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Sommaire du brevet 2646325 

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Disponibilité de l'Abrégé et des Revendications

L'apparition de différences dans le texte et l'image des Revendications et de l'Abrégé dépend du moment auquel le document est publié. Les textes des Revendications et de l'Abrégé sont affichés :

  • lorsque la demande peut être examinée par le public;
  • lorsque le brevet est émis (délivrance).
(12) Demande de brevet: (11) CA 2646325
(54) Titre français: DISPOSITIFS SPINTRONIQUES CONTENANT DES DOPANTS SPINTRONIQUES ET PROCEDES ASSOCIES
(54) Titre anglais: SPINTRONIC DEVICES WITH CONSTRAINED SPINTRONIC DOPANT AND ASSOCIATED METHODS
Statut: Réputée abandonnée et au-delà du délai pour le rétablissement - en attente de la réponse à l’avis de communication rejetée
Données bibliographiques
(51) Classification internationale des brevets (CIB):
  • H01L 29/15 (2006.01)
  • H01L 29/66 (2006.01)
(72) Inventeurs :
  • HUANG, XIANGYANG (Etats-Unis d'Amérique)
  • HALILOV, SAMED (Etats-Unis d'Amérique)
  • YIPTONG, JEAN AUGUSTIN CHAN SOW FOOK (Etats-Unis d'Amérique)
  • DUKOVSKI, ILIJA (Etats-Unis d'Amérique)
  • HYTHA, MAREK (Etats-Unis d'Amérique)
  • MEARS, ROBERT J. (Etats-Unis d'Amérique)
(73) Titulaires :
  • MEARS TECHNOLOGIES, INC.
(71) Demandeurs :
  • MEARS TECHNOLOGIES, INC. (Etats-Unis d'Amérique)
(74) Agent:
(74) Co-agent:
(45) Délivré:
(86) Date de dépôt PCT: 2007-03-19
(87) Mise à la disponibilité du public: 2007-09-27
Requête d'examen: 2008-09-17
Licence disponible: S.O.
Cédé au domaine public: S.O.
(25) Langue des documents déposés: Anglais

Traité de coopération en matière de brevets (PCT): Oui
(86) Numéro de la demande PCT: PCT/US2007/006814
(87) Numéro de publication internationale PCT: US2007006814
(85) Entrée nationale: 2008-09-17

(30) Données de priorité de la demande:
Numéro de la demande Pays / territoire Date
11/687,422 (Etats-Unis d'Amérique) 2007-03-16
11/687,430 (Etats-Unis d'Amérique) 2007-03-16
60/783,598 (Etats-Unis d'Amérique) 2006-03-17

Abrégés

Abrégé français

L'invention concerne un dispositif spintronique qui peut comprendre au moins un super-réseau et au moins un contact électrique relié audit super-réseau tel que ledit super-réseau comprenne une pluralité de groupes de couches. Chaque groupe de couches peut comprendre une pluralité de monocouches de semi-conducteurs de base empilées formant une partie de semi-conducteur de base présentant un réseau cristallin, et, au moins une monocouche de matériau non semi-conducteur insérée dans le réseau cristallin des parties de semi-conducteurs de base adjacentes, et un dopant spintronique. Le dopant spintronique peut être incorporé dans le réseau cristallin de la partie de semi-conducteur de base en l'intégrant dans ladite monocouche de matériau non semi-conducteur. Dans certains modes de réalisation, la structure répétée du super-réseau peut ne pas être nécessaire.


Abrégé anglais

A spintronic device may include at least one superlattice and at least one electrical contact coupled thereto, with the at least one superlattice including a plurality of groups of layers. Each group of layers may include a plurality of stacked base semiconductor monolayers defining a base semiconductor portion having a crystal lattice, at least one non-semiconductor monolayer constrained within the crystal lattice of adjacent base semiconductor portions, and a spintronic dopant. The spintronic dopant may be constrained within the crystal lattice of the base semiconductor portion by the at least one non-semiconductor monolayer. In some embodiments, the repeating structure of a superlattice may not be needed.

Revendications

Note : Les revendications sont présentées dans la langue officielle dans laquelle elles ont été soumises.


THAT WHICH IS CLAIMED IS:
1. A spintronic device comprising:
at least one superlattice; and
at least one electrical contact coupled to said
at least one superlattice;
said at least one superlattice comprising a
plurality of groups of layers with each group of layers
comprising
a plurality of stacked base semiconductor
monolayers defining a base semiconductor portion
having a crystal lattice,
at least one non-semiconductor monolayer
constrained within the crystal lattice of adjacent
base semiconductor portions, and
a spintronic dopant constrained within the
crystal lattice of the base semiconductor portion by
said at least one non-semiconductor monolayer.
2. The spintronic device according to Claim 1
wherein said spintronic dopant comprises at least one
spintronic dopant monolayer adjacent said at least one non-
semiconductor monolayer.
3. The spintronic device according to Claim 1
wherein said spintronic dopant comprises a transition
metal.
4. The spintronic device according to Claim 1
wherein said spintronic dopant comprises Manganese.
5. The spintronic device according to Claim 1
wherein said at least one transition metal comprises at
least one of Manganese, Iron, and Chromium.
6. The spintronic device according to Claim 1
wherein said spintronic dopant comprises a rare earth.
16

7. The spintronic device according to Claim 1
wherein said rare earth comprises a rare earth lanthanide.
8. The spintronic device according to Claim 1
wherein said non-semiconductor comprises Oxygen.
9. The spintronic device according to Claim 1
wherein said non-semiconductor comprises at least one of
Oxygen, Nitrogen, Fluorine, Carbon-Oxygen, and Sulphur.
10. The spintronic device according to Claim 1
wherein said semiconductor comprises Silicon.
11. The spintronic device according to Claim 1
wherein said semiconductor comprises a semiconductor
selected from the group comprising Group IV semiconductors,
Group III-V semiconductors, and Group II-VI semiconductors.
12. The spintronic device according to Claim 1
wherein said at least one superlattice comprises a pair of
superlattices; and further comprising:
a substrate carrying said pair of superlattices
in spaced apart relation to define a source and a drain;
a channel between said source and drain; and
a gate adjacent said channel so that said
spintronic device defines a spintronic field effect
transistor.
13. The spintronic device according to Claim 1
wherein said at least one superlattice comprises a pair of
superlattices; and further comprising:
a substrate carrying said pair of superlattices
in spaced apart relation; and
a spacer between said pair of superlattices so
that said spintronic device defines a spintronic valve.
14. The spintronic device according to Claim 1
wherein said at least one superlattice exhibits a Curie
temperature of at least as high as room temperature.
17

15. A spintronic device comprising:
a plurality of stacked base semiconductor
monolayers defining a base semiconductor portion having a
crystal lattice;
at least one non-semiconductor monolayer
constrained within the crystal lattice;
a spintronic dopant constrained within the
crystal lattice of the base semiconductor portion by said
at least one non-semiconductor monolayer; and
an electrical contact coupled to said base
semiconductor portion.
16. The spintronic device according to Claim 15
wherein said spintronic dopant comprises at least one
spintronic dopant monolayer adjacent said at least one non-
semiconductor monolayer.
17. The spintronic device according to Claim 15
wherein said spintronic dopant comprises at least one of a
transition metal and a rare earth.
18. The spintronic device according to Claim 15
wherein said non-semiconductor comprises at least one of
Oxygen, Nitrogen, Fluorine, Carbon-Oxygen, and Sulphur.
19. The spintronic device according to Claim 15
wherein said semiconductor comprises a semiconductor
selected from the group comprising Group IV semiconductors,
Group III-V semiconductors, and Group II-VI semiconductors.
20. The spintronic device according to Claim 15
further comprising a substrate carrying said base
semiconductor portion.
21. The spintronic device according to Claim 15
wherein said base semiconductor portion exhibits a Curie
temperature of at least as high as room temperature.
18

22. A method for making a spintronic device
comprising:
forming at least one superlattice; and
forming at least one electrical contact coupled
to the at least one superlattice;
the at least one superlattice comprising a
plurality of groups of layers with each group of layers
comprising
a plurality of stacked base semiconductor
monolayers defining a base semiconductor portion
having a crystal lattice,
at least one non-semiconductor monolayer
constrained within the crystal lattice of adjacent
base semiconductor portions, and
a spintronic dopant constrained within the
crystal lattice of the base semiconductor portion by
the at least one non-semiconductor monolayer.
23. The method according to Claim 22 wherein the
spintronic dopant comprises at least one spintronic dopant
monolayer adjacent the at least one non-semiconductor
monolayer.
24. The method according to Claim 22 wherein the
spintronic dopant comprises a transition metal.
25. The method according to Claim 22 wherein the
spintronic dopant comprises Manganese.
26. The method according to Claim 22 wherein the
at least one transition metal comprises at least one of
Manganese, Iron, and Chromium.
27. The method according to Claim 22 wherein the
spintronic dopant comprises a rare earth.
28. The method according to Claim 22 wherein the
rare earth comprises a rare earth lanthanide.
19

29. The method according to Claim 22 wherein the
non-semiconductor comprises Oxygen.
30. The method according to Claim 22 wherein the
non-semiconductor comprises at least one of Oxygen,
Nitrogen, Fluorine, Carbon-Oxygen, and Sulphur.
31. The method according to Claim 22 wherein the
semiconductor comprises Silicon.
32. The method according to Claim 22 wherein the
semiconductor comprises a semiconductor selected from the
group comprising Group IV semiconductors, Group III-V
semiconductors, and Group II-VI semiconductors.
33. The method according to Claim 22 wherein
forming the at least one superlattice comprises forming a
pair of superlattices; and further comprising:
providing a substrate carrying the pair of
superlattices in spaced apart relation to define a source
and a drain;
forming a channel between the source and drain;
and
forming a gate adjacent the channel so that the
spintronic device defines a spintronic field effect
transistor.
34. The method according to Claim 22 wherein
forming the at least one superlattice comprises forming a
pair of superlattices; and further comprising:
providing a substrate carrying the pair of
superlattices in spaced apart relation; and
forming a spacer between the pair of
superlattices so that the spintronic device defines a
spintronic valve.

35. The method according to Claim 22 wherein the
at least one superlattice exhibits a Curie temperature of
at least as high as room temperature.
36. A method for making spintronic device
comprising:
forming a plurality of stacked base semiconductor
monolayers defining a base semiconductor portion having a
crystal lattice;
forming at least one non-semiconductor monolayer
constrained within the crystal lattice;
providing a spintronic dopant constrained within
the crystal lattice of the base semiconductor portion by
the at least one non-semiconductor monolayer; and
forming an electrical contact coupled to the base
semiconductor portion.
37. The method according to Claim 36 wherein the
spintronic dopant comprises at least one spintronic dopant
monolayer adjacent the at least one non-semiconductor
monolayer.
38. The method according to Claim 36 wherein the
spintronic dopant comprises at least one of a transition
metal and a rare earth.
39. The method according to Claim 36 wherein the
non-semiconductor comprises at least one of Oxygen,
Nitrogen, Fluorine, Carbon-Oxygen, and Sulphur.
40. The method according to Claim 36 wherein the
semiconductor comprises a semiconductor selected from the
group comprising Group IV semiconductors, Group III-V
semiconductors, and Group II-VI semiconductors.
41. The method according to Claim 36 further
comprising providing a substrate carrying the base
semiconductor portion.
21

42. The method according to Claim 36 wherein the
base semiconductor portion exhibits a Curie temperature of
at least as high as room temperature.
22

Description

Note : Les descriptions sont présentées dans la langue officielle dans laquelle elles ont été soumises.


CA 02646325 2008-09-17
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SPINTRONIC DEVICES WITH CONSTRAINED
SPINTRONIC DOPANT AND ASSOCIATED METHODS
Field of the Invention
[0001] The present invention relates to the field of
electronics, and, more particularly, to the field of spin-
based electronics and associated methods.
Background of the Invention
[0002] Spin-based electronics or spintronics exploit
both the charge of electrons as well as the spin of the
electrons to permit new devices with enhanced functions,
higher speeds, and/or reduced.power consumption, for
example. An exemplary spintronic device is the spin valve
as illustrated in the FIGS. 1A and 1B. The spin valve 11
provides a low resistance when the spins are aligned (FIG.
1A), and provides a high resistance with the spins not
aligned (FIG. 1B). The spin valve 11 may be used as a
nonvolatile memory element, for example. Other exemplary
spintronic devices including the spin-FET 12 schematically
illustrated in FIG. 2, and the quantum bit device 13
illustrated in FIG. 3.
[0003] Published U.S. Patent Application No.
2006/0018816, for example, discloses a Diluted Magnetic
Semiconductor (DMS) comprising zinc oxide which includes a
transition element or a rare earth lanthanide, or both, in
an amount sufficient to change the material from non-
magnetic state to a room temperature ferromagnetic state.
The material may be in a bulk form or a thin film form. A
DMS material is a semiconductor in which transition metal
1

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ions or rare earth lanthanides substitute cations of host
semiconductor materials. More particularly, a DMS material
15 is schematically illustrated in FIG. 4B, while to the
left in FIG. 4A is a magnetic material 14, and to the right
in FIG. 4C is a non-magnetic material 16.
[0004] Published U.S. Patent Application No.
2005/0258416 discloses a spintronic switching device
comprising a half-metal region between first and second
conductive regions. The half-metal region comprises a
material that, at the intrinsic Fermi level, has
substantially zero available electronic states in a
minority spin channel. Changing the voltage of the half-
metal region with respect to the first conducting region
moves its Fermi level with respect to the electron energy
bands of the first conducting region, which changes the
number of available electronic states in the majority spin
channel. In doing so, this changes the majority spin
polarized current passing through the switching device.
The half-metal region may comprise CrAs and the conducting
regions may comprise a p-doped or n-doped semiconductor.
For example, the p-doped semiconductor may comprise Mn
doped GaAs.
[0005] Published U.S. Patent Application No.
2004/0178460 discloses a spintronic device application as a
memory and a logic device using a spin valve effect
obtained by injecting a carrier spin-polarized from a
ferromagnetic into a semiconductor at room temperature, and
a spin-polarized field effect transistor. The ferromagnet
is disclosed as one of a Fe, Co, Ni, FeCo, NiFe, GaMnAs,
InMnAs, GeMn, and GaMnN, and can be a half metal having a
spin polarization of 100% such as Cr02. The semiconductor
may be one selected from Si, GaAs, InAs, and Ge. Also, the
2

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spin channel region is disclosed as Si on insulator (SOI)
or a two-dimensional electron gas of a compound
semiconductor.
[0006] An article to Jonker et al. "Electrical Spin
Injection and Transport in Semiconductor Spintronic
Devices", MRS Bulletin/Oct. 2003, pp. 740-748, discloses
semiconductor heterostructures that use carrier spin as a
new degree of freedom. The article discloses four
essential requirements for implementing a semiconductor
spintronics technology in devices, and provides that the
efficient electrical injection of spin-polarized carriers
into the semiconductor has been a critical issue severely
hampering progress in this field. The article further
discloses that advances in materials quality have increased
the Curie temperature of Gal_xMn,As to -150 K with the
potential of exceeding room temperature. Spin-dependent
resonant tunneling is identified as able to increase the
spin selectivity of tunneling contacts in a very efficient
way. A double-barrier heterojunction (DBH) comprising a
nonmagnetic semiconductor quantum well between two
insulating barriers and two ferromagnetic semiconductive
electrodes may behave as half-metallic junctions if the
parameters of the quantum well and barrier are properly
tuned.
[0007] Current spintronics technology is limited by the
currently used materials. For example, it is important, as
noted by Jonker et al., to have efficient spin carrier
injection. It is also desirable to have manufacturing and
operational compatibility with existing semiconductor
processing technology. It is also desirable that the
magnetic ordering or Curie temperature by at or near room
temperature, instead of the more typical 100-200 K. One
3

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potential approach is the DMS materials as disclosed in the
above noted U.S. Patent Application No. 2004/0178460.
[0008] Another spintronic device structure is the
Digital Ferromagnetic Heterostructure (DFH) as disclosed,
for example, by Sanvito et al. in an article "Ab Initio
Transport Theory for Digital Ferromagnetic
Heterostructures" in Physical Review Letters, Vol. 87, No.
26, December 24, 2001, pp. 1-4. The article notes that the
solubility limit of Mn in GaAs is rather small; however, a
large MN concentration can be obtained in a zinc blende
MnAs submonolayers into GaAs to form a MnAs/GaAs
superlattice. A schematic diagram of a prior art DFH
structure 18 is shown in FIG. 5 with a transition metal
(Tm) in the form of Mn within a Silicon superlattice.
Although this may have a large spin polarization at the
Fermi level and a large magnetoresistance effect and Curie
temperature higher than in the bulk, it may suffer from a
low thermal stability.
[0009] Unfortunately, many of the materials and
structures for spintronic devices have relatively low
concentrations of the spintronic dopant, such as Mn. The
spintronic dopant tends to precipitate out of the.crystal
lattice, especially as the concentration is increased,
and/or the device is subjected to thermal processing steps.
Summary of the Invention
[0010] In view of the foregoing background, it is
therefore an object of the present invention to provide a
spintronic device that is readily manufactured and which
exhibits good spintronic characteristics, such as at room
temperature or higher, for example.
4

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[0011] This and other objects, features and advantages
in accordance with the present invention are provided by a
spintronic device comprising at least one superlattice and
at least one electrical contact coupled thereto, with the
at least one superlattice comprising a plurality of groups
of layers. Each group of layers may comprise a plurality
of stacked base semiconductor monolayers defining a base
semiconductor portion having a crystal lattice, at least
one non-semiconductor monolayer constrained within the
crystal lattice of adjacent base semiconductor portions,
and a spintronic dopant. Moreover, the spintronic dopant
may be constrained within the crystal lattice of the base
semiconductor portion by the at least one non-semiconductor
monolayer. Accordingly, a fairly high spintronic dopant
concentration may be achieved and maintained while reducing
a likelihood of precipitation of the spintronic dopant.
[0012] The spintronic dopant may comprise at least one
spintronic dopant monolayer=adjacent the at least one non-
semiconductor monolayer. This may be so, for example,
where the energy levels favor attraction and retention of
the spintronic dopant to the non-semiconductor. The
spintronic dopant may comprises a transition metal, such as
at least one of Manganese, Iron, and Chromium.
Alternatively or additionally the spintronic dopant may
comprise a rare earth, such as a rare earth lanthanide, for
example.
[0013] The non-semiconductor may comprise at least one
of Oxygen, Nitrogen, Fluorine, Carbon-Oxygen, and Sulphur,
for example. The semiconductor may comprise Silicon, or
more generally, may comprise a semiconductor selected from
the group comprising Group IV semiconductors, Group III-V
semiconductors, and Group II-VI semiconductors. The

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specific materials and structural configurations may be
preferably selected so that the superlattice exhibits a
Curie temperature of at least as high as room temperature.
[0014] An embodiment of the spintronic device may be a
spintronic field effect transistor. Accordingly, the
spintronic FET may include a substrate carrying a pair of
superlattices in spaced apart relation to define a source
and a drain, with a channel between the source and drain,
and a gate adjacent the channel. Another embodiment of the
spintronic device is a spin valve. The spin valve may also
include a substrate carrying a pair of superlattices in
spaced apart relation with a spacer between the pair of
superlattices.
[0015] In some embodiments the repeating structure of a
superlattice may not be needed. In other words, the
spintronic device may comprise a plurality of stacked base
semiconductor monolayers defining a base semiconductor
portion having a crystal lattice, at least one non-
semiconductor monolayer constrained within the crystal
lattice, and a spintronic dopant constrained within the
crystal lattice of the base semiconductor portion by the at
least one non-semiconductor monolayer. In addition, the
device may also include an electrical contact coupled to
the base semiconductor portion.
[0016] A method aspect is for making a spintronic device
comprising forming at least one superlattice and forming at
least one electrical contact coupled thereto, with the at
least one superlattice comprising a plurality of groups of
layers. Each group of layers may comprise a plurality of
stacked base-semiconductor monolayers defining a base
semiconductor portion having a crystal lattice, at least
one non-semiconductor monolayer constrained within the
6

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crystal lattice of adjacent base semiconductor portions,
and a spintronic dopant. Moreover, the spintronic dopant
may be constrained within the crystal lattice of the base
semiconductor portion by the at least one non-semiconductor
monolayer. Other method aspects will also be understood by
those skilled in the art based on the teachings herein.
Brief Description of the Drawings
[0017] FIG. lA is a schematic diagram of a spin valve as
is in the prior art illustrated in a low resistance state.
[0018] FIG. 1B is a schematic diagram of the prior art
spin valve as shown in FIG. 1A illustrated in a high
resistance state.
[0019] FIG. 2 is a schematic perspective view of a spin
FET as in the prior art.
[0020] FIG. 3 is a schematic diagram of a quantum bit
device as in the prior art.
[0021] FIG. 4A is a schematic diagram of a magnetic
material as in the prior art.
[0022] FIG. 4B is a schematic diagram of a dilute
magnetic material as in the prior art.
[0023] FIG. 4C is a schematic diagram of a non-magnetic
material as in the prior art.
[0024] FIG. 5 is a schematic atomic diagram for a
Digital Ferromagnetic Heterostructure (DFH) as in the prior
art.
[0025] FIGS. 6A and 6B are, respectively, a schematic
diagram and energy level diagram for a DFH in accordance
with the invention.
[0026] FIG. 7 is a schematic atomic diagram for a DFH
structure in accordance with the invention.
7

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[0027] FIG. 8 is a schematic atomic model of a portion
of a superlattice for a spintronic device in accordance
with the present invention.
[0028] FIG. 9 is a combined energy diagram for the
superlattice as shown in FIG. 8.
[0029] FIGS. 10A-10C are schematic atomic diagrams of
various relative atomic positions of Si, 0, and Mn in a
spintronic device in accordance with the invention.
[0030] FIG. 11 is a schematic cross-sectional diagram of
a spintronic FET in accordance with the invention.
[0031] FIG. 12 is a schematic cross-sectional diagram of
a spin valve in accordance with the invention.
Detailed Description of the Preferred Embodiments
[0032] The present invention will now be described more
fully hereinafter with reference to the accompanying
drawings, in which preferred embodiments of the invention
are shown. This invention may, however, be embodied in many
different forms and should not be construed as limited to
the embodiments set forth herein. Rather, these embodiments
are provided so that this disclosure will be thorough and
complete, and will fully convey the scope of the invention
to those skilled in the art. Like numbers refer, to like
elements throughout.
[0033] Referring now to FIGS. 6A and 6B, a first example
of the present invention is now described. In the
schematically illustrated DFH structure 20 of FIG. 6A,
Oxygen is included in the Si superlattice also including a
transition metal, such as Mn. As can be seen in the energy
level diagram 21 of FIG. 6B, the Mn will have lower energy
as it approaches the Oxygen layer. In other words, when
the Mn atoms stick to the Silicon atoms, the structure is
most energetically favorable, and the Mn atoms can be well
8

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positioned and confined in the Silicon. As will be
appreciated by those skilled in the art, the relative
positioning of the Mn atoms with respect to the Oxygen
atoms may be used to tune the Curie temperature (Tc), for
example. The Tc may be much higher than room temperature
for a 2D confined system, for example. The DFH structure
20 with Oxygen i.s advantageously more thermally stable than
prior art structures.
[0034] Mn, for example, substitutionally introduces only
a small stress into the Silicon monocrystalline structure.
Mn is an example of a transition metal suitable for
spintronic devices. Those of skill in the art will
appreciate that other materials may be used as well, such
as, for example, Fe, Cr, etc. Rare earth elements may also
be used, such as rare earth lanthanides.
[0035] Other materials may also be used in place of or
in combination with Oxygen. For example, Nitrogen,
Fluorine, Carbon-Oxygen, and Sulphur are suitable
materials. In addition, the base semiconductor
illustratively in the form of Si, may be a'semiconductor
selected from the group comprising Group IV semiconductors,
Group III-V semiconductors, and Group II-VI semiconductors.
Of course, and the term Group IV semiconductors also
includes Group IV-IV semiconductors.
[0036] The charge and spin densities of various layers
of a DFH structure 22 and incorporating Oxygen along with
Mn in an Si monocrystalline superlattice is schematically
illustrated in FIG. 7. Layer 1 is shown to be in a
conductive state, in contrast to the other layers, Layers 6
and 16.
[0037] A schematic atomic model 25 is shown in FIG. 8,
with the transition metal (e.g. Mn) incorporated in the
9

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Silicon lattice along with Oxygen. With reference to FIG.
9, the spin-up energy states 27 (top) and the spin-down
energy states 28 (bottom) are shown. The spin-up energy
diagram 27 indicates that current will flow because of the
low energy states at the Fermi level as will be appreciated
by those skilled in the art, and in contrast to the high
energy states at the Fermi level for the spin-down diagram
28.
[0038] Referring now additionally to FIGS. 10A-10C the
relative energetics of various Si-Mn-O structures are
schematically illustrated. More particularly, the
structure 31 shown in FIG. 10A with an Oxygen atom between
adjacent Mn atoms offers the lowest stability, the
structure 32 shown in FIG. lOB with an Oxygen atom remote
from a pair of Mn atoms offers an intermediate stability,
and the structure 33 shown in FIG. lOC with an Oxygen atom
tied to one of a pair of Mn atoms offers the highest
relative stability.
[0039] In some embodiments, the spintronic device may
comprise at least one superlattice and at least one
electrical contact coupled thereto, with the at least one
superlattice comprising a plurality of groups of layers.
Each group of layers may comprise a plurality of stacked
base semiconductor monolayers defining a base semiconductor
portion having a crystal lattice, at least one non-
semiconductor monolayer constrained within the crystal
lattice of adjacent base semiconductor portions, and a
spintronic dopant. The base semiconductor portion may
comprise 5 o 30 monolayers, for example. The spintronic
dopant may be constrained within the crystal lattice of the
base semiconductor portion by the at least one non-
semiconductor monolayer as described above. Accordingly, a

CA 02646325 2008-09-17
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relatively high spintronic dopant concentration may be
achieved and maintained while reducing a likelihood of
precipitation of the spintronic dopant. For example, the
concentration of the spintronic dopant may be in the range
of from about 0.1 to 10 percent.
[0040] The spintronic dopant may comprise at least one
spintronic dopant monolayer adjacent the at least one non-
semiconductor nionolayer. This may be so, for example,
where the energy levels favor attraction and retention of
the spintronic dopant to the non-semiconductor.
[0041] Further details regarding superlattice structures
including Silicon and Oxygen to achieve energy band
modifications, such as to increase charge carrier mobility,
are described in commonly assigned U.S. Patent Nos.
6,891,188 and 7,153,763, for example, the entire contents
of which are incorporated herein by reference. In
accordance with the spintronic devices described herein,
Applicants theorize without wishing to be bound thereto
that the non-semiconductor monolayer(s) may serve to
collect or at least contain the spintronic dopant to keep
the dopant from precipitating out, especially during any
subsequent thermal processing steps as will be appreciated
by those skilled in the art. In some embodiments, the
spintronic dopant may be added by atomic layer deposition.
In other embodiments, the spintronic dopant may be added by
implantation and optionally followed by an anneal, for
example, while the non-semiconductor monolayer(s) serves to
at least contain the dopant.
[0042] The non-semiconductor monolayer may be initially
formed in a non-continuous fashion, that is, without all
available positions for Oxygen being filled in the Silicon
lattice, for example. Moreover, Applicants also theorize
11

CA 02646325 2008-09-17
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without wishing to be bound thereto that Atomic Layer
Deposition (ALD) of the monolayers may tend to form
clusters on an atomic level rather than clearly or
precisely defined moriolayers, especially when subjected to
subsequent thermal processes. For example, the
superlattices in some cases may be formed before shallow
trench isolation (STI) formation, and are thus subjected to
thermal processing during STI formation.
[0043] Accordingly, the term monolayer is intended to
cover this theorized clustering phenomenon, and is not
limited to a precise mathematical or atomic stick model
layer as will be appreciated by those skilled in the art.
It is also theorized by Applicants without their wishing to
be bound thereto, that a clustering phenomenon may be
considered to occur with the spintronic dopant, especially
for the those combinations of materials, such as Si-O-Mn,
where the Mn will be attracted to the 0.
[0044] Extending the principles described herein
further, in some embodiments the repeating structure of a
superlattice may not be needed. In other words, the
spintronic device may comprise a plurality of stacked base
semiconductor monolayers defining a base semiconductor
portion having a crystal lattice, at least one non-
semiconductor monolayer constrained within the crystal
lattice, and a spintronic dopant constrained within the
crystal lattice of the base semiconductor portion by the at
least one non-semiconductor monolayer. The device may also
include an electrical contact coupled to the base
semiconductor portion.
[0045] Referring now additionally to FIG. 11, an example
of a spintronic device in the form of a spintronic field
effect transistor (FET) 40 is now described. The
12

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spintronic FET 40 illustratively includes a semiconductor
substrate 41 carrying a pair of superlattices in spaced
apart relation to define a source*43 and a drain 44, with a
channel 45 between the source and drain, and a gate 50
adjacent the channel. The gate 50 includes a dielectric
layer 52 and a gate electrode or contact 51 thereon.
[0046] For clarity of explanation the source 43 and
drain 44 are illustrated with a plurality of horizontally
extending lines schematically indicating the repeating
groups of the superlattice and with dots indicative of the
spintronic dopant. A source contact 46 and a drain contact
47 are illustratively coupled to the source 43 and drain 44
respectively. The channel 45 is illustratively in the form
of a superlattice as well, but without the spintronic
dopant. In other embodiments, the channel need not be a
superlattice as will be appreciated by those skilled in the
art. In yet other embodiments, only one of the source or
drain may be a superlattice.
[0047] Another embodiment of a spintronic device is the
spin valve 60 explained with additional reference to FIG.
12. The spin valve 60 also includes a semiconductor
substrate 61 that carries on its upper surface a pair of
superlatices 62, 63 in spaced apart relation with a spacer
66 between the pair of superlattices. Respective
electrical contacts 64, 65 are coupled to the superlattices
64, 65. As will be appreciated by those skilled in the
art, one of the superlattices 64, 65 may be constructed to
be pinned or be a hard ferromagnetic region, while the
other is a soft ferromagnetic region.
[0048] A method aspect is for making a spintronic device
comprising forming at least one superlattice and forming at
least one electrical contact coupled thereto, with the at
13

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WO 2007/109231 PCT/US2007/006814
least one superlattice comprising a plurality of groups of
layers. Each group of layers may comprise a plurality of
stacked base semiconductor monolayers defining a base
semiconductor portion having a crystal lattice, at least
one non-semiconductor monolayer constrained within the
crystal lattice of adjacent base semiconductor portions,
and a spintronic dopant. Moreover, the spintronic dopant
may be constrained within the crystal lattice of the base
semiconductor portion by the at least one non-semiconductor
monolayer. Other method aspects will also be understood by
those skilled in the art based on the teachings herein.
[0049] The spintronic devices described herein,
including the spintronic FET and spin valve, may also be
configured without the repeating structure of the
superlattice as will be appreciated by those of skill in
the art. The materials described herein may be used in
many spintronic devices, particularly for increasing the
injection efficiency of =spin carriers believed due to the
material compatibility at the interface. The thermal
stability of the devices may also be greatly enhanced
believed due to the Oxygen being held in the crystal
lattice, and the Mn being thermally stable adjacent the
Oxygen atoms. Other general references in the field of
spintronics include an article by Park et al. appearing in
Science 295, 651 (2002); an article to Qian et al. in Phys.
Rev. Lett. 96, 027211 (2006); and an article to Ohno et al.
appearing in Nature 402, 790 (1999).
[0050] In addition, many modifications and other
embodiments of the invention will come to the mind of one
skilled in the art having the benefit of the teachings
presented in the foregoing descriptions and the associated
drawings. Therefore, it is understood that the invention is
14

CA 02646325 2008-09-17
WO 2007/109231 PCT/US2007/006814
not to be limited to the specific embodiments disclosed,
and that modifications and embodiments are intended to be
included within the scope of the invention.

Dessin représentatif
Une figure unique qui représente un dessin illustrant l'invention.
États administratifs

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Historique d'événement

Description Date
Exigences relatives à la révocation de la nomination d'un agent - jugée conforme 2020-09-01
Demande non rétablie avant l'échéance 2013-10-15
Inactive : Morte - Aucune rép. dem. par.30(2) Règles 2013-10-15
Réputée abandonnée - omission de répondre à un avis sur les taxes pour le maintien en état 2013-03-19
Inactive : Abandon. - Aucune rép dem par.30(2) Règles 2012-10-12
Inactive : Dem. de l'examinateur par.30(2) Règles 2012-04-12
Modification reçue - modification volontaire 2011-01-21
Inactive : Dem. de l'examinateur par.30(2) Règles 2010-07-21
Inactive : Page couverture publiée 2009-01-22
Lettre envoyée 2009-01-19
Inactive : Acc. récept. de l'entrée phase nat. - RE 2009-01-19
Inactive : CIB en 1re position 2009-01-14
Demande reçue - PCT 2009-01-13
Exigences pour l'entrée dans la phase nationale - jugée conforme 2008-09-17
Exigences pour une requête d'examen - jugée conforme 2008-09-17
Toutes les exigences pour l'examen - jugée conforme 2008-09-17
Demande publiée (accessible au public) 2007-09-27

Historique d'abandonnement

Date d'abandonnement Raison Date de rétablissement
2013-03-19

Taxes périodiques

Le dernier paiement a été reçu le 2012-03-08

Avis : Si le paiement en totalité n'a pas été reçu au plus tard à la date indiquée, une taxe supplémentaire peut être imposée, soit une des taxes suivantes :

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Historique des taxes

Type de taxes Anniversaire Échéance Date payée
Taxe nationale de base - générale 2008-09-17
Requête d'examen - générale 2008-09-17
TM (demande, 2e anniv.) - générale 02 2009-03-19 2009-02-04
TM (demande, 3e anniv.) - générale 03 2010-03-19 2010-03-16
TM (demande, 4e anniv.) - générale 04 2011-03-21 2011-03-14
TM (demande, 5e anniv.) - générale 05 2012-03-19 2012-03-08
Titulaires au dossier

Les titulaires actuels et antérieures au dossier sont affichés en ordre alphabétique.

Titulaires actuels au dossier
MEARS TECHNOLOGIES, INC.
Titulaires antérieures au dossier
ILIJA DUKOVSKI
JEAN AUGUSTIN CHAN SOW FOOK YIPTONG
MAREK HYTHA
ROBERT J. MEARS
SAMED HALILOV
XIANGYANG HUANG
Les propriétaires antérieurs qui ne figurent pas dans la liste des « Propriétaires au dossier » apparaîtront dans d'autres documents au dossier.
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Description du
Document 
Date
(aaaa-mm-jj) 
Nombre de pages   Taille de l'image (Ko) 
Description 2008-09-16 15 675
Dessins 2008-09-16 7 181
Revendications 2008-09-16 7 250
Abrégé 2008-09-16 2 78
Dessin représentatif 2009-01-19 1 9
Description 2011-01-20 15 666
Revendications 2011-01-20 7 225
Accusé de réception de la requête d'examen 2009-01-18 1 177
Rappel de taxe de maintien due 2009-01-18 1 113
Avis d'entree dans la phase nationale 2009-01-18 1 204
Courtoisie - Lettre d'abandon (R30(2)) 2013-01-06 1 165
Courtoisie - Lettre d'abandon (taxe de maintien en état) 2013-05-13 1 175
PCT 2008-09-16 5 175
Taxes 2009-02-03 1 30
Taxes 2010-03-15 1 200
Taxes 2011-03-13 1 202