be subjected to a ~mal examination. The
examinations explained in the examining step 47 can be carried out using the above-
described image analysis. The containers (Figs. 9, 10) are then sealed with covering sheets
71 by welding.
.
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Fig. 8 shows a turning process, which can also be used to produce a contact lens. In this
turning process, in a production stage 48 a button is cut off from a rod of contact lens
material and inserted into a clamping chuck of a lathe. Autornatic lathes are known.
Reference is made in this connection, for example, to German Patent Specification 31 10
624. In an examining step 49, for example the button can be exarnined with respect to
material inclusions and to its dimensions (trimmed size) using the above-described image
analysis. In a production stage 50, an inner curve is produced in the button by turning by
means of a turning tool in the automatic lathe. In a subsequent examining step 51, by
means of image analysis the turned form and the surface quality, and optionally also the
geometry, for which also a known Moiré process can be used, can be examined.
In a further production stage 52 the inner curve is polished. If desired, the polished form,
the surface quality and once again the geometry of the inner curve may be checked in an
examining step 53.
The button is then cemented onto a spindle of the automatic lathe in a production stage 54.
The button is cemented onto the spindle by its inner curve. Here, too, the qua]ity and the
dimensions of the layer of wax used to cement the button to the spindle can be checked in
an examining step 55 using optical image analysis, as can also the centering, and the
sumrnit of the curve can be ascertained.
Subsequently, the outer curve is turned in a further production stage 56. The turned form,
the geometry and the centre thickness of the finished lens may be examined in anexarmn1ng step 57.
The outer curve is then polished in a production stage 58. In an examining step 59, the
polished form, the geometry and the centre thickness of the contact lens can then be
checked. The examining step 57 can in that case be omitted.
In a production stage 60, the contact lens is detached from the cap of the automatic lathe.
In a production stage 61, the perimeter of the contact lens is machined. In a following
production stage 62 the contact lens is cleaned. Following cleaning of the contact lens
there may be an examining step 63 in which a dry examination of the contact lens is
carried out by image analysis (e.g. Fig. 1).

~ ~ ~ rl ~ 3 2
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There then follows, as production stage 64, the engraving of the contact lens. In this stage,
for example the engraving visible in Figures 3 and 4 is made in the contact lens body. A
surface treatment of the contact lens then follows as production stage 65. This has, in
particular, the advantage that the surface of the lens is made wettable for the lacrimal
fluid. The wettability can then be examined in an examining step 66 also by image
analysis (e.g. Fig. 1). By means of image analysis it is possible to ascertain whether
droplets form on the surface of the lens or whether the whole of the lens surface is wet
with liquid.
In a further production stage 67, the lens is inserted into a container, for example into foil
packs (Figs. 9, 10). An examining step corresponding to examining step 47, as in the full
mold process shown in Fig. 7, may then follow, after which the covering sheets are welded
onto the containers.
From the above explanation, especially in connection with Figures 7 and 8, it can be seen
that complete monitoring and at the same time 100 % automation can be achieved in the
production of optical components using optical image analysis. This applies especially to
the manufacture of contact lenses. By this means the desired product quality is guaranteed
by continuous monitoring (in-process control) of the entire production run, so that it may
be possible to dispense with a final control. Such monitoring is advantageous especially
for contact lenses (disposable lenses) that are to be produced in large numbers. The quality
control guaranteed by the invention is governed by a presettable quality standard and is
consequently a reproducible and objective quality control.
'~, ~ `' ~`` ;
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Dessin représentatif
Une figure unique qui représente un dessin illustrant l'invention.
États administratifs

2024-08-01 : Dans le cadre de la transition vers les Brevets de nouvelle génération (BNG), la base de données sur les brevets canadiens (BDBC) contient désormais un Historique d'événement plus détaillé, qui reproduit le Journal des événements de notre nouvelle solution interne.

Veuillez noter que les événements débutant par « Inactive : » se réfèrent à des événements qui ne sont plus utilisés dans notre nouvelle solution interne.

Pour une meilleure compréhension de l'état de la demande ou brevet qui figure sur cette page, la rubrique Mise en garde , et les descriptions de Brevet , Historique d'événement , Taxes périodiques et Historique des paiements devraient être consultées.

Historique d'événement

Description Date
Inactive : CIB de MCD 2006-03-11
Inactive : CIB de MCD 2006-03-11
Inactive : CIB de MCD 2006-03-11
Le délai pour l'annulation est expiré 2002-12-17
Demande non rétablie avant l'échéance 2002-12-17
Réputée abandonnée - omission de répondre à un avis sur les taxes pour le maintien en état 2001-12-17
Lettre envoyée 1998-12-21
Inactive : Renseign. sur l'état - Complets dès date d'ent. journ. 1998-12-21
Inactive : Dem. traitée sur TS dès date d'ent. journal 1998-12-21
Exigences pour une requête d'examen - jugée conforme 1998-12-04
Toutes les exigences pour l'examen - jugée conforme 1998-12-04
Demande publiée (accessible au public) 1992-06-20

Historique d'abandonnement

Date d'abandonnement Raison Date de rétablissement
2001-12-17

Taxes périodiques

Le dernier paiement a été reçu le 2000-10-26

Avis : Si le paiement en totalité n'a pas été reçu au plus tard à la date indiquée, une taxe supplémentaire peut être imposée, soit une des taxes suivantes :

  • taxe de rétablissement ;
  • taxe pour paiement en souffrance ; ou
  • taxe additionnelle pour le renversement d'une péremption réputée.

Les taxes sur les brevets sont ajustées au 1er janvier de chaque année. Les montants ci-dessus sont les montants actuels s'ils sont reçus au plus tard le 31 décembre de l'année en cours.
Veuillez vous référer à la page web des taxes sur les brevets de l'OPIC pour voir tous les montants actuels des taxes.

Historique des taxes

Type de taxes Anniversaire Échéance Date payée
Enregistrement d'un document 1997-07-14
TM (demande, 6e anniv.) - générale 06 1997-12-17 1997-10-27
TM (demande, 7e anniv.) - générale 07 1998-12-17 1998-11-09
Requête d'examen - générale 1998-12-04
TM (demande, 8e anniv.) - générale 08 1999-12-17 1999-11-18
TM (demande, 9e anniv.) - générale 09 2000-12-18 2000-10-26
Titulaires au dossier

Les titulaires actuels et antérieures au dossier sont affichés en ordre alphabétique.

Titulaires actuels au dossier
BODENSEEWERK GENAETETECHNIK GMBH
NOVARTIS AG
Titulaires antérieures au dossier
HUBERT LUTZ
PETER HAGMANN
PETER HOFER
ROLAND HAUCK
WOLFGANG GEISSLER
Les propriétaires antérieurs qui ne figurent pas dans la liste des « Propriétaires au dossier » apparaîtront dans d'autres documents au dossier.
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Description du
Document 
Date
(yyyy-mm-dd) 
Nombre de pages   Taille de l'image (Ko) 
Dessin représentatif 1999-07-21 1 7
Dessins 1994-03-26 8 213
Description 1994-03-26 14 662
Page couverture 1994-03-26 1 25
Abrégé 1994-03-26 1 19
Revendications 1994-03-26 3 108
Rappel - requête d'examen 1998-08-17 1 129
Accusé de réception de la requête d'examen 1998-12-20 1 177
Courtoisie - Lettre d'abandon (taxe de maintien en état) 2002-01-13 1 182
Taxes 1996-10-27 1 87
Taxes 1995-11-07 1 90
Taxes 1994-11-13 2 160
Taxes 1993-11-07 2 106